Peter Kuschnerus

488 total citations
16 papers, 374 citations indexed

About

Peter Kuschnerus is a scholar working on Electrical and Electronic Engineering, Aerospace Engineering and Surfaces, Coatings and Films. According to data from OpenAlex, Peter Kuschnerus has authored 16 papers receiving a total of 374 indexed citations (citations by other indexed papers that have themselves been cited), including 10 papers in Electrical and Electronic Engineering, 6 papers in Aerospace Engineering and 4 papers in Surfaces, Coatings and Films. Recurrent topics in Peter Kuschnerus's work include Advancements in Photolithography Techniques (7 papers), Calibration and Measurement Techniques (5 papers) and Electron and X-Ray Spectroscopy Techniques (4 papers). Peter Kuschnerus is often cited by papers focused on Advancements in Photolithography Techniques (7 papers), Calibration and Measurement Techniques (5 papers) and Electron and X-Ray Spectroscopy Techniques (4 papers). Peter Kuschnerus collaborates with scholars based in Germany, Switzerland and France. Peter Kuschnerus's co-authors include Hans Rabus, M. Richter, G. Ulm, Frank Scholze, K. Goetz, J. Furthmüller, P. Käckell, Johannes Wolf, J. Kräußlich and F. Bechstedt and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Alloys and Compounds.

In The Last Decade

Peter Kuschnerus

15 papers receiving 342 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Peter Kuschnerus Germany	7	198	109	80	73	68	16	374
G. E. Crook United States	11	271 1.4×	107 1.0×	108 1.4×	68 0.9×	52 0.8×	28	441
В. И. Лучин Russia	8	136 0.7×	76 0.7×	21 0.3×	81 1.1×	71 1.0×	35	352
H. Koike Japan	9	250 1.3×	64 0.6×	117 1.5×	53 0.7×	39 0.6×	30	353
A. Ya. Lopatin Russia	11	188 0.9×	37 0.3×	28 0.3×	105 1.4×	73 1.1×	42	368
F. Le Pimpec Switzerland	13	370 1.9×	131 1.2×	157 2.0×	131 1.8×	118 1.7×	39	553
Sergiy Yulin Germany	12	178 0.9×	75 0.7×	20 0.3×	111 1.5×	95 1.4×	42	386
E. B. Kluenkov Russia	11	136 0.7×	71 0.7×	16 0.2×	78 1.1×	105 1.5×	33	374
Runze Qi China	12	111 0.6×	118 1.1×	28 0.3×	55 0.8×	63 0.9×	65	394
C. Hernandez-Garcia United States	10	212 1.1×	41 0.4×	72 0.9×	67 0.9×	219 3.2×	26	391
Peter Gawlitza Germany	10	107 0.5×	71 0.7×	19 0.2×	65 0.9×	63 0.9×	42	320

Countries citing papers authored by Peter Kuschnerus

Since Specialization

Citations

This map shows the geographic impact of Peter Kuschnerus's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Peter Kuschnerus with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Peter Kuschnerus more than expected).

Fields of papers citing papers by Peter Kuschnerus

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Peter Kuschnerus. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Peter Kuschnerus. The network helps show where Peter Kuschnerus may publish in the future.

Co-authorship network of co-authors of Peter Kuschnerus

This figure shows the co-authorship network connecting the top 25 collaborators of Peter Kuschnerus. A scholar is included among the top collaborators of Peter Kuschnerus based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Peter Kuschnerus. Peter Kuschnerus is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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16 of 16 papers shown

Edinger, Klaus, et al.. (2005). Application data of the electron beam based photomask repair tool MeRiT MG. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5835. 145–145. 6 indexed citations

Yasui, Takashi, et al.. (2004). Actinic aerial image measurement for qualification of defect on 157-nm photomask. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5446. 743–743. 1 indexed citations

Edinger, Klaus, et al.. (2004). Electron-beam-based photomask repair. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 22(6). 2902–2906. 73 indexed citations

Erdmann, Lars, et al.. (2003). Microscope illumination systems for 157 nm. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5038. 719–719. 2 indexed citations

Kuschnerus, Peter, et al.. (2003). Actinic aerial image measurement tool for 157-nm lithography. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5130. 400–400. 2 indexed citations

Kuschnerus, Peter, et al.. (2003). Aerial image measurement system for 157nm lithography masks. 2 indexed citations

Yasui, Takashi, et al.. (2003). Actinic aerial image measurement tool for 157-nm mask qualification. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5130. 533–533. 1 indexed citations

Kuschnerus, Peter, et al.. (2002). Aerial Image Measurement System for 157 nm Lithography. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4889. 469–469. 1 indexed citations

Scholze, Frank, et al.. (2000). Determination of the electron–hole pair creation energy for semiconductors from the spectral responsivity of photodiodes. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 439(2-3). 208–215. 57 indexed citations

10.

Richter, M., Peter Kuschnerus, U. Kroth, et al.. (2000). The PTB high-accuracy spectral responsivity scale in the ultraviolet. Metrologia. 37(5). 515–518. 15 indexed citations

11.

Bauer, Andreas, J. Kräußlich, Peter Kuschnerus, et al.. (1999). High-precision determination of atomic positions in 4H– and 6H–SiC crystals. Materials Science and Engineering B. 61-62. 217–220. 4 indexed citations

12.

Scholze, Frank, et al.. (1998). High-accuracy detector calibration in the 3–1500 eV spectral range at the PTB radiometry laboratory. Journal of Synchrotron Radiation. 5(3). 866–868. 6 indexed citations

13.

Kuschnerus, Peter, Hans Rabus, M. Richter, et al.. (1998). Characterization of photodiodes as transfer detector standards in the 120 nm to 600 nm spectral range. Metrologia. 35(4). 355–362. 36 indexed citations

14.

Bauer, Andreas, J. Kräußlich, Peter Kuschnerus, et al.. (1998). High-precision determination of atomic positions in crystals: The case of6H- and4H-SiC. Physical review. B, Condensed matter. 57(5). 2647–2650. 96 indexed citations

15.

Melchior, H., U. Kroth, Peter Kuschnerus, et al.. (1996). PtSi–n–Si Schottky-barrier photodetectors with stable spectral responsivity in the 120–250 nm spectral range. Applied Physics Letters. 69(24). 3662–3664. 57 indexed citations

16.

Nagengast, D., et al.. (1995). Hydrogen-charging of Nb/Fe multilayers. Journal of Alloys and Compounds. 231(1-2). 307–309. 15 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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