Peter Kuschnerus
- Structural Biology top 5%
- Surfaces, Coatings and Films top 10%
- Electron and X-Ray Spectroscopy Techniques 4
- Radiation top 10%
- X-ray Spectroscopy and Fluorescence Analysis 2
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- Advancements in Photolithography Techniques 7
- Integrated Circuits and Semiconductor Failure Analysis 2
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- Advanced ceramic materials synthesis 2
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- Calibration and Measurement Techniques 5
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- Industrial Vision Systems and Defect Detection 4
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- Advanced Measurement and Metrology Techniques 2
Peter Kuschnerus
15 papers receiving 342 citations
Peers
Comparison fields: 5 of 43
- Structural Biology 49
- Surfaces, Coatings and Films 73
- Radiation 48
- Electrical and Electronic Engineering 198
- Ceramics and Composites 19
Countries citing papers authored by Peter Kuschnerus
This map shows the geographic impact of Peter Kuschnerus's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Peter Kuschnerus with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Peter Kuschnerus more than expected).
Fields of papers citing papers by Peter Kuschnerus
This network shows the impact of papers produced by Peter Kuschnerus. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Peter Kuschnerus. The network helps show where Peter Kuschnerus may publish in the future.
Co-authorship network
The 23 scholars most cited alongside Peter Kuschnerus, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2005 | 6 | |
| 2 | 2004 | 1 | |
| 3 | 2004 | 73 | |
| 4 | 2003 | 2 | |
| 5 | 2003 | 2 | |
| 6 | Aerial image measurement system for 157nm lithography masks | 2003 | 2 |
| 7 | 2003 | 1 | |
| 8 | 2002 | 1 | |
| 9 | 2000 | 57 | |
| 10 | 2000 | 15 | |
| 11 | 1999 | 4 | |
| 12 | 1998 | 6 | |
| 13 | 1998 | 36 | |
| 14 | 1998 | 96 | |
| 15 | 1996 | 57 | |
| 16 | 1995 | 15 |
About Peter Kuschnerus
Peter Kuschnerus is a scholar working on Surfaces, Coatings and Films, Industrial and Manufacturing Engineering, Ceramics and Composites, Statistics, Probability and Uncertainty and Aerospace Engineering, having authored 16 papers that have together received 374 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (7 papers), Calibration and Measurement Techniques (5 papers), Electron and X-Ray Spectroscopy Techniques (4 papers), Industrial Vision Systems and Defect Detection (4 papers), Advanced ceramic materials synthesis (2 papers), Advanced Measurement and Metrology Techniques (2 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers) and X-ray Spectroscopy and Fluorescence Analysis (2 papers). The work is most often cited by research in Structural Biology (49 citations), Surfaces, Coatings and Films (73 citations), Radiation (48 citations), Electrical and Electronic Engineering (198 citations) and Ceramics and Composites (19 citations). Peter Kuschnerus has collaborated with scholars based in Germany, Switzerland and France. Frequent co-authors include Hans Rabus, M. Richter, G. Ulm, Frank Scholze, K. Goetz, J. Furthmüller, P. Käckell, Johannes Wolf, J. Kräußlich and F. Bechstedt. Their work appears in journals such as Metrologia, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment, Journal of Synchrotron Radiation, Journal of Alloys and Compounds and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.