Eric Louis

900 total citations
45 papers, 601 citations indexed

About

Eric Louis is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Radiation. According to data from OpenAlex, Eric Louis has authored 45 papers receiving a total of 601 indexed citations (citations by other indexed papers that have themselves been cited), including 29 papers in Electrical and Electronic Engineering, 20 papers in Surfaces, Coatings and Films and 12 papers in Radiation. Recurrent topics in Eric Louis's work include Advancements in Photolithography Techniques (18 papers), Electron and X-Ray Spectroscopy Techniques (13 papers) and Optical Coatings and Gratings (11 papers). Eric Louis is often cited by papers focused on Advancements in Photolithography Techniques (18 papers), Electron and X-Ray Spectroscopy Techniques (13 papers) and Optical Coatings and Gratings (11 papers). Eric Louis collaborates with scholars based in Netherlands, Germany and United States. Eric Louis's co-authors include F. Bijkerk, Robbert Wilhelmus Elisabeth van de Kruijs, Andrey Yakshin, E. Zoethout, Qiushi Huang, S. Müllender, Igor A. Makhotkin, V. V. Medvedev, Andrei M. Yakunin and Frank Scholze and has published in prestigious journals such as Journal of Applied Physics, Scientific Reports and Optics Letters.

In The Last Decade

Eric Louis

43 papers receiving 566 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Eric Louis Netherlands 15 275 165 155 154 142 45 601
Claude Montcalm United States 14 266 1.0× 157 1.0× 178 1.1× 208 1.4× 83 0.6× 37 557
S. A. Yulin Germany 16 273 1.0× 224 1.4× 116 0.7× 200 1.3× 131 0.9× 45 612
S. Yu. Zuev Russia 16 266 1.0× 206 1.2× 166 1.1× 228 1.5× 105 0.7× 66 709
Mónica Fernández-Perea Spain 15 164 0.6× 79 0.5× 145 0.9× 195 1.3× 121 0.9× 48 512
Mohammed H. Modi India 14 187 0.7× 120 0.7× 94 0.6× 281 1.8× 234 1.6× 91 648
Benjawan Kjornrattanawanich United States 14 255 0.9× 132 0.8× 160 1.0× 143 0.9× 87 0.6× 37 521
Patrick A. Kearney United States 14 541 2.0× 174 1.1× 361 2.3× 189 1.2× 126 0.9× 78 815
James A. Folta United States 12 273 1.0× 100 0.6× 130 0.8× 89 0.6× 49 0.3× 39 481
W. K. Waskiewicz United States 17 544 2.0× 295 1.8× 284 1.8× 229 1.5× 131 0.9× 75 902
Yu. A. Vainer Russia 11 141 0.5× 106 0.6× 78 0.5× 125 0.8× 84 0.6× 33 455

Countries citing papers authored by Eric Louis

Since Specialization
Citations

This map shows the geographic impact of Eric Louis's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Eric Louis with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Eric Louis more than expected).

Fields of papers citing papers by Eric Louis

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Eric Louis. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Eric Louis. The network helps show where Eric Louis may publish in the future.

Co-authorship network of co-authors of Eric Louis

This figure shows the co-authorship network connecting the top 25 collaborators of Eric Louis. A scholar is included among the top collaborators of Eric Louis based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Eric Louis. Eric Louis is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Huang, Qiushi, Runze Qi, R. Loch, et al.. (2017). High Reflectance Nanoscale V/Sc Multilayer for Soft X-ray Water Window Region. Scientific Reports. 7(1). 12929–12929. 21 indexed citations
2.
Monfaredi, Reza, et al.. (2014). Robot-assisted ultrasound imaging: Overview and development of a parallel telerobotic system. Minimally Invasive Therapy & Allied Technologies. 24(1). 54–62. 50 indexed citations
3.
4.
Huang, Qiushi, et al.. (2014). High efficiency structured EUV multilayer mirror for spectral filtering of long wavelengths. Optics Express. 22(16). 19365–19365. 9 indexed citations
5.
Sobierajski, R., R. Loch, Robbert Wilhelmus Elisabeth van de Kruijs, et al.. (2013). Mo/Si multilayer-coated amplitude-division beam splitters for XUV radiation sources. Journal of Synchrotron Radiation. 20(2). 249–257. 4 indexed citations
6.
Liu, Feng, Chris Lee, Eric Louis, et al.. (2012). Ellipsometry with randomly varying polarization states. Optics Express. 20(2). 870–870. 3 indexed citations
7.
Makhotkin, Igor A., E. Zoethout, Eric Louis, et al.. (2012). Spectral properties of La/B - based multilayer mirrors near the boron K absorption edge. Optics Express. 20(11). 11778–11778. 29 indexed citations
8.
Louis, Eric, et al.. (2011). Multilayer development for Extreme Ultraviolet and shorter wavelength lithography. University of Twente Research Information. 4 indexed citations
9.
Louis, Eric, Chris Lee, Monika Lubomska, et al.. (2010). Secondary electron yield measurements of carbon covered multilayer optics. Applied Surface Science. 257(2). 354–361. 20 indexed citations
10.
Zoethout, E., Eric Louis, Robbert Wilhelmus Elisabeth van de Kruijs, et al.. (2009). Improved contrast and reflectivity of multilayer reflective optics for wavelengths beyond the extreme UV. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7271. 72713V–72713V. 13 indexed citations
11.
Louis, Eric, Chris Lee, Herbert Wormeester, et al.. (2009). Detection and characterization of carbon contamination on EUV multilayer mirrors. Optics Express. 17(19). 16969–16969. 28 indexed citations
12.
Lee, Chris, Eric Louis, F. Bijkerk, et al.. (2008). Characterization of EUV induced carbon films using laser-generated surface acoustic waves. Diamond and Related Materials. 18(5-8). 768–771. 12 indexed citations
13.
Laubis, Christian, Andreas Fischer, Frank Scholz, et al.. (2006). Characterization of large off-axis EUV mirrors with high accuracy reflectometry at PTB. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6151. 61510I–61510I. 8 indexed citations
14.
Zoethout, E., et al.. (2004). Subatomic accuracy in EUVL multilayer coatings. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5374. 892–892. 4 indexed citations
15.
Zoethout, E., Gellért Sipos, Robbert Wilhelmus Elisabeth van de Kruijs, et al.. (2003). Stress mitigation in Mo/Si multilayers for EUV lithography. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 19 indexed citations
16.
Louis, Eric, Andrey Yakshin, R. Stuik, et al.. (2000). <title>Progress in Mo/Si multilayer coating technology for EUVL optics</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3997. 406–411. 40 indexed citations
17.
Klein, R., Frank Scholze, Jeroen Jonkers, et al.. (2000). <title>Multilayer reflectance during exposure to EUV radiation</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 16 indexed citations
18.
Abdali, Salim, Finn E. Christensen, H. W. Schnopper, et al.. (1997). <title>Objective Crystal Spectrometer (OXS) on the Spectrum-X-y satellite: crystal calibrations</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3114. 358–372.
19.
Louis, Eric, et al.. (1992). Performance Optimization of a High-Repetition-Rate KrF Laser Plasma X-Ray Source for Microlithography. Journal of X-Ray Science and Technology. 3(2). 133–151. 1 indexed citations
20.
Bijkerk, F., Eric Louis, G. E. van Dorssen, & M.J. van der Wiel. (1989). Laser Plasma As X-Ray Source For Lithographic Imaging. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1089. 274–274. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by Claude Montcalm Breakdown of academic impact, for papers by S. A. Yulin Breakdown of academic impact, for papers by S. Yu. Zuev Breakdown of academic impact, for papers by Mónica Fernández-Perea Breakdown of academic impact, for papers by Mohammed H. Modi Breakdown of academic impact, for papers by Benjawan Kjornrattanawanich Breakdown of academic impact, for papers by Patrick A. Kearney Breakdown of academic impact, for papers by James A. Folta Breakdown of academic impact, for papers by W. K. Waskiewicz Breakdown of academic impact, for papers by Yu. A. Vainer
Rankless by CCL
2026