M. Procop
- Radiation top 2%
- X-ray Spectroscopy and Fluorescence Analysis 23
- Nuclear Physics and Applications 9
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques 32
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- Semiconductor materials and interfaces 6
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- Semiconductor materials and devices 11
- Integrated Circuits and Semiconductor Failure Analysis 5
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- Ion-surface interactions and analysis 10
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- Advanced X-ray and CT Imaging 7
M. Procop
50 papers receiving 622 citations
Peers
Comparison fields: 5 of 67
- Radiation 343
- Surfaces, Coatings and Films 247
- Atomic and Molecular Physics, and Optics 143
- Materials Chemistry 204
- Structural Biology 6
Countries citing papers authored by M. Procop
This map shows the geographic impact of M. Procop's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Procop with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Procop more than expected).
Fields of papers citing papers by M. Procop
This network shows the impact of papers produced by M. Procop. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Procop. The network helps show where M. Procop may publish in the future.
Co-authorship network
The 25 scholars most cited alongside M. Procop, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2022 | 0 | |
| 2 | 2016 | 3 | |
| 3 | 2016 | 6 | |
| 4 | 2014 | 6 | |
| 5 | 2010 | 8 | |
| 6 | 2009 | 9 | |
| 7 | 2009 | 98 | |
| 8 | 2009 | 3 | |
| 9 | 2008 | 1 | |
| 10 | 2006 | 41 | |
| 11 | 2006 | 1 | |
| 12 | 2004 | 14 | |
| 13 | 2002 | 17 | |
| 14 | 1999 | 12 | |
| 15 | 1991 | 2 | |
| 16 | 1991 | 9 | |
| 17 | 1987 | 1 | |
| 18 | 1986 | 10 | |
| 19 | 1986 | 7 | |
| 20 | 1975 | 10 |
About M. Procop
M. Procop is a scholar working on Surfaces, Coatings and Films, Radiation, Computational Mechanics, Atomic and Molecular Physics, and Optics and Electrical and Electronic Engineering, having authored 53 papers that have together received 660 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (32 papers), X-ray Spectroscopy and Fluorescence Analysis (23 papers), Semiconductor materials and devices (11 papers), Ion-surface interactions and analysis (10 papers), Nuclear Physics and Applications (9 papers), Advanced X-ray and CT Imaging (7 papers), Semiconductor materials and interfaces (6 papers) and Integrated Circuits and Semiconductor Failure Analysis (5 papers). The work is most often cited by research in Radiation (343 citations), Surfaces, Coatings and Films (247 citations), Atomic and Molecular Physics, and Optics (143 citations), Materials Chemistry (204 citations) and Structural Biology (6 citations). M. Procop has collaborated with scholars based in Germany, Italy and United Kingdom. Frequent co-authors include Frank Scholze, J. Völter, Vasile‐Dan Hodoroaba, H. Lange, Τ. Wirth, A. Bjeoumikhov, H. Berndt, Michael Krumrey, R. Wedell and Ralf Terborg. Their work appears in journals such as Microscopy and Microanalysis, Analytical and Bioanalytical Chemistry, Surface Science, Microchimica Acta and Surface and Interface Analysis.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.