Victor Soltwisch

1.0k total citations
72 papers, 734 citations indexed

About

Victor Soltwisch is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Radiation. According to data from OpenAlex, Victor Soltwisch has authored 72 papers receiving a total of 734 indexed citations (citations by other indexed papers that have themselves been cited), including 46 papers in Surfaces, Coatings and Films, 31 papers in Electrical and Electronic Engineering and 24 papers in Radiation. Recurrent topics in Victor Soltwisch's work include Optical Coatings and Gratings (27 papers), Advancements in Photolithography Techniques (25 papers) and Electron and X-Ray Spectroscopy Techniques (21 papers). Victor Soltwisch is often cited by papers focused on Optical Coatings and Gratings (27 papers), Advancements in Photolithography Techniques (25 papers) and Electron and X-Ray Spectroscopy Techniques (21 papers). Victor Soltwisch collaborates with scholars based in Germany, Belgium and United States. Victor Soltwisch's co-authors include Frank Scholze, E. Weschke, E. Schierle, J. Fink, J. Geck, B. Büchner, Anton Haase, Christian Laubis, Michael Krumrey and Mika Pflüger and has published in prestigious journals such as Physical Review Letters, Applied Physics Letters and Physical Review B.

In The Last Decade

Victor Soltwisch

67 papers receiving 706 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Victor Soltwisch Germany 14 266 252 249 202 178 72 734
Francesc Salvat–Pujol Germany 9 127 0.5× 117 0.5× 91 0.4× 81 0.4× 61 0.3× 25 356
Matthew Wormington United States 11 64 0.2× 90 0.4× 281 1.1× 87 0.4× 38 0.2× 44 597
Y. H. Phang United States 8 205 0.8× 79 0.3× 209 0.8× 115 0.6× 65 0.4× 10 787
B. Schmiedeskamp Germany 15 141 0.5× 160 0.6× 126 0.5× 46 0.2× 92 0.5× 49 576
Andrei M. Yakunin Netherlands 14 58 0.2× 82 0.3× 263 1.1× 98 0.5× 55 0.3× 35 595
M. F. Ravet France 14 84 0.3× 64 0.3× 229 0.9× 87 0.4× 62 0.3× 28 546
D. Patel United States 15 176 0.7× 44 0.2× 388 1.6× 76 0.4× 35 0.2× 72 692
S. A. Yulin Germany 16 54 0.2× 116 0.5× 273 1.1× 26 0.1× 200 1.1× 45 612
J. Kuběna Czechia 11 178 0.7× 50 0.2× 136 0.5× 61 0.3× 83 0.5× 39 540
T. Boutboul Spain 15 87 0.3× 153 0.6× 251 1.0× 24 0.1× 168 0.9× 29 693

Countries citing papers authored by Victor Soltwisch

Since Specialization
Citations

This map shows the geographic impact of Victor Soltwisch's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Victor Soltwisch with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Victor Soltwisch more than expected).

Fields of papers citing papers by Victor Soltwisch

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Victor Soltwisch. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Victor Soltwisch. The network helps show where Victor Soltwisch may publish in the future.

Co-authorship network of co-authors of Victor Soltwisch

This figure shows the co-authorship network connecting the top 25 collaborators of Victor Soltwisch. A scholar is included among the top collaborators of Victor Soltwisch based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Victor Soltwisch. Victor Soltwisch is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Kayser, Yves, Jonas Baumann, Thomas Siefke, et al.. (2025). Characterization and discrimination of periodic nanostructures with scanning-free GEXRF. Nanotechnology. 36(23). 235701–235701.
2.
3.
Hansen, Poul‐Erik, Sebastian Heidenreich, Victor Soltwisch, et al.. (2025). Instrumentation and uncertainty evaluation for absolute characterization of thin films and nanostructured surfaces in advanced optical metrology. Metrologia. 62(2). 25010–25010.
4.
5.
Gottwald, Alexander, et al.. (2024). Quantitative reconstruction of atomic orbital densities of neon from partial cross sections. Physical review. A. 109(1). 1 indexed citations
6.
Ciesielski, Richard, Roger Loo, Yosuke Shimura, et al.. (2024). Interface sharpness in stacked thin film structures: a comparison of soft X-ray reflectometry and transmission electron microscopy. Journal of Micro/Nanopatterning Materials and Metrology. 23(4). 1 indexed citations
7.
Ciesielski, Richard, Roger Loo, Yosuke Shimura, et al.. (2024). Soft x-ray reflectometry for the inspection of interlayer roughness in stacked thin film structures. Ghent University Academic Bibliography (Ghent University). 2 indexed citations
8.
Hönicke, Philipp, Jonas Baumann, Daniel Grötzsch, et al.. (2022). Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples. Nanomaterials. 12(21). 3766–3766. 10 indexed citations
9.
Philipsen, Vicky, et al.. (2022). Nested Sampling aided determination of tantalum optical constants in the EUV spectral range. Applied Optics. 61(33). 10032–10032. 2 indexed citations
10.
Philipsen, Vicky, et al.. (2022). On the optical constants of cobalt in the M-absorption edge region. Optik. 273. 170455–170455. 1 indexed citations
11.
Skroblin, Dieter, Thomas Siefke, Philipp Hönicke, et al.. (2022). Challenges of grazing emission X-ray fluorescence (GEXRF) for the characterization of advanced nanostructured surfaces. Nanoscale. 14(41). 15475–15483. 4 indexed citations
12.
Ciesielski, Richard, et al.. (2022). Nanoscale grating characterization using EUV scatterometry and soft x-ray scattering with plasma and synchrotron radiation. Applied Optics. 62(1). 117–117. 5 indexed citations
13.
Marneffe, Jean‐François de, Karl Opsomer, Christophe Detavernier, et al.. (2021). Characterization of Ru4-xTax (x = 1,2,3) alloy as material candidate for EUV low-n mask. Micro and Nano Engineering. 12. 100089–100089. 10 indexed citations
14.
Hönicke, Philipp, Yves Kayser, Victor Soltwisch, et al.. (2021). Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures. Small. 18(6). e2105776–e2105776. 16 indexed citations
15.
Hönicke, Philipp, Yves Kayser, Jürgen Probst, et al.. (2020). Grazing incidence-x-ray fluorescence for a dimensional and compositional characterization of well-ordered 2D and 3D nanostructures. Nanotechnology. 31(50). 505709–505709. 13 indexed citations
16.
Haase, Anton, S. Bajt, Philipp Hönicke, Victor Soltwisch, & Frank Scholze. (2016). Multiparameter characterization of subnanometre Cr/Sc multilayers based on complementary measurements. Journal of Applied Crystallography. 49(6). 2161–2171. 28 indexed citations
17.
Wilkins, S. B., E. Schierle, J. E. Hamann-Borrero, et al.. (2012). Resonant soft X-ray scattering studies of multiferroic YMn2O5. The European Physical Journal Special Topics. 208(1). 133–139. 3 indexed citations
18.
Fink, J., Victor Soltwisch, J. Geck, et al.. (2011). Phase diagram of charge order in La1.8−xEu0.2SrxCuO4from resonant soft x-ray diffraction. Physical Review B. 83(9). 80 indexed citations
19.
Fink, J., E. Schierle, E. Weschke, et al.. (2009). Charge ordering inLa1.8−xEu0.2SrxCuO4studied by resonant soft x-ray diffraction. Physical Review B. 79(10). 92 indexed citations
20.
Fink, J., E. Schierle, E. Weschke, et al.. (2009). Charge ordering in La1.8 xEu0.2SrxCuO4 studied by resonant soft x ray diffraction. HZB Repository (Helmholtz-Zentrum Berlin für Materialien und Energie GmbH (HZB)). 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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