E. Wolfgang
Impact in
- Surfaces, Coatings and Films top 10%
- Electron and X-Ray Spectroscopy Techniques
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- Magnetic Properties of Alloys
- Magnetic Properties and Applications
Papers in
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- Electron and X-Ray Spectroscopy Techniques 10
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- Integrated Circuits and Semiconductor Failure Analysis 11
- Silicon Carbide Semiconductor Technologies 9
- Advancements in Photolithography Techniques 6
- Semiconductor materials and devices 6
E. Wolfgang
27 papers receiving 295 citations
Peers
Comparison fields: 5 of 49
- Surfaces, Coatings and Films 42
- Electronic, Optical and Magnetic Materials 73
- Electrical and Electronic Engineering 224
- Condensed Matter Physics 28
- General Materials Science 7
Countries citing papers authored by E. Wolfgang
This map shows the geographic impact of E. Wolfgang's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Wolfgang with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Wolfgang more than expected).
Fields of papers citing papers by E. Wolfgang
This network shows the impact of papers produced by E. Wolfgang. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Wolfgang. The network helps show where E. Wolfgang may publish in the future.
Co-authorship network
The 25 scholars most cited alongside E. Wolfgang, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 6 | |
| 2 | 2007 | 11 | |
| 3 | 2003 | 1 | |
| 4 | 2002 | 14 | |
| 5 | 1998 | 58 | |
| 6 | Power semiconductor materials and devices | 1997 | 15 |
| 7 | 1996 | 10 | |
| 8 | Advanced Diagnosis Techniques for sub-μm Integrated Circuits | 1994 | 0 |
| 9 | Contactless Testing for Chip Verification | 1991 | 1 |
| 10 | 1991 | 4 | |
| 11 | Proceedings of the first European conference on Electron and Optical Beam Testing of Integrated Circuits | 1988 | 1 |
| 12 | 1987 | 11 | |
| 13 | Automated electron beam testing of VLSI circuits | 1984 | 9 |
| 14 | 1983 | 9 | |
| 15 | 1979 | 15 | |
| 16 | 1978 | 1 | |
| 17 | On-wafer failure analysis of LSI-MOS memory circuits by scanning electron microscopy | 1977 | 1 |
| 18 | 1976 | 32 | |
| 19 | 1971 | 2 | |
| 20 | 1971 | 4 |
About E. Wolfgang
E. Wolfgang is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics and Condensed Matter Physics, having authored 30 papers that have together received 314 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (11 papers), Electron and X-Ray Spectroscopy Techniques (10 papers), Silicon Carbide Semiconductor Technologies (9 papers), Advancements in Photolithography Techniques (6 papers), Semiconductor materials and devices (6 papers), Magnetic Properties and Applications (4 papers), Magnetic properties of thin films (3 papers) and Force Microscopy Techniques and Applications (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (42 citations), Electronic, Optical and Magnetic Materials (73 citations), Electrical and Electronic Engineering (224 citations), Condensed Matter Physics (28 citations) and General Materials Science (7 citations). E. Wolfgang has collaborated with scholars based in Germany, Netherlands and Switzerland. Frequent co-authors include H. Berg, Hauke Harms, H. Göbel, Wolfgang Unger, Péter Fazekas, Gerald Deboy, W. Claeys, G. Sölkner, N. Seliger and K. Goser. Their work appears in journals such as Microelectronics Reliability, IEEE Journal of Solid-State Circuits, Journal of Applied Physics, Microelectronic Engineering and IEEE Transactions on Electron Devices.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.