Chang-Chi Lee
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- Electronic Packaging and Soldering Technologies 19
- 3D IC and TSV technologies 17
- Silicon Carbide Semiconductor Technologies 5
- Electromagnetic Compatibility and Noise Suppression 4
- Integrated Circuits and Semiconductor Failure Analysis 2
- Hardware and Architecture top 10%
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- Sensor Technology and Measurement Systems 2
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- Thermal properties of materials 3
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- Copper Interconnects and Reliability 2
Chang-Chi Lee
25 papers receiving 357 citations
Peers
Comparison fields: 5 of 45
- Electrical and Electronic Engineering 311
- Hardware and Architecture 35
- Biomedical Engineering 125
- Computer Networks and Communications 60
- Automotive Engineering 21
Countries citing papers authored by Chang-Chi Lee
This map shows the geographic impact of Chang-Chi Lee's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Chang-Chi Lee with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Chang-Chi Lee more than expected).
Fields of papers citing papers by Chang-Chi Lee
This network shows the impact of papers produced by Chang-Chi Lee. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Chang-Chi Lee. The network helps show where Chang-Chi Lee may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Chang-Chi Lee, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2021 | 1 | |
| 2 | 2020 | 26 | |
| 3 | 2020 | 22 | |
| 4 | 2019 | 5 | |
| 5 | 2019 | 3 | |
| 6 | 2017 | 3 | |
| 7 | 2017 | 86 | |
| 8 | 2016 | 104 | |
| 9 | 2014 | 1 | |
| 10 | 2014 | 3 | |
| 11 | 2013 | 2 | |
| 12 | 2013 | 6 | |
| 13 | 2012 | 13 | |
| 14 | 2012 | 12 | |
| 15 | 2011 | 9 | |
| 16 | 2008 | 17 | |
| 17 | 2007 | 0 | |
| 18 | 2007 | 3 | |
| 19 | 2006 | 0 | |
| 20 | 2005 | 7 |
About Chang-Chi Lee
Chang-Chi Lee is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Analytical Chemistry, Industrial and Manufacturing Engineering and Computer Networks and Communications, having authored 28 papers that have together received 370 indexed citations. Recurring topics across this work include Electronic Packaging and Soldering Technologies (19 papers), 3D IC and TSV technologies (17 papers), Silicon Carbide Semiconductor Technologies (5 papers), Electromagnetic Compatibility and Noise Suppression (4 papers), Thermal properties of materials (3 papers), Sensor Technology and Measurement Systems (2 papers), Copper Interconnects and Reliability (2 papers) and Integrated Circuits and Semiconductor Failure Analysis (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (311 citations), Hardware and Architecture (35 citations), Biomedical Engineering (125 citations), Computer Networks and Communications (60 citations) and Automotive Engineering (21 citations). Chang-Chi Lee has collaborated with scholars based in Taiwan, United States and Australia. Frequent co-authors include Tong Hong Wang, Yi‐Shao Lai, Wei-Chih Chen, Michael Su, Meng-Kai Shih, Bryan Black, Yu‐Hsiang Hsiao, Ping‐Feng Yang, Chin‐Li Kao and Dao-Long Chen. Their work appears in journals such as Microelectronics Reliability, Microelectronic Engineering, IEEE Access, Electronics and Journal of Electronic Packaging.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.