Warren Anderson

409 total citations
22 papers, 215 citations indexed

About

Warren Anderson is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Immunology. According to data from OpenAlex, Warren Anderson has authored 22 papers receiving a total of 215 indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Electrical and Electronic Engineering, 6 papers in Hardware and Architecture and 4 papers in Immunology. Recurrent topics in Warren Anderson's work include Integrated Circuits and Semiconductor Failure Analysis (12 papers), Electrostatic Discharge in Electronics (12 papers) and Electromagnetic Compatibility and Noise Suppression (5 papers). Warren Anderson is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (12 papers), Electrostatic Discharge in Electronics (12 papers) and Electromagnetic Compatibility and Noise Suppression (5 papers). Warren Anderson collaborates with scholars based in United States, South Korea and Canada. Warren Anderson's co-authors include David J. Rawlings, Kyle G. Daniels, Lukasz J. Bugaj, Geoff P. O’Donoghue, Wendell A. Lim, S. Alice Long, Jerill Thorpe, David Bearden, J. Montanaro and E. Worley and has published in prestigious journals such as Proceedings of the National Academy of Sciences, Journal of Clinical Oncology and Applied Physics Letters.

In The Last Decade

Warren Anderson

21 papers receiving 195 citations

Peers

Warren Anderson

EEE

IMMUN

ONCOL

Jean-Jacques Hajjar United States

J. Lee United States

Torsten Mueller Germany

Anirudh Sivakumar United States

E. Tournier France

Uma M. Mangalanathan United States

Regina Surjadi Australia

Katrin Braasch Canada

Chenglong Huang China

Jean-Jacques Hajjar United States

Warren Anderson

443 ×3.0

EEE

46 ×1.4

34 ×1.1

IMMUN

15 ×0.6

ONCOL

4 ×0.2

Citations per year, relative to Warren Anderson Warren Anderson (= 1×) peers Jean-Jacques Hajjar

Countries citing papers authored by Warren Anderson

Since Specialization

Citations

This map shows the geographic impact of Warren Anderson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Warren Anderson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Warren Anderson more than expected).

Fields of papers citing papers by Warren Anderson

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Warren Anderson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Warren Anderson. The network helps show where Warren Anderson may publish in the future.

Co-authorship network of co-authors of Warren Anderson

This figure shows the co-authorship network connecting the top 25 collaborators of Warren Anderson. A scholar is included among the top collaborators of Warren Anderson based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Warren Anderson. Warren Anderson is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Schroff, Matthias, Warren Anderson, Lei Yue, et al.. (2025). A phase 1, first-in-human study of IB-T101, an OUTLAST CAR-T product for the treatment of CD70-positive clear cell renal carcinoma.. Journal of Clinical Oncology. 43(16_suppl).

Anderson, Warren, et al.. (2023). PTPN22 R620W gene editing in T cells enhances low-avidity TCR responses. eLife. 12. 9 indexed citations

Song, Jing, Warren Anderson, Alex Hu, et al.. (2022). CBLB Deficiency in Human CD4+ T Cells Results in Resistance to T Regulatory Suppression through Multiple Mechanisms. The Journal of Immunology. 209(7). 1260–1271. 1 indexed citations

O’Donoghue, Geoff P., Lukasz J. Bugaj, Warren Anderson, et al.. (2021). T cells selectively filter oscillatory signals on the minutes timescale. Proceedings of the National Academy of Sciences. 118(9). 35 indexed citations

Anderson, Warren, Jerill Thorpe, S. Alice Long, & David J. Rawlings. (2019). Efficient CRISPR/Cas9 Disruption of Autoimmune-Associated Genes Reveals Key Signaling Programs in Primary Human T Cells. The Journal of Immunology. 203(12). 3166–3178. 17 indexed citations

Cao, Shuqing, et al.. (2010). Investigation on output driver with stacked devices for ESD design window engineering. Electrical Overstress/Electrostatic Discharge Symposium. 1–8. 6 indexed citations

Anderson, Warren, et al.. (2009). Metal and silicon burnout failures from CDM ESD testing. 1–8. 3 indexed citations

Anderson, Warren, et al.. (2004). ESD protection design challenges for a high pin-count alpha microprocessor in a 0.13μm CMOS SOI technology. Journal of Electrostatics. 62(2-3). 113–131. 10 indexed citations

Anderson, Warren, et al.. (2003). ESD protection under wire bonding pads. 88–94. 13 indexed citations

10.

Benschneider, B.J., Sungho Park, R. Allmon, et al.. (2002). A 1 GHz Alpha microprocessor. 86–87. 7 indexed citations

11.

Voldman, Steven H., Warren Anderson, R.A. Ashton, et al.. (2002). Electrostatic discharge (ESD) technology benchmarking strategy for evaluating ESD robustness of CMOS technologies. 32. 72–77. 2 indexed citations

12.

Anderson, Warren, et al.. (2002). ESD protection for mixed-voltage I/O using NMOS transistors stacked in a cascode configuration. 54–62. 55 indexed citations

13.

Voldman, Steven H., Warren Anderson, R.A. Ashton, et al.. (2001). A strategy for characterization and evaluation of ESD robustness of CMOS semiconductor technologies. Microelectronics Reliability. 41(3). 335–348. 9 indexed citations

14.

Anderson, Warren, et al.. (2001). Reliability considerations for ESD protection under wire bonding pads. Microelectronics Reliability. 41(3). 367–373. 3 indexed citations

15.

Anderson, Warren, et al.. (1999). ESD protection for mixed-voltage I/O using NMOS transistors stacked in a cascode configuration. Microelectronics Reliability. 39(11). 1521–1529. 10 indexed citations

16.

Anderson, Warren. (1997). Circuit and process design considerations for ESD protection in advanced CMOS processes. Microelectronics Reliability. 37(7). 1087–1103. 3 indexed citations

17.

Anderson, Warren, et al.. (1993). Determination of Si/SiO2 interfacial roughness using weak localization. Microelectronic Engineering. 22(1-4). 43–46. 2 indexed citations

18.

Anderson, Warren, et al.. (1993). Determination of Si/SiO/sub 2/ interface roughness using weak localization. IEEE Electron Device Letters. 14(7). 351–353. 5 indexed citations

19.

Anderson, Warren, R. G. Wheeler, & T. P.. (1992). Observation of interface traps in the silicon conduction band at the (100)Si/SiO2 interface at 4.2 K. Applied Physics Letters. 61(9). 1107–1109. 2 indexed citations

20.

Bearden, David, et al.. (1992). A 4.5 Ins 96b Cmos Adder Design. 25.5.1–25.5.4. 11 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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