Jeff Wu

5.4k total citations · 1 hit paper
24 papers, 490 citations indexed

About

Jeff Wu is a scholar working on Electrical and Electronic Engineering, Artificial Intelligence and Management Science and Operations Research. According to data from OpenAlex, Jeff Wu has authored 24 papers receiving a total of 490 indexed citations (citations by other indexed papers that have themselves been cited), including 17 papers in Electrical and Electronic Engineering, 2 papers in Artificial Intelligence and 2 papers in Management Science and Operations Research. Recurrent topics in Jeff Wu's work include Semiconductor materials and devices (12 papers), Advancements in Semiconductor Devices and Circuit Design (10 papers) and Integrated Circuits and Semiconductor Failure Analysis (9 papers). Jeff Wu is often cited by papers focused on Semiconductor materials and devices (12 papers), Advancements in Semiconductor Devices and Circuit Design (10 papers) and Integrated Circuits and Semiconductor Failure Analysis (9 papers). Jeff Wu collaborates with scholars based in United States, China and Italy. Jeff Wu's co-authors include Lucia F. Primavesi, Xi Chen, Shib Sankar Basu, L. Mark Lagrimini, Michael L. Nuccio, Huaping Zhou, Emdadul Haque, Yan Gao, Matthew J. Paul and Donna Jo Napoli and has published in prestigious journals such as SHILAP Revista de lepidopterología, Nature Biotechnology and Journal of Materials Chemistry A.

In The Last Decade

Jeff Wu

22 papers receiving 482 citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Expression of trehalose-6-phosphate phosphatase in maize ears improves yield in well-watered and drought conditions

2015 339 citations Jeff Wu et al. profile →

Peers

Jeff Wu

PS

MB

EEE

ACS

GENET

Santiago Navarro Spain

Fengge Wang China

Dinghe Wang China

Anfei Li China

Guorui Wang China

Muskan Jain India

Xiaolei Zhang China

Kayode Sanni United States

Hongying Yi China

Jialin Wang China

Santiago Navarro Spain

Jeff Wu

247 ×0.8

PS

152 ×1.4

MB

133 ×1.3

EEE

46 ×0.9

ACS

28 ×0.8

GENET

Citations per year, relative to Jeff Wu Jeff Wu (= 1×) peers Santiago Navarro

Countries citing papers authored by Jeff Wu

Since Specialization

Citations

This map shows the geographic impact of Jeff Wu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jeff Wu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jeff Wu more than expected).

Fields of papers citing papers by Jeff Wu

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jeff Wu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jeff Wu. The network helps show where Jeff Wu may publish in the future.

Co-authorship network of co-authors of Jeff Wu

This figure shows the co-authorship network connecting the top 25 collaborators of Jeff Wu. A scholar is included among the top collaborators of Jeff Wu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jeff Wu. Jeff Wu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

1.

Yang, Kunran, et al.. (2025). High throughput computational and experimental methods for accelerated electrochemical materials discovery. Journal of Materials Chemistry A. 13(32). 26041–26066. 1 indexed citations

2.

Tuo, Rui & Jeff Wu. (2017). Prediction based on the Kennedy-O’Hagan calibration model: asymptotic consistency and other properties. Statistica Sinica. 7 indexed citations

3.

Song, Yongliang, et al.. (2016). Investigations of hot carrier injection on NMOSFET with high Vds and low Vgs stress. 32. 1–3. 2 indexed citations

4.

Zhao, Xiangfu, et al.. (2014). Effect of alloy seed on Cu interconnect electromigration and stress migration. Microelectronic Engineering. 129. 86–90. 2 indexed citations

5.

Wu, Jeff, et al.. (2014). Via Impact on the Upstream Electromigration of 40/45nm Low-k Cu Interconnect. ECS Transactions. 60(1). 933–937.

6.

Song, Zhuo, et al.. (2013). The Failure Mechanism Worst Stress Condition for Hot Carrier Injection of NMOS. ECS Transactions. 52(1). 947–952. 8 indexed citations

7.

Qi, Ruijuan, et al.. (2013). Optimization of TEM sample preparation methods by FIB for the increase of throughput. 99–102.

8.

Ji, Xiaoli, et al.. (2012). Worst Case Stress Conditions for Hot Carrier Degradation with Technology Nodes from 0.35µm to 45nm. ECS Transactions. 44(1). 1151–1155. 4 indexed citations

9.

Wu, Jeff & Sanjay Lall. (2010). An Exact Dynamic Programming Solution for a Decentralized Two-Player Markov Decision Process. National Conference on Artificial Intelligence. 2 indexed citations

10.

Wu, Jeff & Sanjay Lall. (2010). A dynamic programming algorithm for decentralized Markov decision processes with a broadcast structure. 6143–6148. 10 indexed citations

11.

Wu, Jeff, et al.. (2008). Progress in modeling of SMT “stress memorization technique” and prediction of stress enhancement by a novel PMOS SMT process. 117–120. 3 indexed citations

12.

Wu, Jeff & Xin Wang. (2008). Stress engineering for 32nm CMOS technology node. 113–116. 5 indexed citations

13.

Huang, Min, et al.. (2005). Phenomenological model for "stress memorization" effect from a capped-poly process. 139–142. 8 indexed citations

14.

Liu, Kaiping, Jeff Wu, Jihong Chen, & Amit Kumar C Jain. (2003). Fluorine-assisted super-halo for sub-50-nm transistors. IEEE Electron Device Letters. 24(3). 180–182. 15 indexed citations

15.

Wu, Jeff, Jihong Chen, & Kaiping Liu. (2003). Transistor width dependence of LER degradation to CMOS device characteristics. 95–98. 11 indexed citations

16.

Scott, D.B., et al.. (2003). Effects of uniaxial mechanical stress on drive current of 0.13 μm MOSFETs. IEEE Transactions on Electron Devices. 50(2). 529–531. 36 indexed citations

17.

Napoli, Donna Jo & Jeff Wu. (2003). Morpheme structure constraints on two-handed signs in American Sign Language. Sign Language & Linguistics. 6(2). 123–205. 23 indexed citations

18.

Liu, Kaiping, et al.. (2002). <title>Improving device performance and process manufacturability through the use of TCAD</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4692. 411–420. 1 indexed citations

19.

Hu, Jerry C., et al.. (2002). Development of substrate-pumped nMOS protection for a 0.13 μm technology. Microelectronics Reliability. 42(6). 887–899. 1 indexed citations

20.

Hu, Jerry C., et al.. (2001). Development of substrate-pumped nMOS protection for a 0.13∝m technology. Electrical Overstress/Electrostatic Discharge Symposium. 190–202. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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