Bhanwar Singh

542 total citations
44 papers, 417 citations indexed

About

Bhanwar Singh is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Bhanwar Singh has authored 44 papers receiving a total of 417 indexed citations (citations by other indexed papers that have themselves been cited), including 34 papers in Electrical and Electronic Engineering, 10 papers in Surfaces, Coatings and Films and 9 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Bhanwar Singh's work include Advancements in Photolithography Techniques (23 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers) and Industrial Vision Systems and Defect Detection (7 papers). Bhanwar Singh is often cited by papers focused on Advancements in Photolithography Techniques (23 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers) and Industrial Vision Systems and Defect Detection (7 papers). Bhanwar Singh collaborates with scholars based in United States, India and Canada. Bhanwar Singh's co-authors include K. L. Chopra, S. Rajagopalan, Dinesh K. Pandya, Pawan Bhat, Kathryn Wilder, C. F. Quate, David F. Kyser, Costas J. Spanos, Angela Duparré and William H. Arnold and has published in prestigious journals such as Journal of Applied Physics, Journal of Non-Crystalline Solids and Solid State Communications.

In The Last Decade

Bhanwar Singh

39 papers receiving 363 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Bhanwar Singh United States 12 271 153 110 110 73 44 417
V. Carron France 12 379 1.4× 55 0.4× 184 1.7× 102 0.9× 21 0.3× 43 451
Masatake Katayama Japan 13 421 1.6× 204 1.3× 105 1.0× 88 0.8× 32 0.4× 22 503
Armin Klumpp Germany 17 714 2.6× 88 0.6× 38 0.3× 162 1.5× 25 0.3× 44 781
G. M. Cohen United States 17 1.1k 4.0× 198 1.3× 191 1.7× 446 4.1× 38 0.5× 61 1.2k
Mehrdad M. Moslehi United States 9 267 1.0× 79 0.5× 32 0.3× 67 0.6× 16 0.2× 25 340
Katsuya Okumura Japan 12 374 1.4× 54 0.4× 47 0.4× 98 0.9× 86 1.2× 56 430
Mingjie Zhang China 15 267 1.0× 131 0.9× 200 1.8× 70 0.6× 8 0.1× 45 450
Qiaoling Tong China 14 609 2.2× 57 0.4× 82 0.7× 114 1.0× 9 0.1× 27 675
Akimori Tabata Japan 14 417 1.5× 258 1.7× 54 0.5× 44 0.4× 20 0.3× 46 506
Juan Francisco Mosiño Mexico 9 129 0.5× 171 1.1× 65 0.6× 34 0.3× 7 0.1× 18 334

Countries citing papers authored by Bhanwar Singh

Since Specialization
Citations

This map shows the geographic impact of Bhanwar Singh's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bhanwar Singh with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bhanwar Singh more than expected).

Fields of papers citing papers by Bhanwar Singh

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Bhanwar Singh. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bhanwar Singh. The network helps show where Bhanwar Singh may publish in the future.

Co-authorship network of co-authors of Bhanwar Singh

This figure shows the co-authorship network connecting the top 25 collaborators of Bhanwar Singh. A scholar is included among the top collaborators of Bhanwar Singh based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Bhanwar Singh. Bhanwar Singh is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Singh, Bhanwar. (2017). Job stress among employees in the insurance sector. International Journal of Academic Research and Development. 2(6). 1261–1264.
2.
Singh, Bhanwar, et al.. (2010). Ambedkar and Social Justice. Medical Entomology and Zoology. 5 indexed citations
3.
Bunday, Benjamin, John A. Allgair, Dilip Patel, et al.. (2007). Realizing "value-added" metrology. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6518. 65181K–65181K. 6 indexed citations
4.
Bunday, Benjamin, John A. Allgair, Charles N. Archie, et al.. (2007). Value-Added Metrology. IEEE Transactions on Semiconductor Manufacturing. 20(3). 266–277. 19 indexed citations
5.
Cain, Jason P., et al.. (2006). Combined use of X-ray reflectometry and spectroscopic ellipsometry for characterization of thin film optical properties. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6155. 61550P–61550P. 6 indexed citations
6.
Dusa, Mircea, et al.. (2004). Intra-wafer CDU characterization to determine process and focus contributions based on scatterometry metrology. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5378. 93–93. 9 indexed citations
7.
Singh, Bhanwar, et al.. (2004). Time-based PEB adjustment for optimizing CD distributions. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5375. 703–703. 13 indexed citations
8.
Duparré, Angela, Bhanwar Singh, & Zu-Han Gu. (2003). Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III. 5188. 2 indexed citations
9.
Duparré, Angela, G. A. Al‐Jumaily, & Bhanwar Singh. (2000). Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries. 6 indexed citations
10.
Singh, Bhanwar, et al.. (2000). <title>Specular spectroscopic profilometry for the sub-0.18-um polySi-gate processes</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3998. 846–855. 2 indexed citations
11.
Singh, Bhanwar, et al.. (2000). <title>Automated process control monitor for 0.18-um technology and beyond</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3998. 218–226. 2 indexed citations
12.
Allgair, John A., Charles N. Archie, E. H. Bogardus, et al.. (1998). Toward a unified advanced CD-SEM specification for sub-0.18-μm technology. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3332. 138–138. 2 indexed citations
13.
Singh, Bhanwar, et al.. (1998). Efficient and cost-effective photo defect monitoring. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3332. 709–709. 2 indexed citations
14.
Wilder, Kathryn, C. F. Quate, Bhanwar Singh, & David F. Kyser. (1998). Electron beam and scanning probe lithography: A comparison. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 16(6). 3864–3873. 67 indexed citations
15.
Wilder, Kathryn, C. F. Quate, Bhanwar Singh, Roger Alvis, & William H. Arnold. (1996). Atomic force microscopy for cross section inspection and metrology. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 14(6). 4004–4008. 16 indexed citations
16.
Guarini, K.W., Bhanwar Singh, & William H. Arnold. (1996). <title>Sub-0.35-um critical dimension metrology using atomic force microscopy</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2725. 540–554. 3 indexed citations
17.
Singh, Bhanwar, et al.. (1991). Metrology issues associated with submicron linewidths. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1464. 424–424. 7 indexed citations
18.
Muray, A., et al.. (1991). Phase-shift mask technology: requirements for e-beam mask lithography. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1464. 314–314. 1 indexed citations
19.
Singh, Bhanwar, et al.. (1989). An I-Line Image Reversal Process For Submicron Lithography. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1086. 573–573.
20.
Rajagopalan, S., Bhanwar Singh, Pawan Bhat, Dinesh K. Pandya, & K. L. Chopra. (1979). Photo-induced optical effects in obliquely deposited amorphous Se-Ge films. Journal of Applied Physics. 50(1). 489–492. 22 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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