Bahman Raeissi
- Electrical and Electronic Engineering
- Atomic and Molecular Physics, and Optics
- Materials Chemistry
- Bioengineering
- Biomedical Engineering
- Co-authors
- Olof EngströmMax C. LemmeK. CherkaouiPaul K. HurleyH.D.B. GottlobOctavian BuiuS. HallEdouard V. Monakhov
- Topics
- Semiconductor materials and devices (23 papers)Integrated Circuits and Semiconductor Failure Analysis (13 papers)Semiconductor materials and interfaces (11 papers)
In The Last Decade
Bahman Raeissi
26 papers receiving 291 citations
Peers
Comparison fields: 5 of 32
- Electrical and Electronic Engineering 298
- Atomic and Molecular Physics, and Optics 111
- Materials Chemistry 107
- Bioengineering 18
- Biomedical Engineering 14
Countries citing papers authored by Bahman Raeissi
This map shows the geographic impact of Bahman Raeissi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bahman Raeissi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bahman Raeissi more than expected).
Fields of papers citing papers by Bahman Raeissi
This network shows the impact of papers produced by Bahman Raeissi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bahman Raeissi. The network helps show where Bahman Raeissi may publish in the future.
Co-authorship network of co-authors of Bahman Raeissi
This figure shows the co-authorship network connecting the top 25 collaborators of Bahman Raeissi. A scholar is included among the top collaborators of Bahman Raeissi based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Bahman Raeissi. Bahman Raeissi is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 3 | |
| 2 | 4 | |
| 3 | 9 | |
| 4 | 12 | |
| 5 | Interface state properties of high-k/SiOx/Si interfaces portrayed by multiparameter admittance spectroscopy | 0 |
| 6 | Charging Phenomena at the Interface Between High-k Dielectrics and SiOx Interlayers (Invited) | 2 |
| 7 | 3 | |
| 8 | 1 | |
| 9 | 1 | |
| 10 | 3 | |
| 11 | 1 | |
| 12 | 10 | |
| 13 | 23 | |
| 14 | 13 | |
| 15 | Interface Defects in HfO2, LaSiOx, and Gd2O3 High-k/MetalGate Structures on Silicon | 3 |
| 16 | Electron traps at HfO2/SiOx interfaces | 3 |
| 17 | 25 | |
| 18 | 12 | |
| 19 | 3 | |
| 20 | 2 |
About Bahman Raeissi
Bahman Raeissi is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Analytical Chemistry, having authored 28 papers that have together received 318 indexed citations. Recurring topics across this work include Semiconductor materials and devices (23 papers), Integrated Circuits and Semiconductor Failure Analysis (13 papers) and Semiconductor materials and interfaces (11 papers). The work is most often cited by research in Electrical and Electronic Engineering (298 citations), Atomic and Molecular Physics, and Optics (111 citations) and Bioengineering (18 citations). Bahman Raeissi has collaborated with scholars based in Sweden, Norway and Germany. Frequent co-authors include Olof Engström, Max C. Lemme, K. Cherkaoui, Paul K. Hurley, H.D.B. Gottlob, Octavian Buiu, S. Hall, Edouard V. Monakhov, Yi Lu and Bengt Svensson. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.