A. Czerwiński

682 total citations
72 papers, 540 citations indexed

About

A. Czerwiński is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Surfaces, Coatings and Films. According to data from OpenAlex, A. Czerwiński has authored 72 papers receiving a total of 540 indexed citations (citations by other indexed papers that have themselves been cited), including 64 papers in Electrical and Electronic Engineering, 35 papers in Atomic and Molecular Physics, and Optics and 13 papers in Surfaces, Coatings and Films. Recurrent topics in A. Czerwiński's work include Semiconductor materials and devices (24 papers), Semiconductor materials and interfaces (23 papers) and Integrated Circuits and Semiconductor Failure Analysis (18 papers). A. Czerwiński is often cited by papers focused on Semiconductor materials and devices (24 papers), Semiconductor materials and interfaces (23 papers) and Integrated Circuits and Semiconductor Failure Analysis (18 papers). A. Czerwiński collaborates with scholars based in Poland, Belgium and Ukraine. A. Czerwiński's co-authors include J. Ratajczak, J. Kątcki, Amporn Poyai, E. Simoen, C. Claeys, W. Rzodkiewicz, Paweł Borowicz, Agata Skwarek, M. Wzorek and Cor Claeys and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

A. Czerwiński

69 papers receiving 523 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
A. Czerwiński Poland 14 421 180 127 70 69 72 540
L. Clément France 9 244 0.6× 141 0.8× 143 1.1× 102 1.5× 42 0.6× 34 465
Youngjae Kim South Korea 14 430 1.0× 198 1.1× 159 1.3× 129 1.8× 25 0.4× 79 636
J. Stasiak United States 8 717 1.7× 89 0.5× 243 1.9× 61 0.9× 32 0.5× 19 814
Jy Bhardwaj United Kingdom 8 315 0.7× 95 0.5× 71 0.6× 181 2.6× 29 0.4× 17 431
T. Onoue Japan 11 178 0.4× 221 1.2× 152 1.2× 77 1.1× 61 0.9× 47 457
Qingzhe Wen United States 7 177 0.4× 131 0.7× 161 1.3× 110 1.6× 41 0.6× 10 417
Michael A. Capano United States 14 499 1.2× 273 1.5× 483 3.8× 94 1.3× 52 0.8× 30 853
C. Girardeaux France 12 138 0.3× 262 1.5× 286 2.3× 94 1.3× 48 0.7× 35 486
M. A. Shahid United Kingdom 11 390 0.9× 311 1.7× 231 1.8× 83 1.2× 31 0.4× 38 614
Yifei Meng United States 12 183 0.4× 76 0.4× 185 1.5× 67 1.0× 54 0.8× 27 379

Countries citing papers authored by A. Czerwiński

Since Specialization
Citations

This map shows the geographic impact of A. Czerwiński's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Czerwiński with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Czerwiński more than expected).

Fields of papers citing papers by A. Czerwiński

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. Czerwiński. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Czerwiński. The network helps show where A. Czerwiński may publish in the future.

Co-authorship network of co-authors of A. Czerwiński

This figure shows the co-authorship network connecting the top 25 collaborators of A. Czerwiński. A scholar is included among the top collaborators of A. Czerwiński based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A. Czerwiński. A. Czerwiński is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Muszalski, J., et al.. (2016). Optical examination of high contrast grating fabricated by focused-ion beam etching. Optical and Quantum Electronics. 48(4). 1 indexed citations
3.
Hnida, Katarzyna E., Johannes Gooth, Kornelius Nielsch, et al.. (2015). Tuning the polarity of charge transport in InSb nanowires via heat treatment. Nanotechnology. 26(28). 285701–285701. 13 indexed citations
4.
Czerwiński, A., et al.. (2014). Identification and reduction of acoustic-noise influence on focused ion beam (FIB). Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 348. 106–110. 1 indexed citations
5.
Borowicz, Paweł, et al.. (2012). Deep-ultraviolet Raman investigation of silicon oxide: thin film on silicon substrate versus bulk material. Advances in Natural Sciences Nanoscience and Nanotechnology. 3(4). 45003–45003. 13 indexed citations
6.
Czerwiński, A., et al.. (2011). Electron Microscopy Studies of Non-Local Effects’ Impact on Cathodoluminescence of Semiconductor Laser Structures. MATERIALS TRANSACTIONS. 52(3). 364–369. 2 indexed citations
7.
Wzorek, M., et al.. (2011). TEM Characterisation of Silicide Phase Formation in Ni-Based Ohmic Contacts to 4H n-SiC. MATERIALS TRANSACTIONS. 52(3). 315–318. 13 indexed citations
8.
Skwarek, Agata, et al.. (2011). Occurrence of tin pest on the surface of tin‐rich lead‐free alloys. Soldering and Surface Mount Technology. 23(3). 184–190. 16 indexed citations
9.
Zaraska, Krzysztof, et al.. (2011). Surface Properties of Laser-etched LTCC Ceramic. IMAPSource Proceedings. 2011(1). 735–739. 1 indexed citations
10.
Czerwiński, A., et al.. (2009). Dependence of cathodoluminescence on layer resistance applied for measurement of thin‐layer sheet resistance. Journal of Microscopy. 237(3). 304–307. 3 indexed citations
11.
Czerwiński, A., J. Ratajczak, Anna Szerling, et al.. (2009). Transmission electron microscopy characterization of Au/Pt/Ti/Pt/GaAs ohmic contacts for high power GaAs/InGaAs semiconductor lasers. Journal of Microscopy. 237(3). 347–351. 2 indexed citations
12.
13.
Czerwiński, A., et al.. (2008). Separation of image-distortion sources and magnetic-field measurement in scanning electron microscope (SEM). Micron. 40(1). 46–50. 10 indexed citations
14.
Czerwiński, A., et al.. (2007). Layer or Strip Resistance Measurement by Electron Beam Induced Current Technique in a Scanning Electron Microscope. MATERIALS TRANSACTIONS. 48(5). 949–953. 4 indexed citations
15.
Wzorek, M., A. Czerwiński, J. Ratajczak, et al.. (2007). Defect structure in self‐implanted silicon annealed under enhanced hydrostatic pressure – electron microscopy study. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics. 4(8). 3020–3024. 3 indexed citations
16.
Wzorek, M., A. Czerwiński, J. Ratajczak, A. Misiuk, & J. Kątcki. (2007). Hydrostatic pressure effect on dislocation evolution in self-implanted Si investigated by electron microscopy methods. Vacuum. 81(10). 1229–1232. 1 indexed citations
17.
Kątcki, J., et al.. (2006). TEM study of PtSi contact layers for low Schottky barrier MOSFETs. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 253(1-2). 274–277. 3 indexed citations
18.
Czerwiński, A., et al.. (2006). Elimination of scanning electron microscopy image periodic distortions with digital signal‐processing methods. Journal of Microscopy. 224(1). 89–92. 16 indexed citations
19.
Czerwiński, A., J. Kątcki, J. Ratajczak, et al.. (2002). Impact of fast-neutron irradiation on the silicon p–n junction leakage and role of the diffusion reverse current. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 186(1-4). 166–170. 2 indexed citations
20.
Czerwiński, A., et al.. (1998). Optimized Diode Analysis of Electrical Silicon Substrate Properties. Journal of The Electrochemical Society. 145(6). 2107–2112. 29 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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