Hui Jae Yoo

818 citations
18 papers · 398 indexed · h-index 9

Hui Jae Yoo

17 papers receiving 387 citations

Peers

Hui Jae Yoo
Comparison fields: 5 of 32
  • Aerospace Engineering 191
  • Electrical and Electronic Engineering 337
  • Electronic, Optical and Magnetic Materials 51
  • Surfaces, Coatings and Films 14
  • Hardware and Architecture 10
Replace G. Carchon with:
G. Carchon Belgium
Reydezel Torres‐Torres Mexico
Maximilian C. Scardelletti United States
A.B. Bhattacharyya India
Vijay Nair United States
A.C.W. Lu Singapore
David M. Klymyshyn Canada
Roberto Suaya United States
M. Rammal France
Franklin L. Duan China
Hui Jae Yoo relative to G. Carchon Belgium G. Carchon's profile →
Citations per field
00.5×1.5×2.3×
G. Carchon · 1×
Citations per year

Countries citing papers authored by Hui Jae Yoo

Since Specialization
Citations

This map shows the geographic impact of Hui Jae Yoo's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Hui Jae Yoo with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Hui Jae Yoo more than expected).

Fields of papers citing papers by Hui Jae Yoo

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Hui Jae Yoo. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Hui Jae Yoo. The network helps show where Hui Jae Yoo may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Hui Jae Yoo, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Hui Jae Yoo Line = papers co-authored together Hui Jae Yoo links everyone, so they are left out of the graph.

All Works

18 of 18 papers shown
#Work
1 20202
2 202047
3 20183
4 201612
5 201621
6 20156
7 201512
8 20153
9 20151
10 20140
11 201414
12 201312
13 201214
14 201013
15
Coarse mesh rebalance acceleration revisited: Krylov preconditioning
20071
16 2004234
17 20022
18 20011

About Hui Jae Yoo

Hui Jae Yoo is a scholar working on Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics and Electrical and Electronic Engineering, having authored 18 papers that have together received 398 indexed citations. Recurring topics across this work include Semiconductor materials and devices (9 papers), Copper Interconnects and Reliability (7 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), Electronic Packaging and Soldering Technologies (3 papers), Metal and Thin Film Mechanics (3 papers), Force Microscopy Techniques and Applications (2 papers), Advanced Surface Polishing Techniques (2 papers) and Semiconductor materials and interfaces (2 papers). The work is most often cited by research in Aerospace Engineering (191 citations), Electrical and Electronic Engineering (337 citations) and Electronic, Optical and Magnetic Materials (51 citations). Hui Jae Yoo has collaborated with scholars based in United States, Taiwan and South Korea. Frequent co-authors include Jiangyuan Qian, Hamid Jafarkhani, Alfred Grau, Franco De Flaviis, Bedri A. Cetiner, Sean W. King, Kanwal Jit Singh, B. Krist, Gheorghe Stan and Alan Myers. Their work appears in journals such as Nano Letters, Journal of Applied Physics and IEEE Communications Magazine.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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