Jeremy Theil
- Electrical and Electronic Engineering top 5%
- Materials Chemistry top 10%
- Electronic, Optical and Magnetic Materials top 10%
- Polymers and Plastics top 10%
- Biomedical Engineering
- Co-authors
- Eiji KusanoD. V. TsuG. LucovskyLaura MirkarimiGuilian GaoG. G. FountainBongsub LeeJohn G. Brace
- Topics
- Thin-Film Transistor Technologies (20 papers)Silicon Nanostructures and Photoluminescence (16 papers)3D IC and TSV technologies (13 papers)
- Cited by
- Electrical and Electronic EngineeringElectronic, Optical and Magnetic MaterialsPolymers and Plastics
- Partner nations
- United StatesJapanGermany
In The Last Decade
Jeremy Theil
46 papers receiving 867 citations
Peers
Comparison fields: 5 of 56
- Electrical and Electronic Engineering 778
- Materials Chemistry 384
- Electronic, Optical and Magnetic Materials 198
- Polymers and Plastics 134
- Biomedical Engineering 125
Countries citing papers authored by Jeremy Theil
This map shows the geographic impact of Jeremy Theil's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jeremy Theil with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jeremy Theil more than expected).
Fields of papers citing papers by Jeremy Theil
This network shows the impact of papers produced by Jeremy Theil. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jeremy Theil. The network helps show where Jeremy Theil may publish in the future.
Co-authorship network of co-authors of Jeremy Theil
This figure shows the co-authorship network connecting the top 25 collaborators of Jeremy Theil. A scholar is included among the top collaborators of Jeremy Theil based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jeremy Theil. Jeremy Theil is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 27 | |
| 2 | 13 | |
| 3 | 33 | |
| 4 | 13 | |
| 5 | 23 | |
| 6 | 30 | |
| 7 | 27 | |
| 8 | 1 | |
| 9 | 13 | |
| 10 | 1 | |
| 11 | 22 | |
| 12 | 2 | |
| 13 | 4 | |
| 14 | 10 | |
| 15 | 64 | |
| 16 | 4 | |
| 17 | 5 | |
| 18 | 13 | |
| 19 | 10 | |
| 20 | 52 |
About Jeremy Theil
Jeremy Theil is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Automotive Engineering, having authored 48 papers that have together received 944 indexed citations. Recurring topics across this work include Thin-Film Transistor Technologies (20 papers), Silicon Nanostructures and Photoluminescence (16 papers) and 3D IC and TSV technologies (13 papers). The work is most often cited by research in Electrical and Electronic Engineering (778 citations), Electronic, Optical and Magnetic Materials (198 citations) and Polymers and Plastics (134 citations). Jeremy Theil has collaborated with scholars based in United States, Japan and Germany. Frequent co-authors include Eiji Kusano, D. V. Tsu, G. Lucovsky, Laura Mirkarimi, Guilian Gao, G. G. Fountain, Bongsub Lee, John G. Brace, G. Lucovsky and Cyprian Uzoh. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Thin Solid Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.