B. Miner

571 citations

19 papers · 464 indexed · h-index 11

Co-authors: Peter R. Buseck J. L. Freeouf Raj Solanki Max T. Otten J. J. Clement Gordon J. Kennedy G. C. GOBBI R. Christoffersen
Topics: Copper Interconnects and Reliability (10 papers)Semiconductor materials and devices (7 papers)Electronic Packaging and Soldering Technologies (6 papers)
Cited by: Electronic, Optical and Magnetic Materials Structural Biology Surfaces, Coatings and Films
Journals: Nano Letters Applied Physics Letters IEEE Transactions on Electron Devices
Partner nations: United States Germany Canada

In The Last Decade

B. Miner

19 papers receiving 447 citations

Peers

Countries citing papers authored by B. Miner

Since Specialization

Citations

This map shows the geographic impact of B. Miner's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B. Miner with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B. Miner more than expected).

Fields of papers citing papers by B. Miner

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by B. Miner. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B. Miner. The network helps show where B. Miner may publish in the future.

Co-authorship network of co-authors of B. Miner

This figure shows the co-authorship network connecting the top 25 collaborators of B. Miner. A scholar is included among the top collaborators of B. Miner based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with B. Miner. B. Miner is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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19 of 19 papers shown

#	Work	Indexed citations
1	Nanoscale Buckling of Ultrathin Low-k Dielectric Lines during Hard-Mask Patterning 2015 ·Nano Letters ·Gheorghe Stan,Cristian V. Ciobanu,Igor Levin,Hui Jae Yoo,Alan Myers,Kanwal Jit Singh,Christopher Jezewski,B. Miner,Sean W. King	12
2	Electrical and reliability characterization of CuMn self forming barrier interconnects on low-k CDO dielectrics 2011 ·Microelectronic Engineering ·Tejaswi Indukuri,Rohan Akolkar,(unknown),Arda Genç,Florian Gstrein,(unknown),B. Miner,(unknown),(unknown),S. Balakrishnan	12
3	Adhesion studies in integrated circuit interconnect structures 2006 ·Engineering Failure Analysis ·J.M. Molina-Aldareguía,(unknown),David González,M.R. Elizalde,J.M. Sánchez,J.M. Martínez–Esnaola,J. Gil Sevillano,T. Scherban,Daniel Pantuso,Benyuan Sun,Guofeng Xu,B. Miner,Jie He,J. Maiz	11
4	Impact of interfacial chemistry on adhesion and electromigration in Cu interconnects 2004 ·Ying Zhou,T. Scherban,(unknown),Jun He,B. Miner,(unknown),A. W. Ott,(unknown),D. Ingerly,Jihperng Leu	2
5	Nanoindentation and Tensile Behavior of Copper Films 2003 ·MRS Proceedings ·David T. Read,Roy H. Geiss,(unknown),T. Scherban,Guofeng Xu,(unknown),B. Miner,R.D. Emery	7
6	Atomic layer deposition of ZnSe/CdSe superlattice nanowires 2002 ·Applied Physics Letters ·Raj Solanki,(unknown),J. L. Freeouf,B. Miner	113
7	Engineering gap fill, microstructure and film composition of electroplated copper for on-chip metallization 2001 ·Valery M. Dubin,(unknown),(unknown),(unknown),V. Chikarmane,(unknown),(unknown),Kimin Hong,Sean Hearne,Chunyi Zhi,(unknown),B. Miner,Markus Kühn,A. Budrevich,(unknown),S. Shankar	9
8	Parasitic bipolar gain reduction and the optimization of 0.25-μm partially depleted SOI MOSFETs 1999 ·IEEE Transactions on Electron Devices ·K. Mistry,J.W. Sleight,(unknown),(unknown),B. Miner,(unknown),D.A. Antoniadis	18
9	Novel Preparation of Precision Planar TEM Specimens for Integrated Circuits Using Dual-Beam Focused Ion Beam 1999 ·Microscopy and Microanalysis ·(unknown),(unknown),(unknown),(unknown),(unknown),B. Miner	2
10	Influence of Voed Geometry on Electromigration Failure in Via-Line Structures 1997 ·MRS Proceedings ·B. Miner,T. S. Sriram,(unknown),(unknown)	7
11	Effect of Al alloy and stacked film composition on linewidth dependence of electromigration lifetime 1995 ·(unknown),Jin Ling,(unknown),(unknown),B. Miner,(unknown),(unknown),(unknown)	2
12	Microstructural Evolution of Aluminum Interconnects During Post-Pattern Anneals: Correlation to Improved Em Lifetime 1994 ·MRS Proceedings ·B. Miner,(unknown),(unknown),(unknown)	2
13	Two electromigration failure modes in polycrystalline aluminum interconnects 1994 ·(unknown),J. J. Clement,B. Miner	14
14	Characterization of Two Electromigration Failure Modes In Submicron Vlsi 1993 ·MRS Proceedings ·(unknown),J. J. Clement,B. Miner	18
15	Effect of Laminates and Alloy Additions on Electromigration in AI Interconnects 1993 ·MRS Proceedings ·(unknown),(unknown),B. Miner	2
16	Structural order and disorder in Precambrian kerogens 1988 ·Organic Geochemistry ·Peter R. Buseck,(unknown),B. Miner	27
17	Determination of manganese oxidation states in solids by electron energy-loss spectroscopy 1987 ·Ultramicroscopy ·(unknown),B. Miner,Peter R. Buseck	112
18	The determination of Ti, Mn and Fe oxidation states in minerals by electron energy-loss spectroscopy 1985 ·Ultramicroscopy ·Max T. Otten,B. Miner,(unknown),Peter R. Buseck	61
19	DIRECT DETERMINATION OF CATION DISORDER IN MgAl2O4 SPINEL BY HIGH-RESOLUTION 27Al MAGIC-ANGLE-SPINNING NMR SPECTROSCOPY 1985 ·Chemistry Letters ·G. C. GOBBI,R. Christoffersen,Max T. Otten,B. Miner,(unknown),Gordon J. Kennedy,Colin A. Fyfe	33

About B. Miner

B. Miner is a scholar working on Structural Biology, Electronic, Optical and Magnetic Materials and Surfaces, Coatings and Films, having authored 19 papers that have together received 464 indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (10 papers), Semiconductor materials and devices (7 papers) and Electronic Packaging and Soldering Technologies (6 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (136 citations), Structural Biology (10 citations) and Surfaces, Coatings and Films (49 citations). B. Miner has collaborated with scholars based in United States, Germany and Canada. Frequent co-authors include Peter R. Buseck, J. L. Freeouf, Raj Solanki, Max T. Otten, J. J. Clement, Gordon J. Kennedy, G. C. GOBBI, R. Christoffersen, Colin A. Fyfe and J.W. Sleight. Their work appears in journals such as Nano Letters, Applied Physics Letters and IEEE Transactions on Electron Devices.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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