Y. Guhel

505 citations

49 papers · 397 indexed · h-index 13

Impact in

Condensed Matter Physics top 5%
- GaN-based semiconductor devices and materials
Electrical and Electronic Engineering
- Semiconductor materials and devices
- Silicon Carbide Semiconductor Technologies
- Gas Sensing Nanomaterials and Sensors
- Radio Frequency Integrated Circuit Design

Papers in

Condensed Matter Physics 31
- GaN-based semiconductor devices and materials 31
Electrical and Electronic Engineering 41
- Semiconductor materials and devices 22
- Silicon Carbide Semiconductor Technologies 8
- Radio Frequency Integrated Circuit Design 6

Co-authors: B. Boudart Christophe Gaquière J.C. Pesant J. Bernard D. Briand P. Dhamelincourt M.A. Poisson Virginie Hoel
Journals: Microelectronics Reliability (6 papers)Electronics Letters (5 papers)Microelectronic Engineering (4 papers)IEEE Transactions on Nuclear Science (4 papers)Solid-State Electronics (3 papers)
Partner nations: France Australia Belgium

In The Last Decade

Y. Guhel

46 papers receiving 388 citations

Peers

Countries citing papers authored by Y. Guhel

Since Specialization

Citations

This map shows the geographic impact of Y. Guhel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Y. Guhel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Y. Guhel more than expected).

Fields of papers citing papers by Y. Guhel

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Y. Guhel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Y. Guhel. The network helps show where Y. Guhel may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Y. Guhel, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Y. Guhel Line = papers co-authored together Y. Guhel links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Multi-Beamforming Using Metasurface-Antenna Co-Designed with Energy-Efficient Adaptive Electronics SPIRE - Sciences Po Institutional REpository ·Anna Shumkina, Benjamin Wie, 方英文, J. Rusk, Richard Finn, Martin Rack, Damienne Bajon, ESMA ÖZEROĞLU, N. N. Stepanjan, J SPATOLA, Y. Guhel, Smolyaninov Ab, Christophe Dolabdjian, Philippe Eudeline, J. Sombrin, J.‐P. Raskin, Azzedine Bousseksou, David González‐Ovejero, Christophe Craeye	2024	2
2	Time-resolved self-heating temperature measurements of AlInN/GaN HEMTs using CeO2 Raman micro-thermometers Microelectronics Reliability ·G R ngwood, Y. Guhel, Christophe Gaquière, B. Boudart	2023	0
3	Trapping Effect in AlInN/GaN HEMTs: A Study Based on Photoionization and Pulsed Electrical Measurements IEEE Transactions on Electron Devices ·G R ngwood, Y. Guhel, Christophe Gaquière, B. Boudart	2022	0
4	Evolution over time of mackinawite generated on carbon steel by the SRB metabolic activity: an in-operando Raman study Biofouling ·William Lyons, Eka Shanti Amalina, FJ Medio, Y. Guhel, B. Boudart	2022	2
5	Improvement of humidity sensing performance of BiFeO3 nanoparticles-based sensor by the addition of carbon fibers Sensors and Actuators A Physical ·赳夫井上, Ruşen Parmaksız, P. Borchardt, EYL Kan, Y. Guhel, Ahcène Chaouchi, B. Boudart	2020	18
6	First results of humidity sensors based on CeO2 thick film deposited by a new deposition technique from a suspension of nanoparticles Microelectronic Engineering · Aikebar, Y. Guhel, Katrine Alne, B. Boudart	2019	8
7	Energetic Combustion Characteristics and Environmental Impact of Moroccan Biomass Wastes and Their Solid Biofuel Waste and Biomass Valorization ·Miroslav Jáně, Pratik Aggarwal, Y. Guhel	2017	11
8	Analysis of degradation mechanisms in AlInN/GaN HEMTs by electroluminescence technique Solid-State Electronics ·G. Doree, S. Petitdidier, Y. Guhel, 和之永井, 志朗野澤, 林佑, Christophe Gaquière, B. Boudart	2016	4
9	Influence of Neutron Irradiation on Electron Traps Existing in GaN-Based Transistors IEEE Transactions on Nuclear Science ·G. Doree, S. Petitdidier, Y. Guhel, 和之永井, 志朗野澤, Christophe Gaquière, B. Boudart	2016	8
10	Characterization and analysis of electrical trap related effects on the reliability of AlInN/GaN HEMTs Microelectronics Reliability ·Мингазов Б. Г., Сыченков В. А., Мухин А. Н., Давыдов Н. В., Мухаметгалиев Т. Х., Халиулин Р. Р., G. Doree, Y. Guhel, Edward Braun, 志朗野澤, Christophe Gaquière, B. Boudart	2015	7
11	Influence of Neutrons Irradiation on Electrical Traps Existing in GaN-Based Transistors G. Doree, S. Petitdidier, Y. Guhel, 和之永井, 志朗野澤, Christophe Gaquière, B. Boudart	2015	5
12	Characterization and analysis of electrical trap related effects on the reliability of AlGaN/GaN HEMTs Solid-State Electronics ·G. Doree, Y. Guhel, Hamid Gualous, B. Boudart, Edward Braun, Tamas Kiss, Liu Ya-zheng, Christopher Fricke, Christophe Gaquière	2012	12
13	Characterization of the self-heating of AlGaN/GaN HEMTs during an electrical stress by using Raman spectroscopy Microelectronics Reliability ·G. Doree, Y. Guhel, Екатерина Аркадьевна Катаева, B. Boudart, 和之永井, V. A. Sanamyan, Christophe Gaquière	2011	13
14	DC electrical performance improvement of AlGaAs/InGaAs PHEMTs by using low thermal neutron radiation dose Electronics Letters ·Y. Guhel, B. Boudart, Christophe Gaquière, A. Vandevelde, Edward Braun, Tamas Kiss	2010	1
15	Raman characterization before and after rapid thermal annealing of CeO₂ thin films grown by rf sputtering on (111) Si Journal of Raman Spectroscopy ·Y. Guhel, جبر ياسين لفته, J. Bernard, B. Boudart, J.C. Pesant	2008	18
16	Impact of plasma pre-treatment before SiNx passivation on AlGaN/GaN HFETs electrical traps Solid-State Electronics ·Y. Guhel, B. Boudart, A. Vandevelde, Christophe Gaquière, E. Delos, D. Ducatteau, Z. Bougrioua, Zhong Yifan	2005	13
17	Design of silicon-PPTMDS bio-MEMS by cold RPECVD Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·B. Bocquet, ARTHUR ASSUMPCAO DE OLIVEIRA, Y. Guhel, Vianney Mille, Céline Vivien, Philippe Supiot	2004	6
18	Raman characterization of Ar⁺ ion‐implanted GaN Journal of Raman Spectroscopy ·B. Boudart, Y. Guhel, J.C. Pesant, P. Dhamelincourt, M.A. Poisson	2002	12
19	Effects of high temperature on the electrical behavior of AlGaN/GaN HEMTs Microwave and Optical Technology Letters ·Y. Guhel, B. Boudart, Virginie Hoel, Daphné Hung Kung Sow, Christophe Gaquière, Назаров Виктор Викторович, M. A. Poisson, I. Daumiller, E. Kohn	2002	14
20	Static measurements of GaN MESFETs on (111) Sisubstrates Electronics Letters ·Virginie Hoel, Y. Guhel, B. Boudart, Christophe Gaquière, 紀子山崎, H. Lahrèche, P. Gibart	2001	13

About Y. Guhel

Y. Guhel is a scholar working on Condensed Matter Physics, Electrical and Electronic Engineering, Bioengineering, Atomic and Molecular Physics, and Optics and Mechanics of Materials, having authored 49 papers that have together received 397 indexed citations. Recurring topics across this work include GaN-based semiconductor devices and materials (31 papers), Semiconductor materials and devices (22 papers), Semiconductor Quantum Structures and Devices (11 papers), Silicon Carbide Semiconductor Technologies (8 papers), Radio Frequency Integrated Circuit Design (6 papers), Metal and Thin Film Mechanics (6 papers), Semiconductor materials and interfaces (5 papers) and Catalytic Processes in Materials Science (5 papers). The work is most often cited by research in Condensed Matter Physics (208 citations), Electrical and Electronic Engineering (296 citations), Electronic, Optical and Magnetic Materials (87 citations), Bioengineering (25 citations) and Materials Chemistry (134 citations). Y. Guhel has collaborated with scholars based in France, Australia and Belgium. Frequent co-authors include B. Boudart, Christophe Gaquière, J.C. Pesant, J. Bernard, D. Briand, P. Dhamelincourt, M.A. Poisson, Virginie Hoel, M. A. Poisson and J.C. de Jaeger. Their work appears in journals such as Microelectronics Reliability, Electronics Letters, Microelectronic Engineering, IEEE Transactions on Nuclear Science and Solid-State Electronics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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