V. Raineri

7.3k total citations
319 papers, 6.1k citations indexed

About

V. Raineri is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, V. Raineri has authored 319 papers receiving a total of 6.1k indexed citations (citations by other indexed papers that have themselves been cited), including 266 papers in Electrical and Electronic Engineering, 155 papers in Atomic and Molecular Physics, and Optics and 96 papers in Materials Chemistry. Recurrent topics in V. Raineri's work include Semiconductor materials and interfaces (132 papers), Semiconductor materials and devices (112 papers) and Silicon and Solar Cell Technologies (102 papers). V. Raineri is often cited by papers focused on Semiconductor materials and interfaces (132 papers), Semiconductor materials and devices (112 papers) and Silicon and Solar Cell Technologies (102 papers). V. Raineri collaborates with scholars based in Italy, Switzerland and France. V. Raineri's co-authors include Fabrizio Roccaforte, Filippo Giannazzo, E. Rimini, Francesco La Via, Sushant Sonde, Raffaella Lo Nigro, S. U. Campisano, L. Calcagno, Corrado Bongiorno and Patrick Fiorenza and has published in prestigious journals such as Advanced Materials, Angewandte Chemie International Edition and Nano Letters.

In The Last Decade

V. Raineri

314 papers receiving 5.9k citations

Peers

Countries citing papers authored by V. Raineri

Since Specialization

Citations

This map shows the geographic impact of V. Raineri's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V. Raineri with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V. Raineri more than expected).

Fields of papers citing papers by V. Raineri

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by V. Raineri. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V. Raineri. The network helps show where V. Raineri may publish in the future.

Co-authorship network of co-authors of V. Raineri

This figure shows the co-authorship network connecting the top 25 collaborators of V. Raineri. A scholar is included among the top collaborators of V. Raineri based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with V. Raineri. V. Raineri is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Nanoscale electro-structural characterisation of ohmic contacts formed on p-type implanted 4H-SiC 2011 ·Nanoscale Research Letters ·Alessia Frazzetto, Filippo Giannazzo, Raffaella Lo Nigro, Salvatore Di Franco, Corrado Bongiorno, Mario Saggio, (unknown), V. Raineri, Fabrizio Roccaforte	11
2	Nanoscale structural characterization of epitaxial graphene grown on off-axis 4H-SiC (0001) 2011 ·Nanoscale Research Letters ·Carmelo Lo Vecchio, Sushant Sonde, Corrado Bongiorno, (unknown), Rositza Yakimova, V. Raineri, Filippo Giannazzo	48
3	Nanoscale characterization of electrical transport at metal/3C-SiC interfaces 2011 ·Nanoscale Research Letters ·Jens Eriksson, Fabrizio Roccaforte, Sergey A. Reshanov, Stefano Leone, Filippo Giannazzo, (unknown), Patrick Fiorenza, V. Raineri	6
4	Scanning Probe Microscopy on heterogeneous CaCu3Ti4O12 thin films 2011 ·Nanoscale Research Letters ·Patrick Fiorenza, Raffaella Lo Nigro, V. Raineri	7
5	Temperature and Light Induced Effects on the Capacitance of 4H-SiC Schottky Photodiodes 2011 ·IEEE Sensors Journal ·M. Mazzillo, Antonella Sciuto, (unknown), Fabrizio Roccaforte, V. Raineri	19
6	Kinetic mechanisms of thein situelectron beam-induced self-organization of gold nanoclusters in SiO₂ 2009 ·Journal of Physics D Applied Physics ·F. Ruffino, M. G. Grimaldi, Filippo Giannazzo, Fabrizio Roccaforte, V. Raineri, Corrado Bongiorno, C. Spinella	13
7	Atomic Force Microscopy Study of the Kinetic Roughening in Nanostructured Gold Films on SiO2 2009 ·Nanoscale Research Letters ·F. Ruffino, M. G. Grimaldi, Filippo Giannazzo, Fabrizio Roccaforte, V. Raineri	41
8	Demonstration of Defect-Induced Limitations on the Properties of Au/3C-SiC Schottky Barrier Diodes 2009 ·Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena ·Jens Eriksson, (unknown), Fabrizio Roccaforte, Filippo Giannazzo, Stefano Leone, V. Raineri	4
9	Screening Length and Quantum Capacitance in Graphene by Scanning Probe Microscopy 2008 ·Nano Letters ·Filippo Giannazzo, Sushant Sonde, V. Raineri, E. Rimini	88
10	He implantation to control B diffusion in crystalline and preamorphized Si 2008 ·Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·E. Bruno, S. Mirabella, F. Priolo, (unknown), Filip Tuomisto, J. Slotte, Filippo Giannazzo, Corrado Bongiorno, V. Raineri, E. Napolitani	4
11	Effect of surrounding environment on atomic structure and equilibrium shape of growing nanocrystals: gold in/on SiO2 2007 ·Nanoscale Research Letters ·F. Ruffino, Corrado Bongiorno, Filippo Giannazzo, Fabrizio Roccaforte, V. Raineri, M. G. Grimaldi	15
12	Quantitative determination of depth carrier profiles in ion-implanted Gallium Nitride 2007 ·Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·F. Iucolano, Filippo Giannazzo, Fabrizio Roccaforte, Lucia Romano, M. G. Grimaldi, V. Raineri	15
13	Self-organization of Au nanoclusters on the SiO2 surface induced by 200 keV-Ar+ irradiation 2007 ·Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·F. Ruffino, (unknown), M.G. Grimaldi, Corrado Bongiorno, Filippo Giannazzo, Fabrizio Roccaforte, C. Spinella, V. Raineri	31
14	Drift mobility in quantum nanostructures by scanning probe microscopy 2006 ·Applied Physics Letters ·Filippo Giannazzo, V. Raineri, S. Mirabella, G. Impellizzeri, F. Priolo	20
15	Interaction between dislocations and He-implantation-induced voids in GaN epitaxial layers 2005 ·Applied Physics Letters ·Daniel Alquier, Corrado Bongiorno, Fabrizio Roccaforte, V. Raineri	18
16	Two-dimensional effects on ultralow energy B implants in Si 2002 ·Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·Filippo Giannazzo, F. Priolo, V. Raineri, V. Privitera, Antonio Picariello, A. Battaglia, Steven Moffat	10
17	Cu Determination in Silicon Wafers: A Comparison between Electrical and Chemical Measurements 1999 ·Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena ·V. Raineri, (unknown), (unknown), (unknown), (unknown)	2
18	Characterization of C coimplanted GexSi1−x epitaxial layers formed by high dose Ge ion implantation in (100) Si 1996 ·Journal of Applied Physics ·S. Lombardo, K. Kyllesbech Larsen, V. Raineri, Francesco La Via, S. U. Campisano, S. Lagomarsino, A. Kazimirov	5
19	Lifetime control in silicon devices by voids induced by He ion implantation 1996 ·Journal of Applied Physics ·V. Raineri, G. Fallica, Sebania Libertino	56
20	Boron implants in <100> silicon at tilt angles of O degrees and 7 degrees 1990 ·Semiconductor Science and Technology ·V. Raineri, G. Galvagno, E. Rimini, (unknown), A. La Ferla, A. Carnera, (unknown)	9

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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