Ph. Niedermann

1.5k total citations
56 papers, 1.2k citations indexed

About

Ph. Niedermann is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Biomedical Engineering. According to data from OpenAlex, Ph. Niedermann has authored 56 papers receiving a total of 1.2k indexed citations (citations by other indexed papers that have themselves been cited), including 37 papers in Atomic and Molecular Physics, and Optics, 22 papers in Electrical and Electronic Engineering and 16 papers in Biomedical Engineering. Recurrent topics in Ph. Niedermann's work include Force Microscopy Techniques and Applications (22 papers), Physics of Superconductivity and Magnetism (15 papers) and Magnetic properties of thin films (8 papers). Ph. Niedermann is often cited by papers focused on Force Microscopy Techniques and Applications (22 papers), Physics of Superconductivity and Magnetism (15 papers) and Magnetic properties of thin films (8 papers). Ph. Niedermann collaborates with scholars based in Switzerland, Belgium and Germany. Ph. Niedermann's co-authors include Ch. Renner, Ø. Fischer, Ø. Fischer, W. Hänni, Wilfried Vandervorst, P. Descouts, F. Lévy, Andrew D. Kent, N. Sankarraman and Thomas Hantschel and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Applied Physics Letters.

In The Last Decade

Ph. Niedermann

55 papers receiving 1.1k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Ph. Niedermann Switzerland 17 747 498 320 306 253 56 1.2k
A. Kühle Denmark 15 488 0.7× 261 0.5× 453 1.4× 125 0.4× 331 1.3× 37 1.0k
A. А. Lebedev Russia 19 534 0.7× 1.5k 3.1× 222 0.7× 598 2.0× 115 0.5× 238 1.9k
P. Kirby United Kingdom 16 342 0.5× 689 1.4× 475 1.5× 467 1.5× 69 0.3× 85 1.1k
P. R. Emtage United States 18 586 0.8× 947 1.9× 253 0.8× 516 1.7× 71 0.3× 52 1.4k
Hartmut Gundel France 18 344 0.5× 738 1.5× 551 1.7× 702 2.3× 39 0.2× 100 1.3k
F.S. Hickernell United States 19 354 0.5× 647 1.3× 870 2.7× 669 2.2× 194 0.8× 104 1.4k
D. Ebling Germany 22 508 0.7× 718 1.4× 199 0.6× 659 2.2× 181 0.7× 57 1.4k
J. E. Stern United States 7 1.5k 2.0× 572 1.1× 680 2.1× 257 0.8× 58 0.2× 9 1.7k
D.M. Brown United States 23 802 1.1× 1.7k 3.4× 138 0.4× 482 1.6× 105 0.4× 76 2.0k
Р. В. Конакова Ukraine 14 389 0.5× 554 1.1× 95 0.3× 244 0.8× 223 0.9× 143 823

Countries citing papers authored by Ph. Niedermann

Since Specialization
Citations

This map shows the geographic impact of Ph. Niedermann's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ph. Niedermann with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ph. Niedermann more than expected).

Fields of papers citing papers by Ph. Niedermann

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ph. Niedermann. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ph. Niedermann. The network helps show where Ph. Niedermann may publish in the future.

Co-authorship network of co-authors of Ph. Niedermann

This figure shows the co-authorship network connecting the top 25 collaborators of Ph. Niedermann. A scholar is included among the top collaborators of Ph. Niedermann based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Ph. Niedermann. Ph. Niedermann is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Niedermann, Ph., et al.. (2003). A novel thick photoresist for microsystem technology. Microelectronic Engineering. 67-68. 259–265. 10 indexed citations
2.
Perret, André, Arno Hoogerwerf, Ph. Niedermann, et al.. (2002). Silicon as material for mechanical wrist-watches. Infoscience (Ecole Polytechnique Fédérale de Lausanne). 1 indexed citations
3.
Gautsch, Sébastian, U. Staufer, H.‐R. Hidber, et al.. (2001). Miniaturized atomic force microscope for planetary exploration. ESASP. 480. 11–16. 3 indexed citations
4.
Akiyama, Takeo, Sébastian Gautsch, Ν. F. de Rooij, et al.. (2001). Atomic force microscope for planetary applications. Sensors and Actuators A Physical. 91(3). 321–325. 17 indexed citations
5.
Hantschel, Thomas, Stefan Slesazeck, Ph. Niedermann, Pierre Eyben, & W. Vandervorst. (2001). Integrating diamond pyramids into metal cantilevers and using them as electrical AFM probes. Microelectronic Engineering. 57-58. 749–754. 14 indexed citations
6.
Pike, W. T., M. H. Hecht, M. S. Anderson, et al.. (2000). Atomic Force Microscope for Imaging and Spectroscopy. 3 indexed citations
7.
Hantschel, Thomas, Ph. Niedermann, Thomas Trenkler, & Wilfried Vandervorst. (2000). Highly conductive diamond probes for scanning spreading resistance microscopy. Applied Physics Letters. 76(12). 1603–1605. 79 indexed citations
8.
Känel, H. von, et al.. (2000). Diamond tips in low temperature scanning tunneling microscopy. Surface Science. 470(1-2). 164–170. 3 indexed citations
9.
Niedermann, Ph., et al.. (1998). CVD diamond probes for nanotechnology. Applied Physics A. 66(7). S31–S34. 57 indexed citations
10.
Beuret, C., Ph. Niedermann, U. Staufer, & N. F. de Rooij. (1998). Fabrication of metallic probes by a new technology based on double molding. Microelectronic Engineering. 41-42. 543–546. 5 indexed citations
11.
Wolf, Peter, Trudo Clarysse, Wilfried Vandervorst, et al.. (1998). Cross-sectional nano-spreading resistance profiling. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 16(1). 355–361. 62 indexed citations
12.
Renner, Ch., Andrew D. Kent, Ph. Niedermann, Ø. Fischer, & F. Lévy. (1992). Scanning tunneling spectroscopy of the Abrikosov flux lattice from the clean toward the dirty limit. Ultramicroscopy. 42-44. 699–704. 3 indexed citations
13.
Kent, A. D., I. Maggio‐Aprile, Ph. Niedermann, & Ø. Fischer. (1989). Direct measurements of the effects of inhomogeneities on the normal-state transport properties ofYBa2Cu3O7−xthin films. Physical review. B, Condensed matter. 39(16). 12363–12366. 6 indexed citations
14.
Niedermann, Ph., Hans J. Scheel, & W. Sadowski. (1989). Scanning tunneling microscope investigation of (100) and (001) faces of YBa2Cu3O7−δ. Journal of Applied Physics. 65(8). 3274–3276. 2 indexed citations
15.
Renner, Ch., Ph. Niedermann, & Ø. Fischer. (1989). Enhanced field emission investigation of aluminum. IEEE Transactions on Electrical Insulation. 24(6). 911–916. 10 indexed citations
16.
Descouts, P., et al.. (1988). A small scanning tunnelling microscope with large scan range for biological studies. Journal of Microscopy. 152(1). 85–92. 7 indexed citations
17.
Niedermann, Ph. & Ø. Fischer. (1988). Imaging of granular high‐Tc thin films using a scanning tunnelling microscope with large scan range. Journal of Microscopy. 152(1). 93–101. 34 indexed citations
18.
Grepstad, J. K., Ph. Niedermann, Jean‐Marc Triscone, et al.. (1988). Segregation, interface reactions and surface topography of YBa2Cu3O7−δ thin films, investigated by Auger depth profiling, microprobe analysis, STM and SEM. Physica C Superconductivity. 153-155. 1453–1454. 1 indexed citations
19.
Niedermann, Ph., et al.. (1988). Summary Abstract: A scanning tunneling microscope combined with a scanning field emission microscope. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 6(2). 379–379. 15 indexed citations
20.
Noer, R., Ph. Niedermann, N. Sankarraman, & Ø. Fischer. (1986). Electron field emission from intentionally introduced particles on extended niobium surfaces. Journal of Applied Physics. 59(11). 3851–3860. 25 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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