Ted Lundquist
Impact in
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
- Physical Unclonable Functions (PUFs) and Hardware Security
Papers in
-
- Integrated Circuits and Semiconductor Failure Analysis 54
- Semiconductor materials and devices 8
-
- Electron and X-Ray Spectroscopy Techniques 12
- Co-authors
- Christian Boit (15 shared papers)U. Kerst (15 shared papers)Steven Kasapi (5 shared papers)Carl Farrell (8 shared papers)Praveen Vedagarbha (9 shared papers)Derryck T. Reid (9 shared papers)Peter R. Swann (2 shared papers)Ignatius S. T. Tsong (1 shared paper)
- Journals
- Microelectronics Reliability (10 papers)Optics Letters (2 papers)Microscopy and Microanalysis (1 paper)Applied Physics A (1 paper)Journal of Microscopy (1 paper)
- Partner nations
- United StatesUnited KingdomGermany
In The Last Decade
Ted Lundquist
56 papers receiving 260 citations
Peers
Comparison fields: 5 of 45
- Hardware and Architecture 103
- Structural Biology 8
- Electrical and Electronic Engineering 257
- Surfaces, Coatings and Films 23
- Computational Mechanics 59
Countries citing papers authored by Ted Lundquist
This map shows the geographic impact of Ted Lundquist's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ted Lundquist with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ted Lundquist more than expected).
Fields of papers citing papers by Ted Lundquist
This network shows the impact of papers produced by Ted Lundquist. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ted Lundquist. The network helps show where Ted Lundquist may publish in the future.
Co-authors
The 25 scholars most cited alongside Ted Lundquist, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 64 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2010 | 41 | |
| 2 | 2004 | 21 | |
| 3 | 2008 | 16 | |
| 4 | 2015 | 16 | |
| 5 | 2010 | 15 | |
| 6 | 2012 | 15 | |
| 7 | 1981 | 14 | |
| 8 | 2002 | 9 | |
| 9 | 2008 | 9 | |
| 10 | 2003 | 8 | |
| 11 | 2009 | 8 | |
| 12 | 2011 | 8 | |
| 13 | 2012 | 7 | |
| 14 | 2009 | 6 | |
| 15 | 2004 | 5 | |
| 16 | 2007 | 5 | |
| 17 | 2007 | 5 | |
| 18 | 2008 | 5 | |
| 19 | 2010 | 5 | |
| 20 | 2012 | 5 |
About Ted Lundquist
Ted Lundquist is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Computational Mechanics, Biomedical Engineering and Atomic and Molecular Physics, and Optics, having authored 64 papers that have together received 311 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (54 papers), Near-Field Optical Microscopy (21 papers), Ion-surface interactions and analysis (16 papers), Force Microscopy Techniques and Applications (15 papers), Electron and X-Ray Spectroscopy Techniques (12 papers), Semiconductor materials and devices (8 papers), VLSI and Analog Circuit Testing (7 papers) and Advanced Surface Polishing Techniques (6 papers). The work is most often cited by research in Hardware and Architecture (103 citations), Structural Biology (8 citations), Electrical and Electronic Engineering (257 citations), Surfaces, Coatings and Films (23 citations) and Computational Mechanics (59 citations). Ted Lundquist has collaborated with scholars based in United States, United Kingdom and Germany. Frequent co-authors include Christian Boit, U. Kerst, Steven Kasapi, Carl Farrell, Praveen Vedagarbha, Derryck T. Reid, Peter R. Swann, Ignatius S. T. Tsong, Franco Stellari and Alan J. Weger. Their work appears in journals such as Microelectronics Reliability, Optics Letters, Microscopy and Microanalysis, Applied Physics A and Journal of Microscopy.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.