D. P. Griffis

1.0k total citations
65 papers, 776 citations indexed

About

D. P. Griffis is a scholar working on Electrical and Electronic Engineering, Computational Mechanics and Surfaces, Coatings and Films. According to data from OpenAlex, D. P. Griffis has authored 65 papers receiving a total of 776 indexed citations (citations by other indexed papers that have themselves been cited), including 47 papers in Electrical and Electronic Engineering, 40 papers in Computational Mechanics and 14 papers in Surfaces, Coatings and Films. Recurrent topics in D. P. Griffis's work include Ion-surface interactions and analysis (40 papers), Integrated Circuits and Semiconductor Failure Analysis (32 papers) and Semiconductor materials and devices (15 papers). D. P. Griffis is often cited by papers focused on Ion-surface interactions and analysis (40 papers), Integrated Circuits and Semiconductor Failure Analysis (32 papers) and Semiconductor materials and devices (15 papers). D. P. Griffis collaborates with scholars based in United States, Sweden and China. D. P. Griffis's co-authors include P. E. Russell, Richard W. Linton, P. E. Russell, F. A. Stevie, F. A. Stevie, Scott R. Bryan, Ganapati Rao Myneni, Gianluigi Ciovati, S. Corcoran and G. M. Shedd and has published in prestigious journals such as Applied Physics Letters, Analytical Chemistry and Journal of The Electrochemical Society.

In The Last Decade

D. P. Griffis

61 papers receiving 718 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
D. P. Griffis United States 17 469 321 188 169 147 65 776
B. Vidal France 16 316 0.7× 346 1.1× 257 1.4× 194 1.1× 144 1.0× 48 880
A. Desalvo Italy 17 510 1.1× 146 0.5× 429 2.3× 141 0.8× 95 0.6× 72 796
D. Leonhardt United States 20 653 1.4× 126 0.4× 244 1.3× 177 1.0× 126 0.9× 48 957
G. Lulli Italy 16 643 1.4× 502 1.6× 284 1.5× 218 1.3× 31 0.2× 72 962
R. Jede Germany 13 281 0.6× 332 1.0× 170 0.9× 110 0.7× 395 2.7× 38 725
A. E. Bell United States 13 372 0.8× 263 0.8× 217 1.2× 207 1.2× 188 1.3× 32 646
Gy. Vı́kor Hungary 11 129 0.3× 312 1.0× 128 0.7× 218 1.3× 227 1.5× 34 608
Heinz Niedrig Germany 13 283 0.6× 135 0.4× 215 1.1× 160 0.9× 69 0.5× 62 719
Ulrich Kentsch Germany 15 219 0.5× 160 0.5× 317 1.7× 267 1.6× 115 0.8× 85 690
Shigeru Nishimatsu Japan 16 820 1.7× 142 0.4× 307 1.6× 187 1.1× 95 0.6× 36 918

Countries citing papers authored by D. P. Griffis

Since Specialization
Citations

This map shows the geographic impact of D. P. Griffis's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. P. Griffis with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. P. Griffis more than expected).

Fields of papers citing papers by D. P. Griffis

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D. P. Griffis. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. P. Griffis. The network helps show where D. P. Griffis may publish in the future.

Co-authorship network of co-authors of D. P. Griffis

This figure shows the co-authorship network connecting the top 25 collaborators of D. P. Griffis. A scholar is included among the top collaborators of D. P. Griffis based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D. P. Griffis. D. P. Griffis is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Stevie, F. A., et al.. (2014). SIMS analysis of high‐performance accelerator niobium. Surface and Interface Analysis. 46(S1). 288–290. 2 indexed citations
2.
Stevie, F. A., et al.. (2010). Secondary ion mass spectrometry characterization of anomalous behavior for low dose ion implanted phosphorus in silicon. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 28(3). 511–516. 2 indexed citations
3.
Haslauer, Carla M., et al.. (2010). Focused Ion Beam Characterization of Bicomponent Polymer Fibers. Microscopy and Microanalysis. 16(3). 282–290. 9 indexed citations
4.
Tian, Hui, Charles Reece, Michael J. Kelley, et al.. (2010). Surface analysis of Nb materials for SRF cavities. Surface and Interface Analysis. 43(1-2). 151–153. 7 indexed citations
5.
Tian, H. F., et al.. (2009). DEVELOPMENT OF SIMS STANDARDS FOR MEASUREMENT OF H, C, O, NI N NB.
6.
Gu, Chungang, F. A. Stevie, J. Bennett, R. Garcia, & D. P. Griffis. (2006). Back side SIMS analysis of hafnium silicate. Applied Surface Science. 252(19). 7179–7181. 7 indexed citations
7.
Griffis, D. P., et al.. (2004). Circuit editing of copper and low‐k dielectrics in nanotechnology devices. Journal of Microscopy. 214(3). 246–251. 5 indexed citations
8.
9.
Hunter, Jerry, et al.. (2004). O2+ versus Cs+ for high depth resolution depth profiling of III–V nitride-based semiconductor devices. Applied Surface Science. 231-232. 684–687. 3 indexed citations
10.
Stevie, F. A., et al.. (2004). Improved charge neutralization method for depth profiling of bulk insulators using O2+ primary beam on a magnetic sector SIMS instrument. Applied Surface Science. 231-232. 786–790. 19 indexed citations
11.
Wang, Jianhua, D. P. Griffis, R. Garcia, & P. E. Russell. (2003). Etching characteristics of chromium thin films by an electron beam induced surface reaction. Semiconductor Science and Technology. 18(4). 199–205. 12 indexed citations
12.
Russell, P. E., et al.. (1998). Chemically and geometrically enhanced focused ion beam micromachining. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 16(4). 2494–2498. 42 indexed citations
13.
Jarausch, Konrad, et al.. (1994). Force probe characterization using silicon three-dimensional structures formed by focused ion beam lithography. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 12(6). 3571–3575. 9 indexed citations
14.
Hunter, Jerry, et al.. (1993). Elemental analyses of hypervelocity microparticle impact sites on Interplanetary Dust Experiment sensor surfaces. 677–692. 3 indexed citations
15.
Griffis, D. P., et al.. (1993). Proximity effects in low-energy electron-beam lithography. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 11(6). 2367–2372. 5 indexed citations
16.
Corcoran, S., et al.. (1989). Characterization of a fast atom source for secondary ion mass spectrometry. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 7(3). 1706–1711.
17.
Karam, N.H., S. M. Bedair, N. A. El-Masry, & D. P. Griffis. (1986). Laser Stimulated Deposition of GaAs, GaAsP and GaAsP-GaAs Superlattices. MRS Proceedings. 75. 4 indexed citations
18.
Bryan, Scott R., Richard W. Linton, & D. P. Griffis. (1986). An automated method for high dynamic range secondary ion image depth profiling. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 4(5). 2317–2322. 3 indexed citations
19.
Bryan, Scott R., W. S. Woodward, D. P. Griffis, & Richard W. Linton. (1985). A microcomputer based digital imaging system for ion microanalysis. Journal of Microscopy. 138(1). 15–28. 29 indexed citations
20.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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