T. Kammler

406 total citations
8 papers, 36 citations indexed

About

T. Kammler is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering. According to data from OpenAlex, T. Kammler has authored 8 papers receiving a total of 36 indexed citations (citations by other indexed papers that have themselves been cited), including 8 papers in Electrical and Electronic Engineering, 5 papers in Atomic and Molecular Physics, and Optics and 2 papers in Biomedical Engineering. Recurrent topics in T. Kammler's work include Semiconductor materials and devices (5 papers), Semiconductor materials and interfaces (5 papers) and Silicon and Solar Cell Technologies (4 papers). T. Kammler is often cited by papers focused on Semiconductor materials and devices (5 papers), Semiconductor materials and interfaces (5 papers) and Silicon and Solar Cell Technologies (4 papers). T. Kammler collaborates with scholars based in Canada, Germany and Italy. T. Kammler's co-authors include Ehrenfried Zschech, Giovanni Mannino, Luisa Ottaviano, Thomas Feudel, Alessandra Alberti, Corrado Bongiorno, P. Javorka, B. Rice, Maciej Wiatr and J. Mazurier and has published in prestigious journals such as Materials Science and Engineering B and Microelectronic Engineering.

In The Last Decade

T. Kammler

8 papers receiving 35 citations

Peers

T. Kammler
C. Prindle United States
F. Wacquant France
S. Luning United States
F. Scharf Germany
T. Ziegler Germany
V. Sidorov Russia
F. Abbate France
S.W. Gensler United States
M. Rashed United States
D. T. Grandmont Canada
C. Prindle United States
T. Kammler
Citations per year, relative to T. Kammler T. Kammler (= 1×) peers C. Prindle

Countries citing papers authored by T. Kammler

Since Specialization
Citations

This map shows the geographic impact of T. Kammler's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T. Kammler with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T. Kammler more than expected).

Fields of papers citing papers by T. Kammler

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by T. Kammler. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T. Kammler. The network helps show where T. Kammler may publish in the future.

Co-authorship network of co-authors of T. Kammler

This figure shows the co-authorship network connecting the top 25 collaborators of T. Kammler. A scholar is included among the top collaborators of T. Kammler based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with T. Kammler. T. Kammler is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

8 of 8 papers shown
1.
Bazizi, El Mehdi, Alban Zaka, Thomas Herrmann, et al.. (2017). Versatile technology modeling for 22FDX platform development. 365–368. 5 indexed citations
2.
Kammler, T., et al.. (2008). Investigation of the relaxation behavior of Si1−xCx alloys during epitaxial UHV-CVD growth. Materials Science and Engineering B. 154-155. 90–94. 2 indexed citations
3.
Wiatr, Maciej, A. Wei, Roman Boschke, et al.. (2007). Review on Process-Induced Strain Techniques for Advanced Logic Technologies. 19–29. 5 indexed citations
4.
Kammler, T., et al.. (2006). Tuning nickel silicide properties using a lamp based RTA, a heat conduction based RTA or a furnace anneal. Microelectronic Engineering. 83(11-12). 2282–2286. 9 indexed citations
5.
Alberti, Alessandra, Luisa Ottaviano, Corrado Bongiorno, et al.. (2004). Thermal stability of nickel silicide on silicon on insulator (SOI) material. Materials Science and Engineering B. 114-115. 228–231. 6 indexed citations
6.
Alberti, Alessandra, Corrado Bongiorno, Giovanni Mannino, et al.. (2004). Thin nickel silicide layer formation on silicon on insulator material. Materials Science and Engineering B. 114-115. 42–45. 1 indexed citations
7.
Kammler, T., et al.. (2003). In situ high temperature synchrotron-radiation diffraction studies of silicidation processes in nanoscale Ni layers. Microelectronic Engineering. 70(2-4). 226–232. 2 indexed citations
8.
Kammler, T., et al.. (2002). In situ high-temperature synchrotron-radiation diffraction studies of Ni and Co–Ni silicidation processes. Microelectronic Engineering. 64(1-4). 143–149. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by C. Prindle Breakdown of academic impact, for papers by F. Wacquant Breakdown of academic impact, for papers by S. Luning Breakdown of academic impact, for papers by F. Scharf Breakdown of academic impact, for papers by T. Ziegler Breakdown of academic impact, for papers by V. Sidorov Breakdown of academic impact, for papers by F. Abbate Breakdown of academic impact, for papers by S.W. Gensler Breakdown of academic impact, for papers by M. Rashed Breakdown of academic impact, for papers by D. T. Grandmont
Rankless by CCL
2026