Hiroaki Sumitani

473 total citations
45 papers, 346 citations indexed

About

Hiroaki Sumitani is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Surfaces, Coatings and Films. According to data from OpenAlex, Hiroaki Sumitani has authored 45 papers receiving a total of 346 indexed citations (citations by other indexed papers that have themselves been cited), including 42 papers in Electrical and Electronic Engineering, 14 papers in Biomedical Engineering and 10 papers in Surfaces, Coatings and Films. Recurrent topics in Hiroaki Sumitani's work include Advancements in Photolithography Techniques (23 papers), Silicon Carbide Semiconductor Technologies (16 papers) and Advanced Surface Polishing Techniques (11 papers). Hiroaki Sumitani is often cited by papers focused on Advancements in Photolithography Techniques (23 papers), Silicon Carbide Semiconductor Technologies (16 papers) and Advanced Surface Polishing Techniques (11 papers). Hiroaki Sumitani collaborates with scholars based in Japan, United States and Germany. Hiroaki Sumitani's co-authors include Toshimasa Tomoda, Yoshihiko Ozaki, Miyuki Tanaka, Kei Sasaki, Kazuhiro Yamamoto, Yoshio Tanaka, Nobuyuki Takagi, Yoshihiko Hirai, Satoshi Yoshida and Tatsuo Oomori and has published in prestigious journals such as Japanese Journal of Applied Physics, IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control and Measurement Science and Technology.

In The Last Decade

Hiroaki Sumitani

42 papers receiving 321 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Hiroaki Sumitani Japan 9 230 129 77 53 53 45 346
J. E. Greivenkamp United States 7 78 0.3× 61 0.5× 107 1.4× 35 0.7× 152 2.9× 14 419
Gregor Feiertag Germany 10 273 1.2× 185 1.4× 123 1.6× 39 0.7× 36 0.7× 35 359
Daniel J. Sullivan United States 13 208 0.9× 57 0.4× 65 0.8× 33 0.6× 16 0.3× 31 338
Nigel R. Farrar United States 12 246 1.1× 95 0.7× 61 0.8× 59 1.1× 37 0.7× 46 366
J. Otto Germany 9 199 0.9× 182 1.4× 38 0.5× 19 0.4× 41 0.8× 21 356
R. Khanna United States 8 188 0.8× 128 1.0× 60 0.8× 61 1.2× 101 1.9× 17 336
Theodore T. Saito United States 10 79 0.3× 144 1.1× 37 0.5× 40 0.8× 82 1.5× 36 315
D. P. Adams United States 8 199 0.9× 185 1.4× 151 2.0× 24 0.5× 60 1.1× 10 353
L. S. Watkins United States 10 294 1.3× 69 0.5× 94 1.2× 23 0.4× 45 0.8× 34 422
Mikio Matsumoto Japan 8 177 0.8× 507 3.9× 26 0.3× 13 0.2× 49 0.9× 23 620

Countries citing papers authored by Hiroaki Sumitani

Since Specialization
Citations

This map shows the geographic impact of Hiroaki Sumitani's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Hiroaki Sumitani with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Hiroaki Sumitani more than expected).

Fields of papers citing papers by Hiroaki Sumitani

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Hiroaki Sumitani. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Hiroaki Sumitani. The network helps show where Hiroaki Sumitani may publish in the future.

Co-authorship network of co-authors of Hiroaki Sumitani

This figure shows the co-authorship network connecting the top 25 collaborators of Hiroaki Sumitani. A scholar is included among the top collaborators of Hiroaki Sumitani based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Hiroaki Sumitani. Hiroaki Sumitani is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Nakanishi, Yosuke, Hiroaki Okabe, Takeharu Kuroiwa, et al.. (2014). Properties of a SiC Schottky Barrier Diode Fabricated with a Thin Substrate. Materials science forum. 778-780. 820–823. 7 indexed citations
3.
Miura, Naruhisa, Shohei Yoshida, Kenichi Kuroda, et al.. (2009). 4H-SiC Power Metal–Oxide–Semiconductor Field Effect Transistors and Schottky Barrier Diodes of 1.7 kV Rating. Japanese Journal of Applied Physics. 48(4S). 04C085–04C085. 7 indexed citations
4.
Hattori, Ryo, T. Watanabe, Hiroaki Sumitani, Tatsuo Oomori, & Takeshi Mitani. (2008). Crystalline Recovery and Point Defects Re-arrangement during Activation Annealing of Implanted SiC Crystal. IEICE Technical Report; IEICE Tech. Rep.. 108(262). 127–132. 1 indexed citations
5.
Hattori, Ryo, T. Watanabe, Takeshi Mitani, Hiroaki Sumitani, & Tatsuo Oomori. (2008). Crystalline Recovery after Activation Annealing of Al Implanted 4H-SiC. Materials science forum. 600-603. 585–590. 2 indexed citations
6.
Kuroda, Kenichi, et al.. (2008). Distribution of Forward Voltage of SiC Schottky Barrier Diode Using Ti Sintering Process. Materials science forum. 600-603. 979–982. 1 indexed citations
7.
Hirai, Yoshihiko, Satoshi Yoshida, Nobuyuki Takagi, et al.. (2003). High Aspect Pattern Fabrication by Nano Imprint Lithography Using Fine Diamond Mold. Japanese Journal of Applied Physics. 42(Part 1, No. 6B). 3863–3866. 65 indexed citations
8.
Sasaki, Kei, et al.. (2003). Fabrication of high resolution x-ray masks using diamond membrane for second generation x-ray lithography. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 21(1). 207–213. 4 indexed citations
9.
Watanabe, Hiroshi, et al.. (2002). Suppression of secondary electron blur by using Br-containing resists in x-ray lithography. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 20(6). 2953–2957. 3 indexed citations
10.
11.
Sumitani, Hiroaki, Muneyoshi Suita, Hajime Aoyama, et al.. (2001). Evaluation of new x-ray stepper, the XRA. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 19(6). 2448–2454. 4 indexed citations
12.
Kitayama, Toyoki, et al.. (2001). Effect of secondary electron from the substrate in x-ray lithography using harder radiation spectra. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 19(6). 2439–2443. 4 indexed citations
13.
Sumitani, Hiroaki, et al.. (2000). <title>Stress relaxation of EB resist for x-ray mask fabrication</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3997. 113–118.
14.
Sumitani, Hiroaki, et al.. (2000). Evaluation of exposure dose repeatability in synchrotron radiation lithography. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 18(2). 774–779.
15.
Sumitani, Hiroaki, et al.. (1997). Critical Dimension Control in Synchrotron Radiation Lithography Using a Negative-Tone Chemical Amplification Resist. Japanese Journal of Applied Physics. 36(12S). 7591–7591. 8 indexed citations
16.
Adachi, Hiroshi, et al.. (1997). Characterization of tBOC based chemically amplified resist for SR lithography.. Journal of Photopolymer Science and Technology. 10(4). 609–612. 1 indexed citations
17.
Sumitani, Hiroaki, et al.. (1997). Analysis of Overlay Accuracy in 0.14 µm Device Fabrication using Synchrotron Radiation Lithography. Japanese Journal of Applied Physics. 36(6R). 3463–3463. 2 indexed citations
18.
Watanabe, Hiroshi, et al.. (1995). Evaluation of Acid Diffusibility in a Chemical Amplification Resist Using Acidic Water-Soluble Film. Japanese Journal of Applied Physics. 34(12S). 6780–6780. 6 indexed citations
19.
Ozaki, Yoshihiko, Hiroaki Sumitani, Toshimasa Tomoda, & Miyuki Tanaka. (1988). A new system for real-time synthetic aperture ultrasonic imaging. IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control. 35(6). 828–838. 37 indexed citations
20.
Tomoda, Toshimasa, Yoshihiko Ozaki, Hiroaki Sumitani, & Mitsuo Tanaka. (1988). ULTRASONIC SYNTHETIC APERTURE IMAGING - BASIC EXPERIMENTS AND DEVELOPMENT OF REAL-TIME SYSTEM FOR NDT. 4(2-3). 85–86. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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