Oliver D. Patterson
- Electrical and Electronic Engineering top 10%
- Surfaces, Coatings and Films top 5%
- Industrial and Manufacturing Engineering top 10%
- Biomedical Engineering
- Mechanical Engineering
- Co-authors
- D.M. DivanDeepak DivanPramod P. KhargonekarJulie LeeDeborah A. RyanD. MocutaCheng LeiH. Xiao
- Topics
- Integrated Circuits and Semiconductor Failure Analysis (46 papers)Electron and X-Ray Spectroscopy Techniques (35 papers)Advancements in Photolithography Techniques (32 papers)
- Cited by
- Surfaces, Coatings and FilmsElectrical and Electronic EngineeringIndustrial and Manufacturing Engineering
- Journals
- Journal of The Electrochemical SocietyIEEE Transactions on Power ElectronicsIEEE Transactions on Semiconductor Manufacturing
- Partner nations
- United StatesGermanySwitzerland
In The Last Decade
Oliver D. Patterson
55 papers receiving 533 citations
Peers
Comparison fields: 5 of 32
- Electrical and Electronic Engineering 538
- Surfaces, Coatings and Films 156
- Industrial and Manufacturing Engineering 58
- Biomedical Engineering 52
- Mechanical Engineering 44
Countries citing papers authored by Oliver D. Patterson
This map shows the geographic impact of Oliver D. Patterson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Oliver D. Patterson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Oliver D. Patterson more than expected).
Fields of papers citing papers by Oliver D. Patterson
This network shows the impact of papers produced by Oliver D. Patterson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Oliver D. Patterson. The network helps show where Oliver D. Patterson may publish in the future.
Co-authorship network of co-authors of Oliver D. Patterson
This figure shows the co-authorship network connecting the top 25 collaborators of Oliver D. Patterson. A scholar is included among the top collaborators of Oliver D. Patterson based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Oliver D. Patterson. Oliver D. Patterson is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 4 | |
| 2 | 2 | |
| 3 | 0 | |
| 4 | 4 | |
| 5 | 6 | |
| 6 | 2 | |
| 7 | 2 | |
| 8 | 9 | |
| 9 | 7 | |
| 10 | 1 | |
| 11 | 1 | |
| 12 | 11 | |
| 13 | 2 | |
| 14 | 3 | |
| 15 | 16 | |
| 16 | 3 | |
| 17 | 4 | |
| 18 | 4 | |
| 19 | 0 | |
| 20 | 202 |
About Oliver D. Patterson
Oliver D. Patterson is a scholar working on Surfaces, Coatings and Films, Industrial and Manufacturing Engineering and Electrical and Electronic Engineering, having authored 61 papers that have together received 579 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (46 papers), Electron and X-Ray Spectroscopy Techniques (35 papers) and Advancements in Photolithography Techniques (32 papers). The work is most often cited by research in Surfaces, Coatings and Films (156 citations), Electrical and Electronic Engineering (538 citations) and Industrial and Manufacturing Engineering (58 citations). Oliver D. Patterson has collaborated with scholars based in United States, Germany and Switzerland. Frequent co-authors include D.M. Divan, Deepak Divan, Pramod P. Khargonekar, Julie Lee, Deborah A. Ryan, D. Mocuta, Cheng Lei, H. Xiao, Jon Lee and Vijayan N. Nair. Their work appears in journals such as Journal of The Electrochemical Society, IEEE Transactions on Power Electronics and IEEE Transactions on Semiconductor Manufacturing.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.