В.А. Ващенко
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- Electrostatic Discharge in Electronics 79
- Integrated Circuits and Semiconductor Failure Analysis 50
- Semiconductor materials and devices 38
- Advancements in Semiconductor Devices and Circuit Design 30
- Silicon Carbide Semiconductor Technologies 25
- Electromagnetic Compatibility and Noise Suppression 22
- 3D IC and TSV technologies 3
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- Semiconductor Quantum Structures and Devices 7
- Co-authors
- P. HopperA. ConcannonAndrei ShibkovSankalita SahaJosé CelayaKai GoebelMirko ScholzG. Groeseneken
- Cited by
- Electrical and Electronic EngineeringHardware and ArchitectureSafety, Risk, Reliability and Quality
- Journals
- Microelectronics Reliability (7 papers)IEEE Transactions on Device and Materials Reliability (5 papers)Solid-State Electronics (4 papers)
- Partner nations
- United StatesBelgiumUkraine
In The Last Decade
В.А. Ващенко
91 papers receiving 828 citations
Peers
Comparison fields: 5 of 36
- Electrical and Electronic Engineering 864
- Hardware and Architecture 20
- Safety, Risk, Reliability and Quality 23
- Automotive Engineering 27
- Condensed Matter Physics 22
Countries citing papers authored by В.А. Ващенко
This map shows the geographic impact of В.А. Ващенко's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by В.А. Ващенко with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites В.А. Ващенко more than expected).
Fields of papers citing papers by В.А. Ващенко
This network shows the impact of papers produced by В.А. Ващенко. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by В.А. Ващенко. The network helps show where В.А. Ващенко may publish in the future.
Co-authorship network
The 25 scholars most cited alongside В.А. Ващенко, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 0 | |
| 2 | 2023 | 0 | |
| 3 | 2021 | 0 | |
| 4 | Analytical Model and Verification Algorithm to Prevent Injection Induced Latchup Failures | 2020 | 1 |
| 5 | REGULARITIES OF INFLUENCE OF ELECTRON-BEAM TECHNOLOGY ON TECHNICAL AND OPERATIONAL CHARACTERISTICS OF OPTOELECTRONIC DEVICES | 2019 | 1 |
| 6 | PERSPECTIVE DEVELOPMENT TENDENCIES OF ELECTRON BEAM TECHNOLOGY IN PRECISION INSTRUMENTS INDUSTRY | 2019 | 1 |
| 7 | 2019 | 6 | |
| 8 | Overcoming multi finger turn-on in HV DIACs using local poly-ballasting | 2014 | 2 |
| 9 | Modeling of the test-fixture / Horizontal Coupling Plane interaction in system-level ESD test setups | 2014 | 0 |
| 10 | Effect of process technology variation on ESD clamp parameters | 2014 | 3 |
| 11 | Automated latchup analysis | 2014 | 2 |
| 12 | SCR clamps with transient voltage detection driver | 2012 | 4 |
| 13 | 2011 | 60 | |
| 14 | HBM parameter extraction and Transient Safe Operating Area | 2010 | 2 |
| 15 | SCCF — System to component level correlation factor | 2010 | 12 |
| 16 | A dual-base triggered SCR with very low leakage current and adjustable trigger voltage | 2008 | 17 |
| 17 | Dual-direction Isolated NMOS-SCR device for system level ESD protection | 2006 | 1 |
| 18 | 2006 | 8 | |
| 19 | Implementation of high V T turn-on in low-voltage SCR devices | 2005 | 3 |
| 20 | 1997 | 4 |
About В.А. Ващенко
В.А. Ващенко is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, General Materials Science, Surfaces, Coatings and Films and Condensed Matter Physics, having authored 100 papers that have together received 908 indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (79 papers), Integrated Circuits and Semiconductor Failure Analysis (50 papers), Semiconductor materials and devices (38 papers), Advancements in Semiconductor Devices and Circuit Design (30 papers), Silicon Carbide Semiconductor Technologies (25 papers), Electromagnetic Compatibility and Noise Suppression (22 papers), Semiconductor Quantum Structures and Devices (7 papers) and 3D IC and TSV technologies (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (864 citations), Hardware and Architecture (20 citations), Safety, Risk, Reliability and Quality (23 citations), Automotive Engineering (27 citations) and Condensed Matter Physics (22 citations). В.А. Ващенко has collaborated with scholars based in United States, Belgium and Ukraine. Frequent co-authors include P. Hopper, A. Concannon, Andrei Shibkov, Sankalita Saha, José Celaya, Kai Goebel, Mirko Scholz, G. Groeseneken, Abhinav Saxena and S. Thijs. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Device and Materials Reliability, Solid-State Electronics, IEEE Transactions on Electron Devices and Electronics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.