Michael W. Cresswell
- Atomic and Molecular Physics, and Optics top 10%
- Electrical and Electronic Engineering
- Biomedical Engineering
- Surfaces, Coatings and Films top 5%
- Mechanical Engineering
- Co-authors
- Richard A. AllenRonald G. DixsonNdubuisi G. OrjiWilliam F. GuthrieJoseph FuL.W. LinholmR. N. GhoshtagoreJohn S. Villarrubia
- Topics
- Electron and X-Ray Spectroscopy Techniques (13 papers)Force Microscopy Techniques and Applications (11 papers)Surface and Thin Film Phenomena (9 papers)
- Partner nations
- United StatesUnited KingdomTaiwan
In The Last Decade
Michael W. Cresswell
36 papers receiving 316 citations
Peers
Comparison fields: 5 of 56
- Atomic and Molecular Physics, and Optics 177
- Electrical and Electronic Engineering 167
- Biomedical Engineering 123
- Surfaces, Coatings and Films 93
- Mechanical Engineering 52
Countries citing papers authored by Michael W. Cresswell
This map shows the geographic impact of Michael W. Cresswell's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Michael W. Cresswell with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Michael W. Cresswell more than expected).
Fields of papers citing papers by Michael W. Cresswell
This network shows the impact of papers produced by Michael W. Cresswell. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Michael W. Cresswell. The network helps show where Michael W. Cresswell may publish in the future.
Co-authorship network of co-authors of Michael W. Cresswell
This figure shows the co-authorship network connecting the top 25 collaborators of Michael W. Cresswell. A scholar is included among the top collaborators of Michael W. Cresswell based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Michael W. Cresswell. Michael W. Cresswell is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | Monocrystalline test structures, and use for calibrating instruments | 0 |
| 2 | 4 | |
| 3 | 16 | |
| 4 | 3 | |
| 5 | 3 | |
| 6 | 3 | |
| 7 | 2 | |
| 8 | 29 | |
| 9 | 1 | |
| 10 | 18 | |
| 11 | Critical Dimension Reference Features with Sub-Five Nanometer Uncertainty | 7 |
| 12 | Application of Conformal Mapping Approximation Techniques: Parallel Conductors of Finite Dimensions | 0 |
| 13 | 10 | |
| 14 | 2 | |
| 15 | 10 | |
| 16 | 4 | |
| 17 | Simulation and Measurement of Subsurface Features in Scanning Electron Microscopy Metrology | NIST | 1 |
| 18 | 7 | |
| 19 | 18 | |
| 20 | 4 |
About Michael W. Cresswell
Michael W. Cresswell is a scholar working on Surfaces, Coatings and Films, Statistics, Probability and Uncertainty and Atomic and Molecular Physics, and Optics, having authored 39 papers that have together received 333 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (13 papers), Force Microscopy Techniques and Applications (11 papers) and Surface and Thin Film Phenomena (9 papers). The work is most often cited by research in Surfaces, Coatings and Films (93 citations), Structural Biology (15 citations) and Atomic and Molecular Physics, and Optics (177 citations). Michael W. Cresswell has collaborated with scholars based in United States, United Kingdom and Taiwan. Frequent co-authors include Richard A. Allen, Ronald G. Dixson, Ndubuisi G. Orji, William F. Guthrie, Joseph Fu, L.W. Linholm, R. N. Ghoshtagore, John S. Villarrubia, Michael R. Bishop and Paul S. Ho. Their work appears in journals such as Nano Letters, Journal of Applied Physics and IEEE Transactions on Microwave Theory and Techniques.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.