Thomas A. Germer
About
In The Last Decade
Thomas A. Germer
133 papers receiving 2.4k citations
Peers
Comparison fields: 5 of 110
- Biomedical Engineering 1.0k
- Atomic and Molecular Physics, and Optics 792
- Computational Mechanics 662
- Electrical and Electronic Engineering 553
- Surfaces, Coatings and Films 495
Countries citing papers authored by Thomas A. Germer
This map shows the geographic impact of Thomas A. Germer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Thomas A. Germer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Thomas A. Germer more than expected).
Fields of papers citing papers by Thomas A. Germer
This network shows the impact of papers produced by Thomas A. Germer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Thomas A. Germer. The network helps show where Thomas A. Germer may publish in the future.
Co-authorship network of co-authors of Thomas A. Germer
This figure shows the co-authorship network connecting the top 25 collaborators of Thomas A. Germer. A scholar is included among the top collaborators of Thomas A. Germer based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Thomas A. Germer. Thomas A. Germer is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 5 | |
| 2 | 97 | |
| 3 | 11 | |
| 4 | 2 | |
| 5 | Spectrophotometry : accurate measurement of optical properties of materials | 32 |
| 6 | 28 | |
| 7 | 40 | |
| 8 | 27 | |
| 9 | 10 | |
| 10 | 59 | |
| 11 | 38 | |
| 12 | 11 | |
| 13 | 16 | |
| 14 | Measurement of lithographic overlay by light scattering ellipsometry | 2 |
| 15 | Light scattering by slightly non-spherical particles on surfaces | 1 |
| 16 | 29 | |
| 17 | 31 | |
| 18 | Polarized Light-Scattering Measurements of Polished and Etched Steel Surfaces | 1 |
| 19 | 13 | |
| 20 | 5 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.