Junkang Li

538 total citations
30 papers, 423 citations indexed

About

Junkang Li is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Junkang Li has authored 30 papers receiving a total of 423 indexed citations (citations by other indexed papers that have themselves been cited), including 26 papers in Electrical and Electronic Engineering, 11 papers in Materials Chemistry and 6 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Junkang Li's work include Semiconductor materials and devices (19 papers), Advancements in Semiconductor Devices and Circuit Design (14 papers) and Ferroelectric and Negative Capacitance Devices (11 papers). Junkang Li is often cited by papers focused on Semiconductor materials and devices (19 papers), Advancements in Semiconductor Devices and Circuit Design (14 papers) and Ferroelectric and Negative Capacitance Devices (11 papers). Junkang Li collaborates with scholars based in China, United States and France. Junkang Li's co-authors include Peide D. Ye, Mengwei Si, Yiming Qu, Yi Zhao, Rui Zhang, Xiao Lyu, Xiao Yu, Dongqi Zheng, Uygar E. Avci and Sou-Chi Chang and has published in prestigious journals such as ACS Nano, ACS Applied Materials & Interfaces and IEEE Transactions on Electron Devices.

In The Last Decade

Junkang Li

27 papers receiving 416 citations

Peers

Countries citing papers authored by Junkang Li

Since Specialization

Citations

This map shows the geographic impact of Junkang Li's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Junkang Li with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Junkang Li more than expected).

Fields of papers citing papers by Junkang Li

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Junkang Li. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Junkang Li. The network helps show where Junkang Li may publish in the future.

Co-authorship network of co-authors of Junkang Li

This figure shows the co-authorship network connecting the top 25 collaborators of Junkang Li. A scholar is included among the top collaborators of Junkang Li based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Junkang Li. Junkang Li is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	BEOL-Compatible IGZTO Thin-Film Transistors with Ultra-High Positive Bias Stress Stability for Advanced Electronics 2025 ·(unknown), Xiaonan Wu, Ran Cheng, Rui Zhang, Junkang Li, Yunlong Li	0
2	Detection of genetic mutations in 855 cases of papillary thyroid carcinoma by next generation sequencing and its clinicopathological features 2024 ·Diagnostic Pathology ·(unknown), (unknown), Dan Wu, (unknown), Junkang Li, Yuhui Zheng, (unknown)	0
3	Deep Insight of Self-Heating Effect Induced Hot Carrier Reliability Improvement in LDMOS Devices 2024 ·Jin Shao, (unknown), (unknown), Fang Liu, (unknown), (unknown), (unknown), Junkang Li, Rui Zhang	0
4	Proteomics comparison between mass-like and non-mass-like breast lesions 2023 ·Annals of Translational Medicine ·Shiyu Li, Bo Wang, Ying Jiang, Junkang Li, Gang Liu, Zhili Wang	1
5	Ionic Control over Ferroelectricity in 2D Layered van der Waals Capacitors 2022 ·ACS Applied Materials & Interfaces ·Sabine M. Neumayer, Mengwei Si, Junkang Li, Pai-Ying Liao, Tao Lei, Andrew O’Hara, Sokrates T. Pantelides, Peide D. Ye, Petro Maksymovych, Nina Balke	29
6	BEOL Compatible Indium-Tin-Oxide Transistors: Switching of Ultrahigh-Density 2-D Electron Gas Over 0.8 × 10¹⁴/cm² at Oxide/Oxide Interface by the Change of Ferroelectric Polarization 2021 ·IEEE Transactions on Electron Devices ·Mengwei Si, (unknown), Zehao Lin, (unknown), Junkang Li, Jinhyun Noh, (unknown), Chang Niu, Xiao Lyu, Dongqi Zheng, Kerry Maize, Ali Shakouri, Suman Datta, Rakesh Agrawal, Peide D. Ye	26
7	First Experimental Demonstration of Robust HZO/β-Ga₂O₃ Ferroelectric Field-Effect Transistors as Synaptic Devices for Artificial Intelligence Applications in a High-Temperature Environment 2021 ·IEEE Transactions on Electron Devices ·Jinhyun Noh, Hagyoul Bae, Junkang Li, Yandong Luo, Yiming Qu, Tae Joon Park, Mengwei Si, Xuegang Chen, Adam Charnas, Wonil Chung, Xiaochen Peng, Shriram Ramanathan, Shimeng Yu, Peide D. Ye	27
8	Preparation of alginate-gelatin-adipose-derived stem cells microspheres by electrospray and feasibility on repairing articular cartilage injury 2021 ·Zhongguo zuzhi gongcheng yanjiu yu linchuang kangfu ·(unknown), Haoye Meng, Junkang Li, (unknown), Li Huo, Xiaoyu Tian, (unknown), Yu Wang, Jiang Peng	1
9	Quantitative Characterization of Ferroelectric/Dielectric Interface Traps by Pulse Measurements 2021 ·IEEE Transactions on Electron Devices ·Junkang Li, Mengwei Si, Yiming Qu, Xiao Lyu, Peide D. Ye	18
10	10 5 × Endurance Improvement of FE-HZO by an Innovative Rejuvenation Method for 1z Node NV-DRAM Applications 2021 ·Tiancheng Gong, Lei Tao, Junkang Li, Yan Cheng, Yannan Xu, Wei Wei, Pengfei Jiang, (unknown), Yuan Wang, Yu‐Ting Chen, Yaxin Ding, Yang Yang, Yan Wang, Bing Chen, Qing Luo, Steve S. Chung, Shixuan Du, Ming Liu	7
11	Asymmetric Metal/α-In₂Se₃/Si Crossbar Ferroelectric Semiconductor Junction 2021 ·ACS Nano ·Mengwei Si, Zhuocheng Zhang, Sou-Chi Chang, Nazila Haratipour, Dongqi Zheng, Junkang Li, Uygar E. Avci, Peide D. Ye	69
12	The Impact of Channel Semiconductor on the Memory Characteristics of Ferroelectric Field-Effect Transistors 2020 ·IEEE Journal of the Electron Devices Society ·Mengwei Si, Zehao Lin, Jinhyun Noh, Junkang Li, Wonil Chung, Peide D. Ye	17
13	Quantitative Characterization of Interface Traps in Ferroelectric/Dielectric Stack Using Conductance Method 2020 ·IEEE Transactions on Electron Devices ·Yiming Qu, Junkang Li, Mengwei Si, Xiao Lyu, Peide D. Ye	34
14	Multi-Probe Characterization of Ferroelectric/Dielectric Interface by C-V, P-V and Conductance Methods 2020 ·Junkang Li, Yiming Qu, Mengwei Si, Xiao Lyu, Peide D. Ye	17
15	Research progress in Ge-based advanced field effect transistor technology 2020 ·Scientia Sinica Informationis ·Yi Zhao, (unknown), Junkang Li	1
16	Effect of measurement speed (μs-800 ps) on the characterization of reliability behaviors for FDSOI nMOSFETs 2018 ·Yiming Qu, Ran Cheng, (unknown), Junkang Li, Bich-Yen Nguyen, Olivier Faynot, Nuo Xu, Bing Chen, Yi Zhao	3
17	Electrical Properties of Ge pMOSFETs With Ultrathin EOT HfO₂/AlO_{<italic>x</italic>}/GeO_{<italic>x</italic>}Gate-Stacks and NiGe Metal Source/Drain 2017 ·IEEE Transactions on Electron Devices ·Rui Zhang, Junkang Li, Xiao Yu	4
18	Ultra fast (<1 ns) electrical characterization of self-heating effect and its impact on hot carrier injection in 14nm FinFETs 2017 ·Yiming Qu, Xi Lin, Junkang Li, Ran Cheng, Xiao Yu, (unknown), Jiwu Lu, Bing Chen, Yi Zhao	35
19	Aggressive EOT Scaling of Ge pMOSFETs With HfO₂/AlO_{<italic>x</italic>}/GeO_{<italic>x</italic>}Gate-Stacks Fabricated by Ozone Postoxidation 2016 ·IEEE Electron Device Letters ·Rui Zhang, Xiaoyu Tang, Xiao Yu, Junkang Li, Yi Zhao	44
20	High-Performance Germanium pMOSFETs With NiGe Metal Source/Drain Fabricated by Microwave Annealing 2016 ·IEEE Transactions on Electron Devices ·Rui Zhang, Junkang Li, Feng Chen, Yi Zhao	17

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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