Jiwu Lu

1.5k total citations
58 papers, 1.1k citations indexed

About

Jiwu Lu is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, Jiwu Lu has authored 58 papers receiving a total of 1.1k indexed citations (citations by other indexed papers that have themselves been cited), including 39 papers in Electrical and Electronic Engineering, 22 papers in Materials Chemistry and 12 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in Jiwu Lu's work include Semiconductor materials and devices (21 papers), Advancements in Semiconductor Devices and Circuit Design (12 papers) and Integrated Circuits and Semiconductor Failure Analysis (8 papers). Jiwu Lu is often cited by papers focused on Semiconductor materials and devices (21 papers), Advancements in Semiconductor Devices and Circuit Design (12 papers) and Integrated Circuits and Semiconductor Failure Analysis (8 papers). Jiwu Lu collaborates with scholars based in China, United States and Japan. Jiwu Lu's co-authors include Mohammed Yaseen, Xiubo Zhao, Mei Wang, Yi‐Zeng Liang, M. P. Anantram, Hu Xu, Hualou Liang, Jing Dong, Yi Zhao and Chunming Tu and has published in prestigious journals such as Nano Letters, Journal of Applied Physics and Food Chemistry.

In The Last Decade

Jiwu Lu

55 papers receiving 1.1k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Jiwu Lu China 18 483 319 129 103 96 58 1.1k
Yuanchao Li China 20 375 0.8× 507 1.6× 191 1.5× 40 0.4× 93 1.0× 83 1.5k
Hong Huo China 23 602 1.2× 174 0.5× 157 1.2× 58 0.6× 328 3.4× 126 2.0k
Daewon Chung South Korea 18 296 0.6× 133 0.4× 90 0.7× 59 0.6× 51 0.5× 82 822
Zian Wang China 15 176 0.4× 190 0.6× 228 1.8× 33 0.3× 162 1.7× 55 968
Huagang Liu China 20 377 0.8× 337 1.1× 427 3.3× 83 0.8× 121 1.3× 75 1.3k
Kangwei Liu China 12 837 1.7× 233 0.7× 56 0.4× 122 1.2× 75 0.8× 46 1.4k
Yuanhao Liu China 20 519 1.1× 109 0.3× 173 1.3× 169 1.6× 89 0.9× 87 1.1k
Dongqi Zhang China 24 260 0.5× 581 1.8× 90 0.7× 73 0.7× 142 1.5× 63 1.4k
Yuchuan Zhang China 22 552 1.1× 137 0.4× 43 0.3× 145 1.4× 50 0.5× 75 1.4k

Countries citing papers authored by Jiwu Lu

Since Specialization
Citations

This map shows the geographic impact of Jiwu Lu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jiwu Lu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jiwu Lu more than expected).

Fields of papers citing papers by Jiwu Lu

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jiwu Lu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jiwu Lu. The network helps show where Jiwu Lu may publish in the future.

Co-authorship network of co-authors of Jiwu Lu

This figure shows the co-authorship network connecting the top 25 collaborators of Jiwu Lu. A scholar is included among the top collaborators of Jiwu Lu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jiwu Lu. Jiwu Lu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Liu, Jiangwei, Jiwu Lu, & A F M Anhar Uddin Bhuiyan. (2025). Ultra-wide bandgap semiconductor materials, processing, and devices. Materials Science in Semiconductor Processing. 195. 109627–109627. 1 indexed citations
2.
Liu, Hao, Yanwen Wang, Jiwu Lu, et al.. (2025). MULSAM: Multidimensional Attention With Hardware Acceleration for Efficient Intrusion Detection on Vehicular CAN Bus. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 44(9). 3274–3288.
3.
4.
Zhai, Dongyuan, et al.. (2024). Improved electrical performance for SiO2/β-Ga2O3 (001) MIS capacitor by post-deposition annealing. Materials Science in Semiconductor Processing. 184. 108777–108777. 2 indexed citations
5.
Guo, Kaiwen, Kun He, Yi Chen, et al.. (2024). Two-Dimensional Ultrathin Fe3Sn2 Kagome Metal with Defect-Dependent Magnetic Property. Nano Letters. 24(24). 7483–7490. 9 indexed citations
6.
Wang, Yanwen, et al.. (2024). FPGA Adaptive Neural Network Quantization for Adversarial Image Attack Defense. IEEE Transactions on Industrial Informatics. 20(12). 14017–14028.
7.
Li, Hui, Hongyu Wu, Qihao Zhang, et al.. (2023). Study of β -Ga 2 O 3 (001)/sapphire (a-plane) heterostructure in wide bandgap solar-blind deep-ultraviolet photodetector. Journal of Crystal Growth. 628. 127513–127513. 8 indexed citations
8.
Li, Yangbo, Chunming Tu, Biao Xiao, et al.. (2023). Review of the Failure Mechanism and Methodologies of IGBT Bonding Wire. IEEE Transactions on Components Packaging and Manufacturing Technology. 13(7). 1045–1057. 20 indexed citations
9.
Liu, Jiangwei, et al.. (2022). Low Interface Trapped Charge Density for AlO/β-GaO (001) Metal-Insulator-Semiconductor Capacitor . IEEE Journal of the Electron Devices Society. 10. 942–946. 7 indexed citations
10.
Zhai, Dongyuan, Danying Gao, Jing Xiao, et al.. (2020). Electrical characterization of near-interface traps in thermally oxidized and NO-annealed SiO 2 /4H-SiC metal-oxide-semiconductor capacitors. Journal of Physics D Applied Physics. 53(44). 445102–445102. 10 indexed citations
11.
Li, Hao, Pengcheng Zhang, Xiaohong Chen, et al.. (2020). Effect of Zn2+ substitution for Mg2+ in Li3Mg2SbO6 and the impact on the bond characteristics and microwave dielectric properties. Journal of Alloys and Compounds. 832. 155043–155043. 14 indexed citations
12.
Yu, Xiao, et al.. (2020). Ultra-Fast (ns-Scale) Characterization of NBTI Behaviors in Si pFinFETs. IEEE Journal of the Electron Devices Society. 8. 577–583. 8 indexed citations
13.
Zhang, Yanyan, Ran Cheng, Dong Ni, et al.. (2019). Thermal conductivity characterization of ultra-thin silicon film using the ultra-fast transient hot strip method*. Chinese Physics B. 28(7). 78105–78105. 3 indexed citations
14.
Li, Hao, Xiaohong Chen, Bin Tang, et al.. (2019). Structure, bond characteristics and Raman spectra of CaMg1-Mn Si2O6 microwave dielectric ceramics. Ceramics International. 45(11). 14160–14166. 51 indexed citations
15.
16.
Yu, Xiao, Ran Cheng, Yiming Qu, et al.. (2017). A Fast $V_{th}$ Measurement (FVM) Technique for NBTI Behavior Characterization. IEEE Electron Device Letters. 39(2). 172–175. 10 indexed citations
17.
Zhu, Xiaodong, et al.. (2017). Reduction in Modulus of Suspended Sub‐2 nm Single Crystalline Silicon Nanomembranes. Advanced Materials Interfaces. 4(19). 5 indexed citations
18.
Sun, Jiabao & Jiwu Lu. (2015). Interface Engineering and Gate Dielectric Engineering for High Performance Ge MOSFETs. Advances in Condensed Matter Physics. 2015. 1–9. 10 indexed citations
19.
Lu, Jiwu, J. P. Campbell, Jason T. Ryan, et al.. (2014). PBTI-Induced Random Timing Jitter in Circuit-Speed Random Logic. IEEE Transactions on Electron Devices. 61(11). 3613–3618. 11 indexed citations
20.
Lu, Jiwu. (2004). QSAR analysis of cyclooxygenase inhibitor using particle swarm optimization and multiple linear regression. Journal of Pharmaceutical and Biomedical Analysis. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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