B. Krist

607 total citations
8 papers, 124 citations indexed

About

B. Krist is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, B. Krist has authored 8 papers receiving a total of 124 indexed citations (citations by other indexed papers that have themselves been cited), including 8 papers in Electrical and Electronic Engineering, 6 papers in Electronic, Optical and Magnetic Materials and 3 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in B. Krist's work include Semiconductor materials and devices (7 papers), Copper Interconnects and Reliability (6 papers) and Electronic Packaging and Soldering Technologies (3 papers). B. Krist is often cited by papers focused on Semiconductor materials and devices (7 papers), Copper Interconnects and Reliability (6 papers) and Electronic Packaging and Soldering Technologies (3 papers). B. Krist collaborates with scholars based in United States. B. Krist's co-authors include M. Radosavljević, Han Wui Then, P. Fischer, Hui Jae Yoo, N. Thomas, Kimin Jun, Pratik Koirala, Tushar K. Talukdar, J. S. Chawla and Kanwal Jit Singh and has published in prestigious journals such as IEEE Transactions on Electron Devices and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.

In The Last Decade

B. Krist

7 papers receiving 121 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
B. Krist United States	6	108	50	43	22	15	8	124
B. Sell Germany	8	183 1.7×	56 1.1×	36 0.8×	26 1.2×	36 2.4×	17	233
Filip Schleicher Belgium	7	124 1.1×	35 0.7×	20 0.5×	44 2.0×	54 3.6×	23	170
U. Kwon United States	9	121 1.1×	59 1.2×	20 0.5×	87 4.0×	34 2.3×	21	193
S. Joblot France	9	154 1.4×	32 0.6×	67 1.6×	25 1.1×	26 1.7×	28	194
R.K. Freitag United States	11	283 2.6×	34 0.7×	68 1.6×	22 1.0×	50 3.3×	21	348
Seiji Inumiya Japan	9	286 2.6×	27 0.5×	9 0.2×	43 2.0×	42 2.8×	47	302
Patrick Krkotić Spain	7	43 0.4×	15 0.3×	56 1.3×	21 1.0×	9 0.6×	23	114
C. S. Chang Taiwan	5	86 0.8×	27 0.5×	106 2.5×	65 3.0×	52 3.5×	15	150
Rich Wise United States	5	184 1.7×	21 0.4×	16 0.4×	8 0.4×	54 3.6×	16	194
H. Ono Japan	6	285 2.6×	74 1.5×	23 0.5×	44 2.0×	52 3.5×	15	304

Countries citing papers authored by B. Krist

Since Specialization

Citations

This map shows the geographic impact of B. Krist's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B. Krist with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B. Krist more than expected).

Fields of papers citing papers by B. Krist

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by B. Krist. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B. Krist. The network helps show where B. Krist may publish in the future.

Co-authorship network of co-authors of B. Krist

This figure shows the co-authorship network connecting the top 25 collaborators of B. Krist. A scholar is included among the top collaborators of B. Krist based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with B. Krist. B. Krist is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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8 of 8 papers shown

1.

Then, Han Wui, M. Radosavljević, Kimin Jun, et al.. (2020). Gallium Nitride and Silicon Transistors on 300 mm Silicon Wafers Enabled by 3-D Monolithic Heterogeneous Integration. IEEE Transactions on Electron Devices. 67(12). 5306–5314. 47 indexed citations

2.

Chawla, J. S., Seung-Hun Sung, Stephanie A. Bojarski, et al.. (2016). Resistance and electromigration performance of 6 nm wires. 63–65. 21 indexed citations

3.

Bojarski, Stephanie A., C.T. Carver, Manish Chandhok, et al.. (2015). Nickel silicide for interconnects. 169–172. 3 indexed citations

4.

Carver, C.T., Ramanan Chebiam, Tejaswi Indukuri, et al.. (2014). Demonstration of a sidewall capacitor to evaluate dielectrics and metal barrier thin films. 177–180.

5.

Chawla, J. S., Kanwal Jit Singh, Alan Myers, et al.. (2014). Patterning challenges in the fabrication of 12 nm half-pitch dual damascene copper ultra low-k interconnects. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9054. 905404–905404. 14 indexed citations

6.

Chawla, J. S., Ramanan Chebiam, Rohan Akolkar, et al.. (2013). Demonstration of a 12 nm-half-pitch copper ultralow-k interconnect process. 1–3. 12 indexed citations

7.

Allen, Gary, Tejaswi Indukuri, Christopher Jezewski, et al.. (2012). Demonstration of an electrically functional 34 nm metal pitch interconnect in ultralow-k ILD using spacer-based pitch quartering. 1–3. 14 indexed citations

8.

Yoo, Hui Jae, S. Balakrishnan, Jeff Bielefeld, et al.. (2010). Demonstration of a reliable high-performance and yielding Air gap interconnect process. 49. 1–3. 13 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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