B. Krist
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Atomic and Molecular Physics, and Optics
- Materials Chemistry
- Co-authors
- M. RadosavljevićHan Wui ThenP. FischerHui Jae YooN. ThomasKimin JunPratik KoiralaTushar K. Talukdar
- Topics
- Semiconductor materials and devices (7 papers)Copper Interconnects and Reliability (6 papers)Electronic Packaging and Soldering Technologies (3 papers)
- Cited by
- Condensed Matter PhysicsElectronic, Optical and Magnetic MaterialsSurfaces, Coatings and Films
- Journals
- IEEE Transactions on Electron DevicesProceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
- Partner nations
- United States
In The Last Decade
B. Krist
7 papers receiving 121 citations
Peers
Comparison fields: 5 of 17
- Electrical and Electronic Engineering 108
- Electronic, Optical and Magnetic Materials 50
- Condensed Matter Physics 43
- Atomic and Molecular Physics, and Optics 22
- Materials Chemistry 15
Countries citing papers authored by B. Krist
This map shows the geographic impact of B. Krist's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B. Krist with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B. Krist more than expected).
Fields of papers citing papers by B. Krist
This network shows the impact of papers produced by B. Krist. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B. Krist. The network helps show where B. Krist may publish in the future.
Co-authorship network of co-authors of B. Krist
This figure shows the co-authorship network connecting the top 25 collaborators of B. Krist. A scholar is included among the top collaborators of B. Krist based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with B. Krist. B. Krist is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 47 | |
| 2 | 21 | |
| 3 | 3 | |
| 4 | 0 | |
| 5 | 14 | |
| 6 | 12 | |
| 7 | 14 | |
| 8 | 13 |
About B. Krist
B. Krist is a scholar working on Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering and Atomic and Molecular Physics, and Optics, having authored 8 papers that have together received 124 indexed citations. Recurring topics across this work include Semiconductor materials and devices (7 papers), Copper Interconnects and Reliability (6 papers) and Electronic Packaging and Soldering Technologies (3 papers). The work is most often cited by research in Condensed Matter Physics (43 citations), Electronic, Optical and Magnetic Materials (50 citations) and Surfaces, Coatings and Films (14 citations). B. Krist has collaborated with scholars based in United States. Frequent co-authors include M. Radosavljević, Han Wui Then, P. Fischer, Hui Jae Yoo, N. Thomas, Kimin Jun, Pratik Koirala, Tushar K. Talukdar, J. S. Chawla and Kanwal Jit Singh. Their work appears in journals such as IEEE Transactions on Electron Devices and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.