Rubin Parekhji
- Electrical and Electronic Engineering
- Hardware and Architecture top 2%
- Control and Systems Engineering
- Computer Networks and Communications
- Software
- Co-authors
- Arvind JainKrishnendu ChakrabartyXrysovalantis KavousianosG. VenkateshS.D. SherlekarSandeep GoelSrivaths RaviVishwani D. Agrawal
- Topics
- VLSI and Analog Circuit Testing (53 papers)Integrated Circuits and Semiconductor Failure Analysis (31 papers)Radiation Effects in Electronics (22 papers)
- Journals
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and SystemsJournal of Electronic TestingJournal of Low Power Electronics
- Partner nations
- IndiaUnited StatesGreece
In The Last Decade
Rubin Parekhji
59 papers receiving 318 citations
Peers
Comparison fields: 5 of 17
- Electrical and Electronic Engineering 312
- Hardware and Architecture 293
- Control and Systems Engineering 33
- Computer Networks and Communications 29
- Software 19
Countries citing papers authored by Rubin Parekhji
This map shows the geographic impact of Rubin Parekhji's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Rubin Parekhji with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Rubin Parekhji more than expected).
Fields of papers citing papers by Rubin Parekhji
This network shows the impact of papers produced by Rubin Parekhji. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Rubin Parekhji. The network helps show where Rubin Parekhji may publish in the future.
Co-authorship network of co-authors of Rubin Parekhji
This figure shows the co-authorship network connecting the top 25 collaborators of Rubin Parekhji. A scholar is included among the top collaborators of Rubin Parekhji based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Rubin Parekhji. Rubin Parekhji is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 1 | |
| 3 | 0 | |
| 4 | 3 | |
| 5 | 3 | |
| 6 | 10 | |
| 7 | 3 | |
| 8 | 4 | |
| 9 | 2 | |
| 10 | 11 | |
| 11 | 0 | |
| 12 | 4 | |
| 13 | 28 | |
| 14 | 4 | |
| 15 | 12 | |
| 16 | 18 | |
| 17 | 0 | |
| 18 | 7 | |
| 19 | 2 | |
| 20 | 2 |
About Rubin Parekhji
Rubin Parekhji is a scholar working on Hardware and Architecture, Software and Electrical and Electronic Engineering, having authored 65 papers that have together received 332 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (53 papers), Integrated Circuits and Semiconductor Failure Analysis (31 papers) and Radiation Effects in Electronics (22 papers). The work is most often cited by research in Hardware and Architecture (293 citations), Electrical and Electronic Engineering (312 citations) and Software (19 citations). Rubin Parekhji has collaborated with scholars based in India, United States and Greece. Frequent co-authors include Arvind Jain, Krishnendu Chakrabarty, Xrysovalantis Kavousianos, G. Venkatesh, S.D. Sherlekar, Sandeep Goel, Srivaths Ravi, Vishwani D. Agrawal, Bharadwaj Amrutur and Srivaths Ravi. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Journal of Electronic Testing and Journal of Low Power Electronics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.