F.K. Baker

514 total citations
15 papers, 297 citations indexed

About

F.K. Baker is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Infectious Diseases. According to data from OpenAlex, F.K. Baker has authored 15 papers receiving a total of 297 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Electrical and Electronic Engineering, 3 papers in Atomic and Molecular Physics, and Optics and 0 papers in Infectious Diseases. Recurrent topics in F.K. Baker's work include Advancements in Semiconductor Devices and Circuit Design (15 papers), Semiconductor materials and devices (14 papers) and Integrated Circuits and Semiconductor Failure Analysis (7 papers). F.K. Baker is often cited by papers focused on Advancements in Semiconductor Devices and Circuit Design (15 papers), Semiconductor materials and devices (14 papers) and Integrated Circuits and Semiconductor Failure Analysis (7 papers). F.K. Baker collaborates with scholars based in United States and Japan. F.K. Baker's co-authors include J.R. Pfiester, L.C. Parrillo, J.D. Hayden, T.C. Mele, C.D. Gunderson, James W. Miller, H.‐H. Tseng, P.J. Tobin, Philip J. Tobin and Katharine Evans and has published in prestigious journals such as IEEE Journal of Solid-State Circuits, IEEE Transactions on Electron Devices and IEEE Electron Device Letters.

In The Last Decade

F.K. Baker

15 papers receiving 279 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
F.K. Baker United States 8 291 51 36 21 15 15 297
C.D. Gunderson United States 6 237 0.8× 46 0.9× 28 0.8× 16 0.8× 8 0.5× 18 242
J.D. Hayden United States 9 318 1.1× 29 0.6× 35 1.0× 17 0.8× 8 0.5× 34 326
T.C. Mele United States 6 249 0.9× 49 1.0× 37 1.0× 21 1.0× 9 0.6× 22 262
G.J. Hu United States 8 537 1.8× 71 1.4× 83 2.3× 7 0.3× 15 1.0× 12 543
P. Garabédian France 9 282 1.0× 115 2.3× 20 0.6× 27 1.3× 9 0.6× 39 323
Mats O. Andersson Sweden 12 340 1.2× 97 1.9× 79 2.2× 9 0.4× 5 0.3× 20 358
R.W. Murto United States 11 371 1.3× 30 0.6× 97 2.7× 13 0.6× 14 0.9× 28 382
D. Wristers United States 9 344 1.2× 37 0.7× 118 3.3× 22 1.0× 26 1.7× 25 354
T. Grabolla Germany 10 224 0.8× 42 0.8× 63 1.8× 7 0.3× 18 1.2× 31 263
K. Onishi United States 11 374 1.3× 39 0.8× 70 1.9× 23 1.1× 5 0.3× 18 380

Countries citing papers authored by F.K. Baker

Since Specialization
Citations

This map shows the geographic impact of F.K. Baker's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F.K. Baker with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F.K. Baker more than expected).

Fields of papers citing papers by F.K. Baker

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F.K. Baker. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F.K. Baker. The network helps show where F.K. Baker may publish in the future.

Co-authorship network of co-authors of F.K. Baker

This figure shows the co-authorship network connecting the top 25 collaborators of F.K. Baker. A scholar is included among the top collaborators of F.K. Baker based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with F.K. Baker. F.K. Baker is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

15 of 15 papers shown
1.
Hayden, J.D., F.K. Baker, T. McNelly, et al.. (2003). A high-performance sub-half micron CMOS technology for fast SRAMs. 417–420. 1 indexed citations
2.
Baker, F.K., J.R. Pfiester, T.C. Mele, et al.. (2003). The influence of fluorine on threshold voltage instabilities in p/sup +/ polysilicon gated p-channel MOSFETs. 443–446. 4 indexed citations
3.
Pfiester, J.R., et al.. (2003). A self-aligned LDD/channel implanted ITLDD process with selectively-deposited poly gates for CMOS VLSI. 8. 769–772. 2 indexed citations
4.
Tsui, Pei-Ling, et al.. (2002). An integrated system for circuit level hot-carrier evaluation. 19.4/1–19.4/4. 1 indexed citations
5.
Tseng, Hsin, et al.. (1992). The effect of silicon gate microstructure and gate oxide process on threshold voltage instabilities in p/sup +/-gate p-channel MOSFETs with fluorine incorporation. IEEE Transactions on Electron Devices. 39(7). 1687–1693. 27 indexed citations
6.
Hayden, J.D., T.C. Mele, David C. Burnett, et al.. (1992). A high-performance 0.5- mu m BiCMOS technology for fast 4-Mb SRAMs. IEEE Transactions on Electron Devices. 39(7). 1669–1679. 14 indexed citations
7.
Hayden, J.D., F.K. Baker, Robert E. Jones, et al.. (1991). A high-performance half-micrometer generation CMOS technology for fast SRAMs. IEEE Transactions on Electron Devices. 38(4). 876–886. 4 indexed citations
8.
Tsui, Pei-Ling, et al.. (1991). A circuit level hot-carrier evaluation system. IEEE Journal of Solid-State Circuits. 26(3). 410–414. 8 indexed citations
9.
Pfiester, J.R., F.K. Baker, T.C. Mele, et al.. (1990). The effects of boron penetration on p/sup +/ polysilicon gated PMOS devices. IEEE Transactions on Electron Devices. 37(8). 1842–1851. 151 indexed citations
10.
Pfiester, J.R., L.C. Parrillo, & F.K. Baker. (1990). A physical model for boron penetration through thin gate oxides from p/sup +/ polysilicon gates. IEEE Electron Device Letters. 11(6). 247–249. 45 indexed citations
11.
Pfiester, J.R., et al.. (1990). A selectively deposited poly-gate ITLDD process with self-aligned LDD/channel implantation. IEEE Electron Device Letters. 11(6). 253–255. 1 indexed citations
12.
13.
Baker, F.K. & J.R. Pfiester. (1988). The influence of tilted source-drain implants on high-field effects in submicrometer MOSFETs. IEEE Transactions on Electron Devices. 35(12). 2119–2124. 14 indexed citations
14.
Pfiester, J.R. & F.K. Baker. (1987). Asymmetrical high field effects in submicron MOSFET's. 51–54. 5 indexed citations
15.
Parrillo, L.C., et al.. (1986). A versatile, high-performance, double-level-poly double-level-metal, 1.2-micron CMOS technology. 244–247. 9 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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