D. Wristers

553 total citations
25 papers, 354 citations indexed

About

D. Wristers is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Condensed Matter Physics. According to data from OpenAlex, D. Wristers has authored 25 papers receiving a total of 354 indexed citations (citations by other indexed papers that have themselves been cited), including 22 papers in Electrical and Electronic Engineering, 4 papers in Materials Chemistry and 3 papers in Condensed Matter Physics. Recurrent topics in D. Wristers's work include Semiconductor materials and devices (20 papers), Advancements in Semiconductor Devices and Circuit Design (11 papers) and Integrated Circuits and Semiconductor Failure Analysis (6 papers). D. Wristers is often cited by papers focused on Semiconductor materials and devices (20 papers), Advancements in Semiconductor Devices and Circuit Design (11 papers) and Integrated Circuits and Semiconductor Failure Analysis (6 papers). D. Wristers collaborates with scholars based in United States, Hong Kong and Germany. D. Wristers's co-authors include L.K. Han, Mohsin Ahmad Bhat, J. Fulford, Dim‐Lee Kwong, D. L. Kwong, Martin Allen, J. Liu, Weiping Bai, N. Lu and Andrew Ritenour and has published in prestigious journals such as Applied Physics Letters, IEEE Transactions on Electron Devices and IEEE Electron Device Letters.

In The Last Decade

D. Wristers

21 papers receiving 335 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
D. Wristers United States 9 344 118 37 26 26 25 354
Y. Ma United States 9 307 0.9× 147 1.2× 37 1.0× 8 0.3× 37 1.4× 17 320
M.C. Habrard France 4 296 0.9× 189 1.6× 36 1.0× 8 0.3× 13 0.5× 6 308
G. Weidner Germany 10 281 0.8× 171 1.4× 72 1.9× 11 0.4× 37 1.4× 37 315
C.H. Ling Singapore 14 585 1.7× 124 1.1× 95 2.6× 8 0.3× 32 1.2× 77 614
L. Trombetta United States 9 311 0.9× 94 0.8× 72 1.9× 12 0.5× 49 1.9× 20 340
J.L. Leray France 12 407 1.2× 108 0.9× 15 0.4× 14 0.5× 40 1.5× 28 441
Dusit Kruangam Japan 12 398 1.2× 332 2.8× 32 0.9× 11 0.4× 33 1.3× 24 412
Nobuo Toyokura Japan 9 289 0.8× 71 0.6× 109 2.9× 26 1.0× 14 0.5× 17 330
Taroh Inada Japan 12 294 0.9× 69 0.6× 159 4.3× 44 1.7× 17 0.7× 36 331
G.J. Hu United States 8 537 1.6× 83 0.7× 71 1.9× 15 0.6× 12 0.5× 12 543

Countries citing papers authored by D. Wristers

Since Specialization
Citations

This map shows the geographic impact of D. Wristers's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Wristers with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Wristers more than expected).

Fields of papers citing papers by D. Wristers

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D. Wristers. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Wristers. The network helps show where D. Wristers may publish in the future.

Co-authorship network of co-authors of D. Wristers

This figure shows the co-authorship network connecting the top 25 collaborators of D. Wristers. A scholar is included among the top collaborators of D. Wristers based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D. Wristers. D. Wristers is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Wristers, D., et al.. (2023). An Investigation of the Impact of COVID-19 on Food Access and Security in Bexar County: A Mixed Methods Approach. Journal of Primary Care & Community Health. 14. 4267767413–4267767413.
2.
3.
Bai, Weiping, N. Lu, J. Liu, et al.. (2004). Ge MOS characteristics with CVD HfO/sub 2/ gate dielectrics and TaN gate electrode. 121–122. 53 indexed citations
4.
Gardner, Mark, et al.. (2003). Enhanced hot-hole degradation in P/sup +/-poly PMOSFETs with oxynitride gate dielectrics. 86–89. 2 indexed citations
5.
6.
7.
Fulford, J., D. Wristers, & Mark Gardner. (2002). The effect of hydrogen denudation on thin oxides, device performance, and epitaxial elimination. 85–89. 1 indexed citations
8.
Han, L.K., Mohsin Ahmad Bhat, D. Wristers, J. Fulford, & Dim‐Lee Kwong. (2002). Polarity dependence of dielectric breakdown in scaled SiO/sub 2/. 617–620. 14 indexed citations
9.
Rubin, L., et al.. (2002). Buried layer/connecting layer high energy implantation for improved CMOS latch-up. 796–799. 8 indexed citations
10.
Gardner, Mark, D. Wristers, J. Fulford, & John Borland. (2002). Hydrogen denudation for enhanced thin oxide quality, device performance, and potential epitaxial elimination. 111–112. 2 indexed citations
11.
Gardner, Mark, et al.. (1999). Enhanced Degradation in P+-Poly PMOSFETs With Oxynitride Gate Dielectrics Under Hot-Hole Injection. MRS Proceedings. 567. 1 indexed citations
12.
Kwong, Dim‐Lee, et al.. (1998). Boron segregation in As-implanted Si caused by electric field and transient enhanced diffusion. Applied Physics Letters. 72(14). 1709–1711. 8 indexed citations
13.
Wristers, D., et al.. (1997). Effect of local interconnect etch-stop layer on channel hot-electron degradation. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3212. 268–268. 3 indexed citations
14.
15.
Wristers, D., et al.. (1996). Materials and processing issues in the development of N 2 O/NO-based ultrathin oxynitride gate dielectrics for CMOS ULSI applications. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2875. 188–188.
16.
Wristers, D., et al.. (1996). Degradation of oxynitride gate dielectric reliability due to boron diffusion. Applied Physics Letters. 68(15). 2094–2096. 74 indexed citations
17.
Han, L.K., et al.. (1995). Recent developments in Ultra thin oxynitride gate dielectrics. Microelectronic Engineering. 28(1-4). 89–96. 26 indexed citations
18.
Han, L.K., et al.. (1995). Highly suppressed boron penetration in NO-nitrided SiO/sub 2/ for p/sup +/-polysilicon gated MOS device applications. IEEE Electron Device Letters. 16(7). 319–321. 36 indexed citations
19.
Bhat, Mohsin Ahmad, et al.. (1995). Electrical properties and reliability of MOSFET's with rapid thermal NO-nitrided SiO/sub 2/ gate dielectrics. IEEE Transactions on Electron Devices. 42(5). 907–914. 24 indexed citations
20.
Bhat, Mohsin Ahmad, et al.. (1995). Effects of chemical composition on the electrical properties of NO-nitrided SiO2. Applied Physics Letters. 66(10). 1225–1227. 87 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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