G.J. Hu

679 total citations
12 papers, 543 citations indexed

About

G.J. Hu is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering. According to data from OpenAlex, G.J. Hu has authored 12 papers receiving a total of 543 indexed citations (citations by other indexed papers that have themselves been cited), including 12 papers in Electrical and Electronic Engineering, 2 papers in Atomic and Molecular Physics, and Optics and 2 papers in Biomedical Engineering. Recurrent topics in G.J. Hu's work include Semiconductor materials and devices (8 papers), Advancements in Semiconductor Devices and Circuit Design (7 papers) and Integrated Circuits and Semiconductor Failure Analysis (3 papers). G.J. Hu is often cited by papers focused on Semiconductor materials and devices (8 papers), Advancements in Semiconductor Devices and Circuit Design (7 papers) and Integrated Circuits and Semiconductor Failure Analysis (3 papers). G.J. Hu collaborates with scholars based in United States. G.J. Hu's co-authors include Richard H. Bruce, W. C. Johnson, R.H. Dennard, C. Y. Ting, M.R. Pinto, Yuan Taur, Lewis M. Terman, Karen Petrillo, J. Aitken and Y. Taur and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and IEEE Journal of Solid-State Circuits.

In The Last Decade

G.J. Hu

12 papers receiving 519 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
G.J. Hu United States 8 537 83 71 20 15 12 543
Nobuo Toyokura Japan 9 289 0.5× 71 0.9× 109 1.5× 24 1.2× 26 1.7× 17 330
Paul Vande Voorde United States 11 537 1.0× 84 1.0× 103 1.5× 29 1.4× 5 0.3× 25 555
T.C. Mele United States 6 249 0.5× 37 0.4× 49 0.7× 22 1.1× 9 0.6× 22 262
R. L. Mattis United States 4 288 0.5× 78 0.9× 174 2.5× 56 2.8× 13 0.9× 6 334
T. Grabolla Germany 10 224 0.4× 63 0.8× 42 0.6× 47 2.4× 18 1.2× 31 263
A.T. Wu United States 13 417 0.8× 48 0.6× 104 1.5× 27 1.4× 10 0.7× 28 434
Mats O. Andersson Sweden 12 340 0.6× 79 1.0× 97 1.4× 17 0.8× 5 0.3× 20 358
C.D. Gunderson United States 6 237 0.4× 28 0.3× 46 0.6× 13 0.7× 8 0.5× 18 242
A. Naem Canada 9 272 0.5× 62 0.7× 105 1.5× 40 2.0× 7 0.5× 28 311
M. Hane Japan 13 422 0.8× 84 1.0× 72 1.0× 33 1.6× 17 1.1× 60 449

Countries citing papers authored by G.J. Hu

Since Specialization
Citations

This map shows the geographic impact of G.J. Hu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G.J. Hu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G.J. Hu more than expected).

Fields of papers citing papers by G.J. Hu

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by G.J. Hu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G.J. Hu. The network helps show where G.J. Hu may publish in the future.

Co-authorship network of co-authors of G.J. Hu

This figure shows the co-authorship network connecting the top 25 collaborators of G.J. Hu. A scholar is included among the top collaborators of G.J. Hu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with G.J. Hu. G.J. Hu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

12 of 12 papers shown
1.
Hu, G.J., et al.. (1986). Channel Length and Source/Drain Series Resistance Extraction for Conventional and LDD MOSFET's. Symposium on VLSI Technology. 29–30. 6 indexed citations
2.
Hu, G.J. & Richard H. Bruce. (1985). Design tradeoffs between surface and buried-channel FET's. IEEE Transactions on Electron Devices. 32(3). 584–588. 233 indexed citations
3.
Taur, Yuan, G.J. Hu, R.H. Dennard, et al.. (1985). A Self-Aliglned 1-/spl mu/m-Channel CMOS Technology with Retrograde n-Well and Thin Epitaxy. IEEE Journal of Solid-State Circuits. 20(1). 123–129. 15 indexed citations
4.
Hu, G.J. & Richard H. Bruce. (1984). A CMOS Structure with high latchup holding voltage. IEEE Electron Device Letters. 5(6). 211–214. 50 indexed citations
5.
Hu, G.J.. (1984). A better understanding of CMOS latch-up. IEEE Transactions on Electron Devices. 31(1). 62–67. 61 indexed citations
6.
Hu, G.J. & W. C. Johnson. (1983). Relationship between x-ray-produced holes and interface states in metal-oxide-semiconductor capacitors. Journal of Applied Physics. 54(3). 1441–1444. 48 indexed citations
7.
Hu, G.J., et al.. (1983). A self-aligned 1-µm CMOS technology for VLSI. 739–741. 2 indexed citations
8.
Hu, G.J., et al.. (1982). VA-6 two-dimensional simulation of latch-up in CMOS structure. IEEE Transactions on Electron Devices. 29(10). 1695–1695. 8 indexed citations
9.
Hu, G.J., C. Y. Ting, Y. Taur, & R.H. Dennard. (1982). Design and fabrication of p-channel FET for 1-µm CMOS technology. 710–713. 5 indexed citations
10.
Hu, G.J., J. Aitken, & R.H. Dennard. (1981). A Hardened Field Insulator. IEEE Transactions on Nuclear Science. 28(6). 4102–4104. 10 indexed citations
11.
Hu, G.J. & W. C. Johnson. (1980). Relationship between trapped holes and interface states in MOS capacitors. Applied Physics Letters. 36(7). 590–592. 104 indexed citations
12.
Hu, G.J.. (1979). Study of the generation of interface states in the Si-SiO2 system after high-field stress and after X-irradiation. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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