James W. Miller

764 citations
40 papers · 560 indexed · h-index 12
Topics
Electrostatic Discharge in Electronics (26 papers)Integrated Circuits and Semiconductor Failure Analysis (22 papers)Semiconductor materials and devices (14 papers)
Partner nations
United StatesFranceItaly

In The Last Decade

James W. Miller

36 papers receiving 444 citations

Peers

James W. Miller
Comparison fields: 5 of 67
  • Electrical and Electronic Engineering 477
  • Materials Chemistry 37
  • Atomic and Molecular Physics, and Optics 26
  • Hardware and Architecture 20
  • Aquatic Science 14
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Countries citing papers authored by James W. Miller

Since Specialization
Citations

This map shows the geographic impact of James W. Miller's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by James W. Miller with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites James W. Miller more than expected).

Fields of papers citing papers by James W. Miller

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by James W. Miller. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by James W. Miller. The network helps show where James W. Miller may publish in the future.

Co-authorship network of co-authors of James W. Miller

This figure shows the co-authorship network connecting the top 25 collaborators of James W. Miller. A scholar is included among the top collaborators of James W. Miller based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with James W. Miller. James W. Miller is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1
A co-optimization methodology on ESD robustness and functionality for pad-ring circuitry
1
2
Investigation of product burn-in failures due to powered NPN bipolar latching of active MOSFET rail clamps
9
3
A CDM robust 5V distributed ESD clamp network leveraging both active MOS and lateral NPN conduction
15
4
When good trigger circuits go bad: A case history
7
5
HBM ESD failures caused by a parasitic pre-discharge current spike
4
6
Characterization and modeling of three CMOS diode structures in the CDM to HBM timeframe
35
7 1
8
ESD protection for advanced CMOS SOI technologies
11
9 10
10
Boosted and distributed rail clamp networks for ESD protection in advanced CMOS technologies
73
11 24
12 1
13 2
14
Prediction of ESD protection levels and novel protection devices in thin film SOI technology
9
15 4
16 7
17 151
18 18
19 4
20 2

About James W. Miller

James W. Miller is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Fluid Flow and Transfer Processes, having authored 40 papers that have together received 560 indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (26 papers), Integrated Circuits and Semiconductor Failure Analysis (22 papers) and Semiconductor materials and devices (14 papers). The work is most often cited by research in Electrical and Electronic Engineering (477 citations), Business and International Management (10 citations) and Hardware and Architecture (20 citations). James W. Miller has collaborated with scholars based in United States, France and Italy. Frequent co-authors include Michael Stockinger, P.J. Tobin, J.D. Hayden, H.‐H. Tseng, L.C. Parrillo, T.C. Mele, C.D. Gunderson, J.R. Pfiester, F.K. Baker and Elyse Rosenbaum. Their work appears in journals such as Applied and Environmental Microbiology, Aquaculture and IEEE Transactions on Electron Devices.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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