P.G. Ryan

406 total citations
15 papers, 262 citations indexed

About

P.G. Ryan is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Control and Systems Engineering. According to data from OpenAlex, P.G. Ryan has authored 15 papers receiving a total of 262 indexed citations (citations by other indexed papers that have themselves been cited), including 12 papers in Electrical and Electronic Engineering, 11 papers in Hardware and Architecture and 3 papers in Control and Systems Engineering. Recurrent topics in P.G. Ryan's work include Integrated Circuits and Semiconductor Failure Analysis (12 papers), VLSI and Analog Circuit Testing (11 papers) and Radiation Effects in Electronics (7 papers). P.G. Ryan is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (12 papers), VLSI and Analog Circuit Testing (11 papers) and Radiation Effects in Electronics (7 papers). P.G. Ryan collaborates with scholars based in United States, Italy and Greece. P.G. Ryan's co-authors include W.K. Fuchs, Irith Pomeranz, Kee Sup Kim, Subhasish Mitra, Sumit Kumar Rawat, M. Sonza Reorda, Janusz Rajski, Jacob A. Abraham, Xinli Gu and Kevin Davis and has published in prestigious journals such as IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE Design & Test of Computers and International Conference on Computer Aided Design.

In The Last Decade

P.G. Ryan

14 papers receiving 250 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
P.G. Ryan United States	8	246	242	35	17	8	15	262
D.B.I. Feltham United States	9	308 1.3×	317 1.3×	30 0.9×	17 1.0×	12 1.5×	13	344
S.D. Millman United States	9	346 1.4×	341 1.4×	45 1.3×	14 0.8×	3 0.4×	14	356
I. Hartanto United States	8	373 1.5×	357 1.5×	68 1.9×	38 2.2×	4 0.5×	15	386
E. Volkerink United States	10	390 1.6×	381 1.6×	70 2.0×	18 1.1×	5 0.6×	12	402
P. Varma United States	7	295 1.2×	278 1.1×	53 1.5×	11 0.6×	4 0.5×	18	307
T.J. Chakraborty United States	12	504 2.0×	507 2.1×	28 0.8×	40 2.4×	7 0.9×	28	533
Yoshinobu Higami Japan	9	246 1.0×	255 1.1×	34 1.0×	26 1.5×	5 0.6×	93	286
H. Balachandran United States	10	304 1.2×	309 1.3×	31 0.9×	21 1.2×	3 0.4×	16	324
Shianling Wu United States	8	303 1.2×	299 1.2×	53 1.5×	12 0.7×	2 0.3×	23	313
N. Jarwala United States	6	119 0.5×	108 0.4×	21 0.6×	6 0.4×	5 0.6×	12	127

Countries citing papers authored by P.G. Ryan

Since Specialization

Citations

This map shows the geographic impact of P.G. Ryan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P.G. Ryan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P.G. Ryan more than expected).

Fields of papers citing papers by P.G. Ryan

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P.G. Ryan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P.G. Ryan. The network helps show where P.G. Ryan may publish in the future.

Co-authorship network of co-authors of P.G. Ryan

This figure shows the co-authorship network connecting the top 25 collaborators of P.G. Ryan. A scholar is included among the top collaborators of P.G. Ryan based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with P.G. Ryan. P.G. Ryan is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

15 of 15 papers shown

1.

Ryan, P.G., et al.. (2014). Process defect trends and strategic test gaps. 1–8. 20 indexed citations

2.

Abraham, Jacob A., Xinli Gu, Janusz Rajski, et al.. (2014). Special session 8B — Panel: In-field testing of SoC devices: Which solutions by which players?. 1–2. 5 indexed citations

3.

Ryan, P.G., Sumit Kumar Rawat, & W.K. Fuchs. (2005). TWO-STAGE FAULT LOCATION. 963–963. 16 indexed citations

4.

Ryan, P.G.. (2005). Real-time lossless image compression in a hardware environment. 2005. 68–73. 2 indexed citations

5.

Kim, Kee Sup, Subhasish Mitra, & P.G. Ryan. (2003). Delay defect characteristics and testing strategies. IEEE Design & Test of Computers. 20(5). 8–16. 67 indexed citations

6.

Ryan, P.G., Sumit Kumar Rawat, & W.K. Fuchs. (2002). Automated diagnosis of VLSI failures. 187–192. 7 indexed citations

7.

Ryan, P.G. & W.K. Fuchs. (2002). Partial detectability profiles. 372–375. 6 indexed citations

8.

Ryan, P.G. & W.K. Fuchs. (2002). Test set partitioning and dynamic fault dictionaries for sequential circuits. 179–184.

9.

Ryan, P.G.. (2002). Logical diagnosis solutions must drive yield improvement. 434–434. 4 indexed citations

10.

Ryan, P.G., W.K. Fuchs, & Irith Pomeranz. (2002). Fault dictionary compression and equivalence class computation for sequential circuits. 508–511. 48 indexed citations

11.

Ryan, P.G. & W.K. Fuchs. (1998). Dynamic fault dictionaries and two-stage fault isolation. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 6(1). 176–180. 13 indexed citations

12.

Ryan, P.G.. (1994). Compressed and Dynamic Fault Dictionaries for Fault Isolation. Illinois Digital Environment for Access to Learning and Scholarship (University of Illinois at Urbana-Champaign). 9 indexed citations

13.

Ryan, P.G., W.K. Fuchs, & Irith Pomeranz. (1993). Fault dictionary compression and equivalence class computation for sequential circuits. International Conference on Computer Aided Design. 508–511. 59 indexed citations

14.

Ryan, P.G., et al.. (1992). A case study of two-stage fault location. 332–337. 3 indexed citations

15.

Ryan, P.G., et al.. (1992). A Case Study of Two-Stage Fault Location. 332–337. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact