P.G. Ryan

414 citations
15 papers · 267 · h-index 8

Impact in

Papers in

Journals
IEEE Transactions on Very Large Scale Integration (VLSI) Systems (1 paper)International Conference on Computer Aided Design (1 paper)Illinois Digital Environment for Access to Learning and Scholarship (University of Illinois at Urbana-Champaign) (1 paper)IEEE Design & Test of Computers (1 paper)

In The Last Decade

P.G. Ryan

14 papers receiving 255 citations

Peers

P.G. Ryan
Comparison fields: 5 of 17
  • Hardware and Architecture 250
  • Software 17
  • Electrical and Electronic Engineering 246
  • Control and Systems Engineering 35
  • Industrial and Manufacturing Engineering 8
Replace D.B.I. Feltham with:
D.B.I. Feltham United States
S.D. Millman United States
Piet Engelke Germany
E. Volkerink United States
I. Hartanto United States
T.J. Chakraborty United States
Yoshinobu Higami Japan
H. Balachandran United States
Emil Gizdarski United States
Shianling Wu United States
P.G. Ryan relative to D.B.I. Feltham United States D.B.I. Feltham's profile →
Citations per field
00.5×
D.B.I. Feltham · 1×
Citations per year

Countries citing papers authored by P.G. Ryan

Since Specialization
Citations

This map shows the geographic impact of P.G. Ryan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P.G. Ryan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P.G. Ryan more than expected).

Fields of papers citing papers by P.G. Ryan

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P.G. Ryan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P.G. Ryan. The network helps show where P.G. Ryan may publish in the future.

Co-authors

The 11 scholars most cited alongside P.G. Ryan, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with P.G. Ryan Line = papers co-authored together P.G. Ryan links everyone, so they are left out of the graph.

All Works

15 of 15 papers shown
#Work
1 200367
2 199360
3 200248
4 201422
5 200517
6 199813
7
Compressed and Dynamic Fault Dictionaries for Fault Isolation
19949
8 20028
9 20026
10 20145
11 20024
12 19923
13 19923
14 20052
15 20020

About P.G. Ryan

P.G. Ryan is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Control and Systems Engineering, Computer Networks and Communications and Industrial and Manufacturing Engineering, having authored 15 papers that have together received 267 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (12 papers), VLSI and Analog Circuit Testing (11 papers), Radiation Effects in Electronics (7 papers), Engineering and Test Systems (2 papers), Advancements in Photolithography Techniques (2 papers), Industrial Vision Systems and Defect Detection (2 papers), Software System Performance and Reliability (1 paper) and Medical Image Segmentation Techniques (1 paper). The work is most often cited by research in Hardware and Architecture (250 citations), Software (17 citations), Electrical and Electronic Engineering (246 citations), Control and Systems Engineering (35 citations) and Industrial and Manufacturing Engineering (8 citations). P.G. Ryan has collaborated with scholars based in United States, Hungary and Greece. Frequent co-authors include W.K. Fuchs, Irith Pomeranz, Subhasish Mitra, Kee Sup Kim, Sumit Kumar Rawat, Jacob A. Abraham, Xinli Gu, Janusz Rajski, Dimitris Gizopoulos and M. Sonza Reorda. Their work appears in journals such as IEEE Transactions on Very Large Scale Integration (VLSI) Systems, International Conference on Computer Aided Design, Illinois Digital Environment for Access to Learning and Scholarship (University of Illinois at Urbana-Champaign) and IEEE Design & Test of Computers.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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