S.D. Millman

596 total citations
14 papers, 356 citations indexed

About

S.D. Millman is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Control and Systems Engineering. According to data from OpenAlex, S.D. Millman has authored 14 papers receiving a total of 356 indexed citations (citations by other indexed papers that have themselves been cited), including 14 papers in Electrical and Electronic Engineering, 13 papers in Hardware and Architecture and 1 paper in Control and Systems Engineering. Recurrent topics in S.D. Millman's work include VLSI and Analog Circuit Testing (13 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers) and Radiation Effects in Electronics (7 papers). S.D. Millman is often cited by papers focused on VLSI and Analog Circuit Testing (13 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers) and Radiation Effects in Electronics (7 papers). S.D. Millman collaborates with scholars based in United States. S.D. Millman's co-authors include John M. Acken and E.J. McCluskey and has published in prestigious journals such as IEEE Journal of Solid-State Circuits and Journal of Electronic Testing.

In The Last Decade

S.D. Millman

13 papers receiving 333 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
S.D. Millman United States	9	346	341	45	15	14	14	356
W. Needham United States	7	326 0.9×	355 1.0×	30 0.7×	9 0.6×	10 0.7×	9	371
D.B.I. Feltham United States	9	308 0.9×	317 0.9×	30 0.7×	13 0.9×	17 1.2×	13	344
P.G. Ryan United States	8	246 0.7×	242 0.7×	35 0.8×	7 0.5×	17 1.2×	15	262
I. Hartanto United States	8	373 1.1×	357 1.0×	68 1.5×	12 0.8×	38 2.7×	15	386
Emil Gizdarski United States	9	345 1.0×	343 1.0×	63 1.4×	10 0.7×	15 1.1×	24	356
P. Varma United States	7	295 0.9×	278 0.8×	53 1.2×	6 0.4×	11 0.8×	18	307
E. Volkerink United States	10	390 1.1×	381 1.1×	70 1.6×	4 0.3×	18 1.3×	12	402
Srikanth Venkataraman United States	11	395 1.1×	387 1.1×	42 0.9×	23 1.5×	43 3.1×	33	408
Vivek Chickermane United States	15	573 1.7×	597 1.8×	50 1.1×	4 0.3×	19 1.4×	43	623
Yoshinobu Higami Japan	9	246 0.7×	255 0.7×	34 0.8×	6 0.4×	26 1.9×	93	286

Countries citing papers authored by S.D. Millman

Since Specialization

Citations

This map shows the geographic impact of S.D. Millman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S.D. Millman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S.D. Millman more than expected).

Fields of papers citing papers by S.D. Millman

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S.D. Millman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S.D. Millman. The network helps show where S.D. Millman may publish in the future.

Co-authorship network of co-authors of S.D. Millman

This figure shows the co-authorship network connecting the top 25 collaborators of S.D. Millman. A scholar is included among the top collaborators of S.D. Millman based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S.D. Millman. S.D. Millman is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

14 of 14 papers shown

1.

Millman, S.D., et al.. (2005). AN ACCURATE BRIDGING FAULT TEST PATTERN GENERATOR. 411–411. 17 indexed citations

2.

Millman, S.D. & E.J. McCluskey. (2003). Detecting bridging faults with stuck-at test sets. 773–783. 26 indexed citations

3.

Millman, S.D., et al.. (2002). Accurate modeling and simulation of bridging faults. 17.4/1–17.4/4. 62 indexed citations

4.

Millman, S.D., E.J. McCluskey, & John M. Acken. (2002). Diagnosing CMOS bridging faults with stuck-at fault dictionaries. 860–870. 115 indexed citations

5.

Millman, S.D. & E.J. McCluskey. (2002). Bridging, transition, and stuck-open faults in self-testing CMOS checkers. 154–161. 4 indexed citations

6.

Millman, S.D., et al.. (2002). Visualizing test information: A novel approach for improving testability. 149–156. 1 indexed citations

7.

Millman, S.D.. (2002). WSI evolution: increasing cell size to generalize designs. 25. 163–168. 1 indexed citations

8.

Millman, S.D. & John M. Acken. (2002). Diagnosing CMOS bridging faults with stuck-at, IDDQ, and voting model fault dictionaries. 409–412. 11 indexed citations

9.

Millman, S.D. & John M. Acken. (2002). Standard cell library characterization for setting current limits for I/sub DDQ/ testing. 41–44. 3 indexed citations

10.

Millman, S.D.. (2002). Improving quality: yield vs. test coverage (WSI). 279–288. 2 indexed citations

11.

Millman, S.D.. (1994). Improving quality: Yield versus test coverage. Journal of Electronic Testing. 5(2-3). 253–261. 8 indexed citations

12.

Millman, S.D. & John M. Acken. (1994). Special applications of the voting model for bridging faults. IEEE Journal of Solid-State Circuits. 29(3). 263–270. 20 indexed citations

13.

Acken, John M. & S.D. Millman. (1992). Fault Model Evolution For Diagnosis: Accuracy vs Precision. 13.4.1–13.4.4. 68 indexed citations

14.

Millman, S.D. & E.J. McCluskey. (1989). Detecting stuck-open faults with stuck-at test sets. 22.3/1–22.3/4. 18 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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