S.M. Reddy

14.8k total citations · 1 hit paper
598 papers, 10.6k citations indexed

About

S.M. Reddy is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Control and Systems Engineering. According to data from OpenAlex, S.M. Reddy has authored 598 papers receiving a total of 10.6k indexed citations (citations by other indexed papers that have themselves been cited), including 554 papers in Hardware and Architecture, 552 papers in Electrical and Electronic Engineering and 46 papers in Control and Systems Engineering. Recurrent topics in S.M. Reddy's work include VLSI and Analog Circuit Testing (544 papers), Integrated Circuits and Semiconductor Failure Analysis (457 papers) and Radiation Effects in Electronics (192 papers). S.M. Reddy is often cited by papers focused on VLSI and Analog Circuit Testing (544 papers), Integrated Circuits and Semiconductor Failure Analysis (457 papers) and Radiation Effects in Electronics (192 papers). S.M. Reddy collaborates with scholars based in United States, Germany and Hungary. S.M. Reddy's co-authors include Irith Pomeranz, Seiji Kajihara, Janusz Rajski, Wu-Tung Cheng, Sandip Kundu, Jon G. Kuhl, Lakshmi Reddy, Xijiang Lin, Kewal K. Saluja and Yu Huang and has published in prestigious journals such as IEEE Transactions on Information Theory, IEEE Transactions on Computers and Electronics Letters.

In The Last Decade

S.M. Reddy

562 papers receiving 10.1k citations

Hit Papers

On Delay Fault Testing in Logic Circuits 1987 2026 2000 2013 1987 100 200 300 400
What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

  1. On Delay Fault Testing in Logic Circuits
    1987 468 citations S.M. Reddy et al. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems profile →

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
S.M. Reddy United States 48 9.7k 9.6k 1.0k 692 661 598 10.6k
Irith Pomeranz United States 42 7.6k 0.8× 7.6k 0.8× 859 0.8× 511 0.7× 685 1.0× 650 8.0k
M. Sonza Reorda Italy 38 5.3k 0.5× 5.5k 0.6× 521 0.5× 779 1.1× 1.2k 1.9× 543 6.5k
Vishwani D. Agrawal United States 40 6.3k 0.7× 6.5k 0.7× 624 0.6× 304 0.4× 442 0.7× 375 7.4k
M. Abramovici United States 32 4.2k 0.4× 3.9k 0.4× 328 0.3× 241 0.3× 350 0.5× 88 4.6k
Melvin A. Breuer United States 22 3.1k 0.3× 3.1k 0.3× 337 0.3× 339 0.5× 307 0.5× 91 3.8k
Y. Zorian United States 35 4.1k 0.4× 4.3k 0.4× 495 0.5× 564 0.8× 179 0.3× 222 4.9k
Janusz Rajski United States 37 4.6k 0.5× 4.5k 0.5× 682 0.7× 121 0.2× 202 0.3× 214 4.8k
Dhiraj K. Pradhan United States 35 2.5k 0.3× 3.1k 0.3× 269 0.3× 1.9k 2.7× 275 0.4× 290 4.8k
F. Brglez United States 22 2.7k 0.3× 2.6k 0.3× 220 0.2× 226 0.3× 276 0.4× 92 3.2k
Kewal K. Saluja United States 34 3.1k 0.3× 3.4k 0.4× 419 0.4× 1.1k 1.5× 155 0.2× 232 4.2k

Countries citing papers authored by S.M. Reddy

Since Specialization
Citations

This map shows the geographic impact of S.M. Reddy's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S.M. Reddy with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S.M. Reddy more than expected).

Fields of papers citing papers by S.M. Reddy

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S.M. Reddy. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S.M. Reddy. The network helps show where S.M. Reddy may publish in the future.

Co-authorship network of co-authors of S.M. Reddy

This figure shows the co-authorship network connecting the top 25 collaborators of S.M. Reddy. A scholar is included among the top collaborators of S.M. Reddy based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S.M. Reddy. S.M. Reddy is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Lee, Kuen-Jong, et al.. (2021). Efficient Test Compression Configuration Selection. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41(7). 2323–2336. 5 indexed citations
2.
Mukherjee, Nilanjan, et al.. (2019). Deterministic Stellar BIST for Automotive ICs. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 39(8). 1699–1710. 11 indexed citations
3.
Rossi, Daniele, et al.. (2017). Exploiting Aging Benefits for the Design of Reliable Drowsy Cache Memories. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 37(7). 1345–1357. 8 indexed citations
4.
Pomeranz, Irith & S.M. Reddy. (2010). Functional and partially-functional skewed-load tests. Asia and South Pacific Design Automation Conference. 505–510. 2 indexed citations
5.
Zou, Wei, Wu-Tung Cheng, & S.M. Reddy. (2006). Interconnect Open Defect Diagnosis with Physical Information. 203–209. 24 indexed citations
6.
Du, Xiaogang, Nilanjan Mukherjee, Chris Hill, Wu-Tung Cheng, & S.M. Reddy. (2006). A Field Programmable Memory BIST Architecture Supporting Algorithms with Multiple Nested Loops. 287–292. 15 indexed citations
7.
Kajihara, Seiji, et al.. (2004). Don't Care Identification and Statistical Encoding for Test Data Compression. IEICE Transactions on Information and Systems. 87(3). 544–550. 1 indexed citations
8.
Li, Wei, et al.. (2003). An Improved Markov Source Design for Scan BIST. 106–110. 4 indexed citations
9.
Polian, Ilia, Bernd Becker, & S.M. Reddy. (2003). Evolutionary Optimization of Markov Sources for Pseudo Random Scan BIST. Design, Automation, and Test in Europe. 11184–11185. 7 indexed citations
10.
Pomeranz, Irith & S.M. Reddy. (2003). A New Approach to Test Generation and Test Compaction for Scan Circuits. Design, Automation, and Test in Europe. 11000–11005. 14 indexed citations
11.
Pomeranz, Irith & S.M. Reddy. (1997). Built-in test generation for synchronous sequential circuits. International Conference on Computer Aided Design. 421–426. 20 indexed citations
12.
Pomeranz, Irith & S.M. Reddy. (1994). On testing delay faults in macro-based combinational circuits. International Conference on Computer Aided Design. 332–339. 24 indexed citations
13.
Reddy, Lakshmi, Irith Pomeranz, & S.M. Reddy. (1992). COMPACTEST-II: a method to generate compact two-pattern test sets for combinational logic circuits. International Conference on Computer Aided Design. 568–574. 10 indexed citations
14.
Lee, Dong-Ho & S.M. Reddy. (1992). On efficient concurrent fault simulation for synchronous sequential circuits. Design Automation Conference. 327–331. 2 indexed citations
15.
Pomeranz, Irith & S.M. Reddy. (1992). On the generation of small dictionaries for fault location. International Conference on Computer Aided Design. 272–279. 11 indexed citations
16.
Pomeranz, Irith, Lakshmi Reddy, & S.M. Reddy. (1992). SPADES: a simulator for path delay faults in sequential circuits. European Design Automation Conference. 428–435. 32 indexed citations
17.
Reddy, S.M., Kewal K. Saluja, & Mark G. Karpovsky. (1989). Correction to A Data Compression Technique for Built-In Self-Test. IEEE Transactions on Computers. 38(2). 320. 1 indexed citations
18.
Ha, Dong Sam & S.M. Reddy. (1986). On the Design of Random Pattern Testable PLAs.. International Test Conference. 688–695. 13 indexed citations
19.
Reddy, S.M., et al.. (1985). On Multipath Multistage Interconnection Networks.. International Conference on Distributed Computing Systems. 210–217. 2 indexed citations
20.
Ha, Dong Sam & S.M. Reddy. (1985). On the Design of Testable Domino PLAs.. International Test Conference. 567–573. 11 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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Breakdown of academic impact, for papers by Irith Pomeranz Breakdown of academic impact, for papers by M. Sonza Reorda Breakdown of academic impact, for papers by Vishwani D. Agrawal Breakdown of academic impact, for papers by M. Abramovici Breakdown of academic impact, for papers by Melvin A. Breuer Breakdown of academic impact, for papers by Y. Zorian Breakdown of academic impact, for papers by Janusz Rajski Breakdown of academic impact, for papers by Dhiraj K. Pradhan Breakdown of academic impact, for papers by F. Brglez Breakdown of academic impact, for papers by Kewal K. Saluja
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