C.K. Chen

793 citations

25 papers · 560 indexed · h-index 10

Impact in

Electrical and Electronic Engineering top 10%
- 3D IC and TSV technologies
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Electronic Packaging and Soldering Technologies
- Thin-Film Transistor Technologies
- CCD and CMOS Imaging Sensors
Automotive Engineering top 10%
- Additive Manufacturing and 3D Printing Technologies

Papers in

Electrical and Electronic Engineering 23
- Semiconductor materials and devices 11
- 3D IC and TSV technologies 8
- Advancements in Semiconductor Devices and Circuit Design 8
- Thin-Film Transistor Technologies 7
- Photonic and Optical Devices 4
- Radio Frequency Integrated Circuit Design 3
Atomic and Molecular Physics, and Optics 5
- Semiconductor Quantum Structures and Devices 4
- Semiconductor materials and interfaces 3

Co-authors: B-Y. Tsaur J.M. Knecht D. Yost C.L. Keast J.A. Burns P.W. Wyatt Vyshnavi Suntharalingam K. Warner
Journals: IEEE Electron Device Letters (8 papers)IEEE Transactions on Electron Devices (2 papers)Microelectronic Engineering (1 paper)Electronics Letters (1 paper)IEEE Photonics Technology Letters (1 paper)
Partner nations: United States

In The Last Decade

C.K. Chen

25 papers receiving 514 citations

Peers

Countries citing papers authored by C.K. Chen

Since Specialization

Citations

This map shows the geographic impact of C.K. Chen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C.K. Chen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C.K. Chen more than expected).

Fields of papers citing papers by C.K. Chen

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C.K. Chen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C.K. Chen. The network helps show where C.K. Chen may publish in the future.

Co-authorship network

The 25 scholars most cited alongside C.K. Chen, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with C.K. Chen Line = papers co-authored together C.K. Chen links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Wafer-scale 3D integration of InGaAs photodiode arrays with Si readout circuits by oxide bonding and through-oxide vias Microelectronic Engineering ·Feifei Ran, Feifei Ran, D. Yost, J.M. Knecht, Samantha Barrios, David Chapman, Douglas C. Oakley, A.M. Soares, L.J. Mahoney, J.P. Donnelly, C.K. Chen, Vyshnavi Suntharalingam, R. Berger, Wenqian Hu, Pramote Laoprapaipan, C.L. Keast, David C. Shaver	2010	9
2	SOI-enabled three-dimensional integrated-circuit technology C.K. Chen, WK McShane, D. Yost, J.M. Knecht, Mia Stiernman, C.L. Keast	2010	8
3	Three-dimensional integration of silicon-on-insulator RF amplifier Electronics Letters ·Mia Stiernman, C.K. Chen, D. Yost, J.M. Knecht, P.W. Wyatt, J.A. Burns, K. Warner, Pascale Gouker, Jacqueline Tellinga, WK McShane, C.L. Keast	2008	8
4	Characterization of a three-dimensional SOI integrated-circuit technology C.K. Chen, Pradeep Balachandran, Brian Tyrrell, Mia Stiernman, P.W. Wyatt, D. Yost, J.M. Knecht, J. Kedzierski, C.L. Keast	2008	5
5	Fully Depleted SOI RF Switch with Dynamic Biasing Mia Stiernman, C.K. Chen, P.W. Wyatt, J.M. Knecht, D. Yost, Pascale Gouker, Paul Healey, C.L. Keast	2007	7
6	Thermal Effects of Three Dimensional Integrated Circuit Stacks Mia Stiernman, C.K. Chen, J.A. Burns, D. Yost, K. Warner, J.M. Knecht, P.W. Wyatt, F. Selman, C.L. Keast	2007	9
7	Scaling Three-Dimensional SOI Integrated-Circuit Technology C.K. Chen, K. Warner, D. Yost, J.M. Knecht, Vyshnavi Suntharalingam, Mia Stiernman, J.A. Burns, C.L. Keast	2007	8
8	A wafer-scale 3-D circuit integration technology IEEE Transactions on Electron Devices ·J.A. Burns, Brian F. Aull, C.K. Chen, Chang‐Lee Chen, C.L. Keast, J.M. Knecht, Vyshnavi Suntharalingam, K. Warner, P.W. Wyatt, D. Yost	2006	192
9	3D Via Etch Development for 3D Circuit Integration in FDSOI J.M. Knecht, D. Yost, J.A. Burns, C.K. Chen, C.L. Keast, K. Warner	2006	2
10	X-band fully depleted SOI Amplifier with adaptive bias control IEEE Microwave and Wireless Components Letters ·Mia Stiernman, P.W. Wyatt, C.K. Chen, J.M. Knecht, D. Yost, Jeremías P. Puente, C.L. Keast	2005	2
11	Megapixel CMOS image sensor fabricated in three-dimensional integrated circuit technology Vyshnavi Suntharalingam, R. Berger, J.A. Burns, C.K. Chen, C.L. Keast, J.M. Knecht, 杨其华, Francesco Dragone, Jacqueline Moraes Teixeira, D.D. Rathman, David C. Shaver, A.M. Soares, Sindy Sin, Brian Tyrrell, K. Warner, Pramote Laoprapaipan, D. Yost, Douglas Young	2005	88
12	Enhanced resolution for future fabrication IEEE Circuits and Devices Magazine ·M. Fritze, C.K. Chen, 何鹏彬, D. Yost, J.A. Burns, Chang‐Lee Chen, Pascale Gouker, Vyshnavi Suntharalingam, P.W. Wyatt, C.L. Keast	2003	3
13	SLOTFET fabrication of self-aligned sub-100-nm fully-depleted SOI CMOS C.K. Chen, Saba Ghalib, Pascale Gouker, P.W. Wyatt, D. Yost, J.A. Burns, Vyshnavi Suntharalingam, M. Fritze, C.L. Keast	2002	2
14	High-performance fully-depleted SOI RF CMOS IEEE Electron Device Letters ·Mia Stiernman, S. J. Spector, E. V. Chernyavskii, R. Neidhard, W. T. Beard, D. Yost, J.M. Knecht, C.K. Chen, M. Fritze, أسماء عبد المنعم المهر, Mohammad I. Sheikh, P.W. Wyatt, C.L. Keast	2002	23
15	Ultraviolet, visible, and infrared response of PtSi Schottky-barrier detectors operated in the front-illuminated mode IEEE Transactions on Electron Devices ·C.K. Chen, Bettina Nechay, B-Y. Tsaur	1991	42
16	Through-wafer optical communication using monolithic InGaAs-on-Si LEDs and monolithic PtSi-Si Schottky-barrier detectors IEEE Photonics Technology Letters ·G. W. Turner, C.K. Chen, B-Y. Tsaur, Allen M. Waxman	1991	9
17	PtSi Schottky-barrier focal plane arrays for multispectral imaging in ultraviolet, visible, and infrared spectral bands IEEE Electron Device Letters ·B-Y. Tsaur, C.K. Chen, J.P. Mattia	1990	15
18	IrSi Schottky-barrier infrared detectors with wavelength response beyond 12 mu m IEEE Electron Device Letters ·B-Y. Tsaur, C.K. Chen, Bettina Nechay	1990	30
19	Merged CMOS/bipolar technologies utilizing zone-melting-recrystallized SOI films IEEE Electron Device Letters ·B-Y. Tsaur, R. W. Mountain, C.K. Chen, J. C. C. Fan	1984	5
20	Effects of ionizing radiation on SOI/CMOS Devices fabricated in zone-melting-recrystallized Si films on SiO₂ IEEE Electron Device Letters ·B-Y. Tsaur, R. W. Mountain, C.K. Chen, G. W. Turner, J. C. C. Fan	1984	17

About C.K. Chen

C.K. Chen is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Biomedical Engineering, Condensed Matter Physics and Automotive Engineering, having authored 25 papers that have together received 560 indexed citations. Recurring topics across this work include Semiconductor materials and devices (11 papers), 3D IC and TSV technologies (8 papers), Advancements in Semiconductor Devices and Circuit Design (8 papers), Thin-Film Transistor Technologies (7 papers), Photonic and Optical Devices (4 papers), Semiconductor Quantum Structures and Devices (4 papers), Radio Frequency Integrated Circuit Design (3 papers) and Semiconductor materials and interfaces (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (525 citations), Automotive Engineering (56 citations), Hardware and Architecture (25 citations), Atomic and Molecular Physics, and Optics (111 citations) and Instrumentation (11 citations). C.K. Chen has collaborated with scholars based in United States. Frequent co-authors include B-Y. Tsaur, J.M. Knecht, D. Yost, C.L. Keast, J.A. Burns, P.W. Wyatt, Vyshnavi Suntharalingam, K. Warner, Bettina Nechay and Chang‐Lee Chen. Their work appears in journals such as IEEE Electron Device Letters, IEEE Transactions on Electron Devices, Microelectronic Engineering, Electronics Letters and IEEE Photonics Technology Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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