W. T. Beard

870 total citations
24 papers, 660 citations indexed

About

W. T. Beard is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Radiation. According to data from OpenAlex, W. T. Beard has authored 24 papers receiving a total of 660 indexed citations (citations by other indexed papers that have themselves been cited), including 17 papers in Electrical and Electronic Engineering, 14 papers in Atomic and Molecular Physics, and Optics and 4 papers in Radiation. Recurrent topics in W. T. Beard's work include Semiconductor Quantum Structures and Devices (11 papers), Semiconductor materials and devices (9 papers) and Quantum and electron transport phenomena (5 papers). W. T. Beard is often cited by papers focused on Semiconductor Quantum Structures and Devices (11 papers), Semiconductor materials and devices (9 papers) and Quantum and electron transport phenomena (5 papers). W. T. Beard collaborates with scholars based in United States. W. T. Beard's co-authors include B. V. Shanabrook, O. J. Glembocki, J. Comas, N. Bottka, D.R. Stone, B. D. McCombe, H. Shen, Fred H. Pollak, P. Parayanthal and R. A. Wilson and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

W. T. Beard

24 papers receiving 643 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
W. T. Beard United States 12 560 505 89 73 46 24 660
S. N. G. Chu United States 11 368 0.7× 331 0.7× 89 1.0× 47 0.6× 34 0.7× 26 434
O. Hildebrand Germany 15 502 0.9× 494 1.0× 91 1.0× 41 0.6× 55 1.2× 35 664
Y. F. Lin United States 11 451 0.8× 541 1.1× 98 1.1× 50 0.7× 85 1.8× 21 643
John P. Loehr United States 14 429 0.8× 395 0.8× 68 0.8× 53 0.7× 64 1.4× 48 510
S. K. Sputz United States 13 626 1.1× 494 1.0× 222 2.5× 74 1.0× 44 1.0× 36 711
B. Elman United States 16 767 1.4× 668 1.3× 164 1.8× 63 0.9× 70 1.5× 45 874
A. Valster Netherlands 15 516 0.9× 514 1.0× 65 0.7× 46 0.6× 47 1.0× 38 604
K.H. Gulden Switzerland 12 291 0.5× 361 0.7× 67 0.8× 70 1.0× 32 0.7× 47 454
R. Blondeau France 15 529 0.9× 754 1.5× 49 0.6× 55 0.8× 31 0.7× 60 807
S. Chaudhuri United States 12 606 1.1× 329 0.7× 147 1.7× 100 1.4× 40 0.9× 24 678

Countries citing papers authored by W. T. Beard

Since Specialization
Citations

This map shows the geographic impact of W. T. Beard's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W. T. Beard with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W. T. Beard more than expected).

Fields of papers citing papers by W. T. Beard

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by W. T. Beard. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W. T. Beard. The network helps show where W. T. Beard may publish in the future.

Co-authorship network of co-authors of W. T. Beard

This figure shows the co-authorship network connecting the top 25 collaborators of W. T. Beard. A scholar is included among the top collaborators of W. T. Beard based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with W. T. Beard. W. T. Beard is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Burns, J.A., et al.. (2002). RF characterisation of fully depleted SOI MOSFET with Si substrate removed. Electronics Letters. 38(5). 256–257. 3 indexed citations
2.
Spector, S. J., R. Neidhard, W. T. Beard, et al.. (2002). High-performance fully-depleted SOI RF CMOS. IEEE Electron Device Letters. 23(1). 52–54. 23 indexed citations
3.
Beard, W. T., et al.. (2001). Integrated photonic inverter with gain. IEEE Photonics Technology Letters. 13(5). 478–480. 5 indexed citations
4.
Chen, Wei, et al.. (2001). The role of photomask resolution on the performance of arrayed-waveguide grating devices. Journal of Lightwave Technology. 19(11). 1726–1733. 35 indexed citations
5.
Chen, Wei, et al.. (2000). Role of photomask resolution on the performance of arrayed-waveguide grating devices. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4087. 283–283. 2 indexed citations
6.
Phaneuf, R. J., et al.. (1999). Nonuniversality in mound formation during semiconductor growth. Physical review. B, Condensed matter. 60(12). R8469–R8472. 19 indexed citations
7.
Johnson, F.G., et al.. (1997). Air-bridges, air-ramps, planarization, and encapsulation using pyrolytic photoresist in the fabrication of three-dimensional microstructures. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 15(6). 1961–1965. 6 indexed citations
8.
Armstrong, R. W., et al.. (1997). {7 6 6} Oriented V-groove surfaces on Br2–CH3OH etched (1 0 0) GaAs wafers. Journal of Materials Science Materials in Electronics. 8(2). 109–113. 1 indexed citations
9.
Armstrong, R. W., et al.. (1997). High-resolution imaging of electronic devices using line modified-asymmetric crystal topography (LM-ACT). Il Nuovo Cimento D. 19(2-4). 147–152. 1 indexed citations
10.
Beard, W. T., et al.. (1996). High resolution imaging of electronic devices via x-ray diffraction topography. Applied Physics Letters. 69(4). 488–490. 2 indexed citations
11.
12.
Chang-yi, LU, James R. Anderson, D.R. Stone, W. T. Beard, & R. A. Wilson. (1990). Photoreflectance study of the internal electric fields at the n-type GaAs surface and across the n-type GaAs/substrate interface. Superlattices and Microstructures. 8(2). 155–157. 8 indexed citations
13.
McCombe, B. D., et al.. (1988). Barrier impurity states in modulation doped AlGaAs/GaAs multi-quantum wells. Surface Science. 196(1-3). 334–338. 13 indexed citations
14.
Glaser, E. R., B. V. Shanabrook, R. L. Hawkins, et al.. (1987). Far-infrared magnetoabsorption study of weakly bound electrons inGaAs/AlxGa1−xAsmultiple quantum wells. Physical review. B, Condensed matter. 36(15). 8185–8188. 36 indexed citations
15.
Shanabrook, B. V., O. J. Glembocki, & W. T. Beard. (1987). Photoreflectance modulation mechanisms in GaAs-AlxGa1−xAs multiple quantum wells. Physical review. B, Condensed matter. 35(5). 2540–2543. 198 indexed citations
16.
Glembocki, O. J., B. V. Shanabrook, N. Bottka, W. T. Beard, & J. Comas. (1985). Photoreflectance characterization of interband transitions in GaAs/AlGaAs multiple quantum wells and modulation-doped heterojunctions. Applied Physics Letters. 46(10). 970–972. 180 indexed citations
17.
Gammon, D., et al.. (1985). Raman scattering and photoluminescence studies of two-dimensional electron systems in Ge/GaAs heterostructures. Superlattices and Microstructures. 1(2). 161–164. 2 indexed citations
18.
Reddy, U. K., et al.. (1985). Interband transitions in molecular-beam-epitaxial AlxGa1−xAs/GaAs. Journal of Applied Physics. 58(1). 495–498. 16 indexed citations
19.
Glembocki, O. J., B. V. Shanabrook, N. Bottka, W. T. Beard, & J. Comas. (1985). Photoreflectance Characterization Of GaAs/A1GaAs Thin Films, Heterojunctions And Multiple Quantum Well Structures. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 524. 86–86. 10 indexed citations
20.
Merlín, R., et al.. (1982). Light scattering study of electrons confined at Ge/GaAs interfaces. Journal of Vacuum Science and Technology. 21(2). 516–518. 13 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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