D.D. Rathman

1.2k citations

39 papers · 822 indexed · h-index 13

Impact in

Electrical and Electronic Engineering top 10%
- Semiconductor materials and devices
- Silicon and Solar Cell Technologies
- CCD and CMOS Imaging Sensors
- Thin-Film Transistor Technologies
Materials Chemistry
- Diamond and Carbon-based Materials Research

Papers in

Instrumentation 7
- Advanced Optical Sensing Technologies 7
Electrical and Electronic Engineering 34
- CCD and CMOS Imaging Sensors 14
- Semiconductor materials and devices 11
- Advancements in Semiconductor Devices and Circuit Design 8
- Thin-Film Transistor Technologies 7

Co-authors: M. W. Geis D. J. Silversmith D. J. Ehrlich R.A. Murphy Thomas F. Deutsch W.T. Lindley R. W. Mountain N. N. Efremow
Journals: Applied Physics Letters (4 papers)IEEE Electron Device Letters (2 papers)IEEE Transactions on Electron Devices (2 papers)IEEE Journal of Solid-State Circuits (1 paper)Journal of Applied Physics (1 paper)
Partner nations: United States

In The Last Decade

D.D. Rathman

34 papers receiving 773 citations

Peers

Countries citing papers authored by D.D. Rathman

Since Specialization

Citations

This map shows the geographic impact of D.D. Rathman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D.D. Rathman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D.D. Rathman more than expected).

Fields of papers citing papers by D.D. Rathman

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D.D. Rathman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D.D. Rathman. The network helps show where D.D. Rathman may publish in the future.

Co-authorship network

The 25 scholars most cited alongside D.D. Rathman, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with D.D. Rathman Line = papers co-authored together D.D. Rathman links everyone, so they are left out of the graph.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work
1	A 4-side tileable back illuminated 3D-integrated Mpixel CMOS image sensor Vyshnavi Suntharalingam, R. Berger, Jim Clark, J.M. Knecht, Jørund Hop, Francesco Dragone, D.D. Rathman, Burke Ml, A.M. Soares, Charles S. Stevenson, K. Warner, Douglas Young, Дубровська Дар’я Ігорівна, Ccrn Barbara A. Nickel Aprn-Cns, David C. Shaver	2009	30
2	Mpixel CMOS Image Sensor Vyshnavi Suntharalingam, Robert Berger, D'Amore Mario, Lee Eun Sung, Jørund Hop, Francesco Dragone, D.D. Rathman, Cristina Nunes, Mughees Bhalli, Sindy Sin, K. Warner, Douglas Young, Дубровська Дар’я Ігорівна, Ccrn Barbara A. Nickel Aprn-Cns, David C. Shaver, Wilhelm Wernet, C Lamprinopoulos	2009	0
3	Deep-Trench Process Technology for Three-Dimensionally Integrated SOI-Based Image Sensors Douglas Young, J.M. Knecht, D.D. Rathman, K. Warner, Phyllis A. Gimotty, Francesco Dragone, Vyshnavi Suntharalingam	2007	3
4	Lincoln Laboratory high-speed solid-state imager technology Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·R. Reich, D.D. Rathman, Jacqueline Moraes Teixeira, Douglas Young, Andrew H. Loomis, Richard M. Osgood, R.A. Murphy, Mario Casalla, R. Berger, Brian Tyrrell, Otto Ferney Bayona Peñaloza, J. Nicpon, T. S. Perry, F. Weber, H. F. Robey	2007	6
5	Megapixel CMOS image sensor fabricated in three-dimensional integrated circuit technology Vyshnavi Suntharalingam, R. Berger, J.A. Burns, C.K. Chen, C.L. Keast, J.M. Knecht, 杨其华, Francesco Dragone, Jacqueline Moraes Teixeira, D.D. Rathman, David C. Shaver, A.M. Soares, Sindy Sin, Brian Tyrrell, K. Warner, Pramote Laoprapaipan, D. Yost, Douglas Young	2005	88
6	A high-frame-rate DUV-optimized CCD for simultaneous measurements of illumination intensity, polarization amplitude, and polarization direction for very high NA imaging systems Roderick R. Kunz, D.D. Rathman, S. J. Spector, Mario Casalla, Michael Yeung	2005	2
7	High-fill-factor burst-frame-rate charge-coupled device Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·R. Reich, Jacqueline Moraes Teixeira, Douglas Young, Andrew H. Loomis, D.D. Rathman, David Craig, Otto Ferney Bayona Peñaloza, J. Nicpon, B. B. Kosicki	2004	1
8	Three-dimensional imaging with arrays of geiger-mode avalanche photodiodes Conference on Lasers and Electro-Optics ·Beatriz Menezes Santos, Andrew H. Loomis, Douglas Young, Alan H. Stern, Caidan Zhuoma, P. Daniels, Lina Han, D.D. Rathman, Aichun Zhu, Richard M. Marino, Trisnawati Habibie, Chad J. Layton, James Mooney, M. O’Brien, Muhammad R. Yamani, Bernice Amanda Mendoza, J. J. Zayhowski	2003	4
9	CCD soft-x-ray detectors with improved high- and low-energy performance 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515) ·Barry E. Burke, John Gregory, Andrew H. Loomis, Michael P. Lesser, Marshall W. Bautz, Steve Kissel, D.D. Rathman, R. M. Osgood, Michael Cooper	2003	1
10	High-fill-factor, burst-frame-rate charge-coupled device R. Reich, Jacqueline Moraes Teixeira, Douglas Young, Andrew H. Loomis, D.D. Rathman, David Craig, Otto Ferney Bayona Peñaloza, J. Nicpon, B. B. Kosicki	2002	1
11	High-density gated field-emitter arrays C. O. Bozler, D.D. Rathman, C.T. Harris, G. A. Lincoln, S. Rabe, R.A. Murphy, M.A. Hollis, Henry I. Smith	1995	0
12	Bright-field analysis of field-emission cones using high-resolution transmission electron microscopy and the effect of structural properties on current stability Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·W. D. Goodhue, Jung Gun Young, C.T. Harris, C. O. Bozler, D.D. Rathman, Р Р Краснова, M.A. Hollis	1994	11
13	<title>Genosensors: microfabricated devices for automated DNA sequence analysis</title> Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·M. Eggers, Michael E. Hogan, R. Reich, Jagannath B. Lamture, Murat Alp, M.A. Hollis, Daniel J. Ehrlich, B. B. Kosicki, Hifaa Alajmi, R.G. Christopher Turner, Barry E. Burke, Attilla Turkes, D.D. Rathman	1993	5
14	Arrays Of Gated Field-emitter Cones Having 0.32-/spl mu/m Tip-to-tip Spacings C. O. Bozler, C.T. Harris, S. Rabe, D.D. Rathman, W. D. Goodhue, M.A. Hollis	1993	3
15	Optimization of the doping profile in Si permeable base transistors for high-frequency, high-frequency, high-voltage operation IEEE Transactions on Electron Devices ·D.D. Rathman	1990	22
16	High-temperature point-contact transistors and Schottky diodes formed on synthetic boron-doped diamond IEEE Electron Device Letters ·M. W. Geis, D.D. Rathman, D. J. Ehrlich, R.A. Murphy, W.T. Lindley	1987	173
17	Silicon Permeable Base Transistors D.D. Rathman, B. A. Vojak, D. C. Flanders, N. P. Economou	1984	1
18	Comparison of laser-initiated and thermal chemical vapor deposition of tungsten films Applied Physics Letters ·Thomas F. Deutsch, D.D. Rathman	1984	49
19	Damage induced in Si by ion milling or reactive ion etching Journal of Applied Physics ·S. W. Pang, D.D. Rathman, D. J. Silversmith, R. W. Mountain, Zenon Piech	1983	88
20	Electrical properties of laser chemically doped silicon Applied Physics Letters ·Thomas F. Deutsch, D. J. Ehrlich, D.D. Rathman, D. J. Silversmith, Richard M. Osgood	1981	51

About D.D. Rathman

D.D. Rathman is a scholar working on Instrumentation, Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Nuclear and High Energy Physics and Aerospace Engineering, having authored 39 papers that have together received 822 indexed citations. Recurring topics across this work include CCD and CMOS Imaging Sensors (14 papers), Semiconductor materials and devices (11 papers), Advancements in Semiconductor Devices and Circuit Design (8 papers), Thin-Film Transistor Technologies (7 papers), Advanced Optical Sensing Technologies (7 papers), Semiconductor Quantum Structures and Devices (4 papers), Infrared Target Detection Methodologies (4 papers) and Force Microscopy Techniques and Applications (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (614 citations), Materials Chemistry (338 citations), Atomic and Molecular Physics, and Optics (225 citations), Mechanics of Materials (170 citations) and Instrumentation (23 citations). D.D. Rathman has collaborated with scholars based in United States. Frequent co-authors include M. W. Geis, D. J. Silversmith, D. J. Ehrlich, R.A. Murphy, Thomas F. Deutsch, W.T. Lindley, R. W. Mountain, N. N. Efremow, C. O. Bozler and J.A. Burns. Their work appears in journals such as Applied Physics Letters, IEEE Electron Device Letters, IEEE Transactions on Electron Devices, IEEE Journal of Solid-State Circuits and Journal of Applied Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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