Beth Keser

400 citations
27 papers · 304 · h-index 10

Impact in

Papers in

Journals
Microelectronics Reliability (1 paper)IEEE Transactions on Advanced Packaging (1 paper)IMAPSource Proceedings (1 paper)Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft) (1 paper)2022 IEEE 72nd Electronic Components and Technology Conference (ECTC) (1 paper)

In The Last Decade

Beth Keser

27 papers receiving 281 citations

Peers

Beth Keser
Comparison fields: 5 of 22
  • Electrical and Electronic Engineering 290
  • Electronic, Optical and Magnetic Materials 50
  • Automotive Engineering 27
  • Hardware and Architecture 10
  • Mechanical Engineering 39
Replace Chih-Pin Hung with:
Chih-Pin Hung Taiwan
Curtis Zwenger United States
Pandi C. Marimuthu Singapore
Sayuri Kohara Japan
E Perfecto United States
Kazushige Toriyama Japan
Hsiang‐Hung Chang Taiwan
Jie Xue United States
A. Jouve France
Kazumasa Tanida Japan
Beth Keser relative to Chih-Pin Hung Taiwan Chih-Pin Hung's profile →
Citations per field
00.5×1.5×2.3×
Chih-Pin Hung · 1×
Citations per year

Countries citing papers authored by Beth Keser

Since Specialization
Citations

This map shows the geographic impact of Beth Keser's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Beth Keser with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Beth Keser more than expected).

Fields of papers citing papers by Beth Keser

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Beth Keser. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Beth Keser. The network helps show where Beth Keser may publish in the future.

Co-authors

The 15 scholars most cited alongside Beth Keser, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Beth Keser Line = papers co-authored together Beth Keser links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 27 papers — load more, or switch the sort, to bring in the rest.

#Work
1 200783
2 200833
3 200030
4 200220
5 200316
6 201114
7 201312
8 200811
9 200411
10 201110
11 20148
12 20138
13 20037
14 20146
15 20156
16 20195
17
Design and reliability of a new WL-CSP
20023
18 20173
19 20153
20 20113

About Beth Keser

Beth Keser is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Mechanics of Materials, Automotive Engineering and General Health Professions, having authored 27 papers that have together received 304 indexed citations. Recurring topics across this work include 3D IC and TSV technologies (26 papers), Electronic Packaging and Soldering Technologies (24 papers), Electromagnetic Compatibility and Noise Suppression (5 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), Copper Interconnects and Reliability (4 papers), Semiconductor materials and devices (3 papers), Semiconductor Lasers and Optical Devices (2 papers) and Additive Manufacturing and 3D Printing Technologies (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (290 citations), Electronic, Optical and Magnetic Materials (50 citations), Automotive Engineering (27 citations), Hardware and Architecture (10 citations) and Mechanical Engineering (39 citations). Beth Keser has collaborated with scholars based in United States, United Kingdom and Germany. Frequent co-authors include Trung Q. Duong, R.J. Wenzel, Christine Hau-Riege, M. Philip Schwarz, Sean Hayes, Jong‐Kai Lin, Michael J. Topper, O. Ehrmann, H. Reichl and Ahmer Syed. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Advanced Packaging, IMAPSource Proceedings, Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft) and 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC).

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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