Astrid Gollhardt

507 total citations
30 papers, 372 citations indexed

About

Astrid Gollhardt is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Astrid Gollhardt has authored 30 papers receiving a total of 372 indexed citations (citations by other indexed papers that have themselves been cited), including 21 papers in Electrical and Electronic Engineering, 16 papers in Biomedical Engineering and 12 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Astrid Gollhardt's work include Advanced Surface Polishing Techniques (13 papers), Force Microscopy Techniques and Applications (11 papers) and Electronic Packaging and Soldering Technologies (8 papers). Astrid Gollhardt is often cited by papers focused on Advanced Surface Polishing Techniques (13 papers), Force Microscopy Techniques and Applications (11 papers) and Electronic Packaging and Soldering Technologies (8 papers). Astrid Gollhardt collaborates with scholars based in Germany, Spain and Netherlands. Astrid Gollhardt's co-authors include B. Michel, N. Sabaté, D. Vogel, C. Cané, I. Gràcia, Bernd Michel, J.R. Morante, H. Reichl, H. Walter and Jordi Marcos and has published in prestigious journals such as Applied Physics Letters, Small and Nanotechnology.

In The Last Decade

Astrid Gollhardt

29 papers receiving 363 citations

Peers

Countries citing papers authored by Astrid Gollhardt

Since Specialization

Citations

This map shows the geographic impact of Astrid Gollhardt's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Astrid Gollhardt with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Astrid Gollhardt more than expected).

Fields of papers citing papers by Astrid Gollhardt

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Astrid Gollhardt. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Astrid Gollhardt. The network helps show where Astrid Gollhardt may publish in the future.

Co-authorship network of co-authors of Astrid Gollhardt

This figure shows the co-authorship network connecting the top 25 collaborators of Astrid Gollhardt. A scholar is included among the top collaborators of Astrid Gollhardt based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Astrid Gollhardt. Astrid Gollhardt is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	An In Vivo Biostability Evaluation of ALD and Parylene‐ALD Multilayers as Micro‐Packaging Solutions for Small Single‐Chip Implants 2025 ·Small ·(unknown), (unknown), (unknown), Astrid Gollhardt, (unknown), Kinga Tóth, (unknown), István Ulbert, Wouter A. Serdijn, Vasiliki Giagka	2
2	Investigating the Failure Mechanisms of Electromigration and Copper Oxide Formation in Fine-Pitch Cu RDL 2024 ·Fraunhofer-Publica (Fraunhofer-Gesellschaft) ·Atanu Chaudhuri, (unknown), Astrid Gollhardt, Hermann Oppermann, Martin Schneider‐Ramelow	1
3	Non-monolithic fabrication of thin-film microelectrode arrays on PMUT transducers as a bimodal neuroscientific investigation tool^* 2023 ·PubMed ·(unknown), Joshua Wilson, Astrid Gollhardt, (unknown), (unknown), Vasiliki Giagka	3
4	Catastrophic Optical Damage in Semiconductor Lasers: Physics and New Results on InGaN High‐Power Diode Lasers 2021 ·physica status solidi (RRL) - Rapid Research Letters ·Martin Hempel, (unknown), J. Jiménez, (unknown), Astrid Gollhardt, Jens W. Tomm	7
5	Reliability Investigation of Ultra Fine Line, Multi-Layer Copper Routing for Fan-Out Packaging Using a Newly Designed Micro Tensile Test Method 2020 ·Fraunhofer-Publica (Fraunhofer-Gesellschaft) ·(unknown), (unknown), T. Fritzsch, Michael Schiffer, Astrid Gollhardt, H. Walter, Martin Schneider‐Ramelow, Klaus‐Dieter Lang	2
6	Local stress measurement on metal lines and dielectrics of BEoL pattern by stress relief technique 2011 ·Fraunhofer-Publica (Fraunhofer-Gesellschaft) ·(unknown), Sven Rzepka, Bernd Michel, Astrid Gollhardt	5
7	FIB-based technique for stress characterization on thin films for reliability purposes 2007 ·Microelectronic Engineering ·N. Sabaté, D. Vogel, (unknown), Astrid Gollhardt, Jordi Marcos, I. Gràcia, C. Cané, B. Michel	28
8	Digital image correlation of nanoscale deformation fields for local stress measurement in thin films 2006 ·Nanotechnology ·N. Sabaté, D. Vogel, Astrid Gollhardt, Jordi Marcos, I. Gràcia, C. Cané, B. Michel	52
9	FIB-based measurement of local residual stresses on microsystems 2006 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), N. Sabaté, Astrid Gollhardt, (unknown), (unknown), Bernd Michel	2
10	FibDAC - Residual Stress Determination by Combination of Focused Ion Beam Technique and Digital Image Correlation 2006 ·Materials science forum ·(unknown), Astrid Gollhardt, (unknown), E. Auerswald, N. Sabaté, (unknown), Bernd Michel	6
11	Measurement of residual stresses in micromachined structures in a microregion 2006 ·Applied Physics Letters ·N. Sabaté, D. Vogel, Astrid Gollhardt, (unknown), B. Michel, C. Cané, I. Gràcia, J.R. Morante	35
12	Measurement of residual stress by slot milling with focused ion-beam equipment 2006 ·Journal of Micromechanics and Microengineering ·N. Sabaté, D. Vogel, Astrid Gollhardt, (unknown), C. Cané, I. Gràcia, J.R. Morante, B. Michel	41
13	<title>3D deformation analysis of flow and gas sensors membranes for reliability assessment</title> 2005 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·N. Sabaté, (unknown), Astrid Gollhardt, (unknown), I. Gràcia, C. Cané, J.R. Morante, Bernd Michel	1
14	Characterization of microcracks by application of digital image correlation to SPM images 2004 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), Astrid Gollhardt, (unknown), Bernd Michel	3
15	Evaluating microdefect structures by AFM-based deformation measurement 2003 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), (unknown), Astrid Gollhardt, Bernd Michel	5
16	Reliability assessment of flip-chip assemblies with lead-free solder joints 2002 ·Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft) ·Andreas Schubert, R. Dudek, H. Walter, Erik Jung, Astrid Gollhardt, B. Michel, H. Reichl	64
17	Thermo-mechanical reliability of lead-free solder interconnects 2002 ·Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft) ·Andreas Schubert, R. Dudek, (unknown), H. Walter, E. Auerswald, Astrid Gollhardt, B. Michel	5
18	Micro- and nanomaterials characterization by image correlation methods 2002 ·Sensors and Actuators A Physical ·D. Vogel, Astrid Gollhardt, B. Michel	20
19	Displacement and strain field measurements for nanotechnology applications 2002 ·Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft) ·D. Vogel, (unknown), Astrid Gollhardt, B. Michel	2
20	mTest-a new approach to measure material properties from microscopic specimens 2001 ·D. Vogel, Astrid Gollhardt, H. Walter, R. Dudek, (unknown), B. Michel	1

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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