Nicolas Cornille
- Structural Biology top 10%
-
- Optical measurement and interference techniques 4
- Image and Object Detection Techniques 2
- Surfaces, Coatings and Films top 10%
- Electron and X-Ray Spectroscopy Techniques 1
- Media Technology top 10%
-
- Non-Destructive Testing Techniques 1
- Advanced Measurement and Metrology Techniques 1
-
- Force Microscopy Techniques and Applications 3
-
- Industrial Vision Systems and Defect Detection 2
-
- Robotics and Sensor-Based Localization 1
- Co-authors
- Jean‐José OrteuMichael A. SuttonHubert W. SchreierA. P. ReynoldsDaniel F. GarcíaS.R. McNeillXiao LiNing Li
- Journals
- Experimental Mechanics (2 papers)Measurement Science and Technology (1 paper)Journal of Electronic Imaging (1 paper)
- Partner nations
- FranceUnited States
In The Last Decade
Nicolas Cornille
5 papers receiving 341 citations
Peers
Comparison fields: 5 of 41
- Structural Biology 19
- Computer Vision and Pattern Recognition 179
- Surfaces, Coatings and Films 41
- Media Technology 44
- Mechanical Engineering 147
Countries citing papers authored by Nicolas Cornille
This map shows the geographic impact of Nicolas Cornille's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Nicolas Cornille with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Nicolas Cornille more than expected).
Fields of papers citing papers by Nicolas Cornille
This network shows the impact of papers produced by Nicolas Cornille. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Nicolas Cornille. The network helps show where Nicolas Cornille may publish in the future.
Co-authorship network
The 12 scholars most cited alongside Nicolas Cornille, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2015 | 1 | |
| 2 | 2015 | 10 | |
| 3 | 2010 | 50 | |
| 4 | 2007 | 168 | |
| 5 | 2006 | 122 |
About Nicolas Cornille
Nicolas Cornille is a scholar working on Computer Vision and Pattern Recognition, Industrial and Manufacturing Engineering and Surfaces, Coatings and Films, having authored 5 papers that have together received 351 indexed citations. Recurring topics across this work include Optical measurement and interference techniques (4 papers), Force Microscopy Techniques and Applications (3 papers), Industrial Vision Systems and Defect Detection (2 papers), Image and Object Detection Techniques (2 papers), Non-Destructive Testing Techniques (1 paper), Advanced Measurement and Metrology Techniques (1 paper), Electron and X-Ray Spectroscopy Techniques (1 paper) and Robotics and Sensor-Based Localization (1 paper). The work is most often cited by research in Structural Biology (19 citations), Computer Vision and Pattern Recognition (179 citations) and Surfaces, Coatings and Films (41 citations). Nicolas Cornille has collaborated with scholars based in France and United States. Frequent co-authors include Jean‐José Orteu, Michael A. Sutton, Hubert W. Schreier, A. P. Reynolds, Daniel F. García, S.R. McNeill, Xiao Li, Ning Li, Xiaodong Li and Stephen R. McNeill. Their work appears in journals such as Experimental Mechanics, Measurement Science and Technology, Journal of Electronic Imaging and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.