Andrei Shibkov

414 citations

32 papers · 288 indexed · h-index 6

Electrical and Electronic Engineering
- Electrostatic Discharge in Electronics 20
- Integrated Circuits and Semiconductor Failure Analysis 14
- Semiconductor materials and devices 11
- Electromagnetic Compatibility and Noise Suppression 9
- Silicon Carbide Semiconductor Technologies 8
- Advancements in Semiconductor Devices and Circuit Design 7
- VLSI and FPGA Design Techniques 3
Hardware and Architecture
- VLSI and Analog Circuit Testing 2
Atomic and Molecular Physics, and Optics
Surfaces, Coatings and Films
Safety, Risk, Reliability and Quality

Co-authors: В.А. Ващенко M. Ershov J.A. Babcock P.A. Clifton Sharad Saxena S. Minehane V. Ryzhii Takashi Yamashita
Cited by: Electrical and Electronic Engineering Hardware and Architecture Atomic and Molecular Physics, and Optics
Journals: Applied Physics Letters (1 paper)Electronics Letters (1 paper)Microelectronics Reliability (1 paper)
Partner nations: United States Canada Japan

In The Last Decade

Andrei Shibkov

28 papers receiving 271 citations

Peers

Countries citing papers authored by Andrei Shibkov

Since Specialization

Citations

This map shows the geographic impact of Andrei Shibkov's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Andrei Shibkov with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Andrei Shibkov more than expected).

Fields of papers citing papers by Andrei Shibkov

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Andrei Shibkov. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Andrei Shibkov. The network helps show where Andrei Shibkov may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Andrei Shibkov, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Andrei Shibkov Line = papers co-authored together Andrei Shibkov links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Extending ESD Network Capability to EOS and Overvoltage Protection В.А. Ващенко,Andrei Shibkov	2024	0
2	Electro-Thermal Mixed-Mode Analysis of HV Complementary DD-SCR’s Andrei Shibkov,В.А. Ващенко	2023	0
3	Short Term Overstress Degradation of ESD Avalanche Diodes Breakdown Characteristics Dmitry Aksenov,Isabella Felix Anastácio,Andrei Shibkov	2022	2
4	PMOS arrays self-protection capability limitation В.А. Ващенко,Augusto Tazzoli,Andrei Shibkov	2016	0
5	Low voltage SCR clamp with high-V<inf>T</inf> reference В.А. Ващенко,Slavica Malobabic,Andrei Shibkov	2016	0
6	ESD protection design in active-lite interposer for 2.5 and 3D systems-in-package Mirko Scholz,Geert Hellings,Shih‐Hung Chen,Dimitri Linten,Alan Michael Silverstein,Adel Alaa El-din Habib,Andrei Shibkov,Antonio Manna,Geert Van der Plas,Eric Beyne	2015	4
7	Effect of process technology variation on ESD clamp parameters Electrical Overstress/Electrostatic Discharge Symposium ·Augusto Tazzoli,В.А. Ващенко,Andrei Shibkov	2014	3
8	Automated latchup analysis Electrical Overstress/Electrostatic Discharge Symposium ·В.А. Ващенко,Andrei Shibkov	2014	2
9	SCR clamps with transient voltage detection driver Electrical Overstress/Electrostatic Discharge Symposium ·В.А. Ващенко,Andrei Shibkov	2012	4
10	Mixed-mode simulations for power-on ESD analysis VUBIR (Vrije Universiteit Brussel) ·Mirko Scholz,Andrei Shibkov,Jae Hack Lee,D. Linten,S. Thijs,B. Elizebeth Carolin,Gerd Vandersteen,G. Groeseneken	2012	5
11	On chip ESD protection of 600V voltage node В.А. Ващенко,Yao Zhang,Andrei Shibkov	2011	4
12	An I-IP based approach for the monitoring of NBTI effects in SoCs Carlo Guardiani,Andrei Shibkov,Angelo Brambilla,Giancarlo Storti Gajani,D. Appello,Francesco Piazza,Paolo Bernardi	2009	1
13	Integrated Simulation Flow for Self-Consistent Manufacturability and Circuit Performance Evaluation Andrei Shibkov,Margarita Jiménez	2005	4
14	Design strategies for ESD protection in SOC K. Iniewski,Margarita Jiménez,Andrei Shibkov,A. Balasiński,M. Syrzycki	2004	1
15	Design strategies for ESD protection in SOC K. Iniewski,Margarita Jiménez,Andrei Shibkov,A. Balasiński,M. Syrzycki	2004	1
16	Efficient Analysis and Optimization of ESD Protection Circuits Margarita Jiménez,A. Balasiński,William R. Baker,Andrei Shibkov	2004	1
17	Transient effects and characterization methodology of negative bias temperature instability in pMOS transistors M. Ershov,Suzanne Goldacker,Sharad Saxena,Andrei Shibkov,S. Minehane,J.A. Babcock,S. Winters,Roger Wrenn,Takashi Yamashita,P.A. Clifton,CEM Centro De Estudos Da Metrópole	2003	23
18	Physical and timing verification of subwavelength-scale designs: I. Lithography impact on MOSFETs Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Robert C. Pack,María Eugenia Vega Hernández,Andrei Shibkov,孙兆键,Einar Vargas Bello,俊邦岡村,Marie-Rose Magaly Guervil,I. Jianu,W. D. Grobman	2003	8
19	Circuit-device co-design for high performance mixed-signal technologies Sharad Saxena,Ignacio Pelayo-Tejo,Andrei Shibkov,Margarita Jiménez,Carlo Guardiani	2002	1
20	Numerical simulation of carrier transport in Schottky barrier diodes Electronics Letters ·Andrei Shibkov,M. Ershov,V. Ryzhii	1992	9

About Andrei Shibkov

Andrei Shibkov is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Aerospace Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry, having authored 32 papers that have together received 288 indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (20 papers), Integrated Circuits and Semiconductor Failure Analysis (14 papers), Semiconductor materials and devices (11 papers), Electromagnetic Compatibility and Noise Suppression (9 papers), Silicon Carbide Semiconductor Technologies (8 papers), Advancements in Semiconductor Devices and Circuit Design (7 papers), VLSI and FPGA Design Techniques (3 papers) and VLSI and Analog Circuit Testing (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (283 citations), Hardware and Architecture (21 citations), Atomic and Molecular Physics, and Optics (29 citations), Surfaces, Coatings and Films (2 citations) and Safety, Risk, Reliability and Quality (2 citations). Andrei Shibkov has collaborated with scholars based in United States, Canada and Japan. Frequent co-authors include В.А. Ващенко, M. Ershov, J.A. Babcock, P.A. Clifton, Sharad Saxena, S. Minehane, V. Ryzhii, Takashi Yamashita, D. White and S. Thijs. Their work appears in journals such as Applied Physics Letters, Electronics Letters, Microelectronics Reliability, VUBIR (Vrije Universiteit Brussel) and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.

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