Akram Salman
Impact in
-
- Electrostatic Discharge in Electronics
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Electromagnetic Compatibility and Noise Suppression
- Silicon Carbide Semiconductor Technologies
- Ferroelectric and Negative Capacitance Devices
Papers in
-
- Electrostatic Discharge in Electronics 43
- Semiconductor materials and devices 34
- Integrated Circuits and Semiconductor Failure Analysis 29
- Advancements in Semiconductor Devices and Circuit Design 26
- Silicon Carbide Semiconductor Technologies 11
- Electromagnetic Compatibility and Noise Suppression 9
- Low-power high-performance VLSI design 3
- Silicon and Solar Cell Technologies 2
- Co-authors
- Stephen G. BeebeDimitris E. IoannouGianluca BoselliM.M. PelellaShuqing CaoR.W. DuttonRobert GauthierJung‐Hoon Chun
- Journals
- Solid-State Electronics (3 papers)IEEE Transactions on Device and Materials Reliability (3 papers)Microelectronics Reliability (2 papers)IEEE Electron Device Letters (1 paper)IEEE Transactions on Electron Devices (1 paper)
- Partner nations
- United StatesCanadaIndia
In The Last Decade
Akram Salman
49 papers receiving 422 citations
Peers
Comparison fields: 5 of 17
- Electrical and Electronic Engineering 446
- Hardware and Architecture 12
- Biomedical Engineering 49
- Atomic and Molecular Physics, and Optics 15
- Bioengineering 2
Countries citing papers authored by Akram Salman
This map shows the geographic impact of Akram Salman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Akram Salman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Akram Salman more than expected).
Fields of papers citing papers by Akram Salman
This network shows the impact of papers produced by Akram Salman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Akram Salman. The network helps show where Akram Salman may publish in the future.
Co-authors
The 25 scholars most cited alongside Akram Salman, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2020 | 4 | |
| 2 | 2019 | 6 | |
| 3 | 2016 | 2 | |
| 4 | 2015 | 3 | |
| 5 | Multi-reflection TLP: A new measurement technique for system-level automotive ESD/EMC characterization | 2014 | 2 |
| 6 | 2014 | 4 | |
| 7 | Mutual ballasting: A novel technique for improved inductive system level IEC ESD stress performance for automotive applications | 2013 | 9 |
| 8 | A flexible simulation model for system level ESD stresses with application to ESD design and troubleshooting | 2012 | 11 |
| 9 | Novel techniques to modulate the holding voltage in high voltage ESD protections | 2011 | 5 |
| 10 | 2011 | 10 | |
| 11 | 2011 | 6 | |
| 12 | Solutions to mitigate parasitic NPN bipolar action in high voltage analog technologies | 2010 | 4 |
| 13 | ESD device design strategy for high speed I/O in 45nm SOI technology | 2008 | 6 |
| 14 | 2006 | 2 | |
| 15 | SOI lateral diode optimization for ESD protection in 130nm and 90nm technologies | 2005 | 6 |
| 16 | 2004 | 10 | |
| 17 | 2002 | 8 | |
| 18 | 2002 | 10 | |
| 19 | 2002 | 4 | |
| 20 | Evaluation of diode-based and NMOS/Lnpn-based ESD protection strategies in a triple gate oxide thickness 0.13 µm CMOS logic technology | 2001 | 21 |
About Akram Salman
Akram Salman is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Infectious Diseases, Organic Chemistry and Surgery, having authored 53 papers that have together received 453 indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (43 papers), Semiconductor materials and devices (34 papers), Integrated Circuits and Semiconductor Failure Analysis (29 papers), Advancements in Semiconductor Devices and Circuit Design (26 papers), Silicon Carbide Semiconductor Technologies (11 papers), Electromagnetic Compatibility and Noise Suppression (9 papers), Low-power high-performance VLSI design (3 papers) and Silicon and Solar Cell Technologies (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (446 citations), Hardware and Architecture (12 citations), Biomedical Engineering (49 citations), Atomic and Molecular Physics, and Optics (15 citations) and Bioengineering (2 citations). Akram Salman has collaborated with scholars based in United States, Canada and India. Frequent co-authors include Stephen G. Beebe, Dimitris E. Ioannou, Gianluca Boselli, M.M. Pelella, Shuqing Cao, R.W. Dutton, Robert Gauthier, Jung‐Hoon Chun, Z. Chbili and Qiliang Li. Their work appears in journals such as Solid-State Electronics, IEEE Transactions on Device and Materials Reliability, Microelectronics Reliability, IEEE Electron Device Letters and IEEE Transactions on Electron Devices.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.