Stephen G. Beebe

460 total citations
30 papers, 321 citations indexed

About

Stephen G. Beebe is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Control and Systems Engineering. According to data from OpenAlex, Stephen G. Beebe has authored 30 papers receiving a total of 321 indexed citations (citations by other indexed papers that have themselves been cited), including 28 papers in Electrical and Electronic Engineering, 2 papers in Hardware and Architecture and 1 paper in Control and Systems Engineering. Recurrent topics in Stephen G. Beebe's work include Electrostatic Discharge in Electronics (26 papers), Integrated Circuits and Semiconductor Failure Analysis (20 papers) and Advancements in Semiconductor Devices and Circuit Design (12 papers). Stephen G. Beebe is often cited by papers focused on Electrostatic Discharge in Electronics (26 papers), Integrated Circuits and Semiconductor Failure Analysis (20 papers) and Advancements in Semiconductor Devices and Circuit Design (12 papers). Stephen G. Beebe collaborates with scholars based in United States, South Korea and Canada. Stephen G. Beebe's co-authors include Akram Salman, R.W. Dutton, M.M. Pelella, Shuqing Cao, Dimitris E. Ioannou, Jung‐Hoon Chun, Zhiping Yu, Zhipeng Yu, Robert Gauthier and Warren Anderson and has published in prestigious journals such as IEEE Transactions on Electron Devices, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and Solid-State Electronics.

In The Last Decade

Stephen G. Beebe

29 papers receiving 298 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Stephen G. Beebe United States	11	316	34	11	10	3	30	321
Akram Salman United States	11	446 1.4×	49 1.4×	12 1.1×	15 1.5×	5 1.7×	53	453
Sanjeev Rai India	11	260 0.8×	49 1.4×	14 1.3×	13 1.3×	3 1.0×	41	272
Mohan V. Dunga United States	12	362 1.1×	42 1.2×	22 2.0×	14 1.4×	7 2.3×	27	373
H. Brut France	8	263 0.8×	35 1.0×	18 1.6×	10 1.0×		15	264
D. Nguyen-Ngoc United States	7	220 0.7×	22 0.6×	11 1.0×	24 2.4×	2 0.7×	16	223
Susan L. Sweeney United States	11	289 0.9×	26 0.8×	11 1.0×	14 1.4×	1 0.3×	28	298
Weize Xiong United States	13	417 1.3×	45 1.3×	14 1.3×	10 1.0×	10 3.3×	27	422
N. Sadachika Japan	9	303 1.0×	21 0.6×	14 1.3×	16 1.6×	2 0.7×	38	310
D.S. Zicherman United States	6	339 1.1×	37 1.1×	8 0.7×	29 2.9×	6 2.0×	12	343

Countries citing papers authored by Stephen G. Beebe

Since Specialization

Citations

This map shows the geographic impact of Stephen G. Beebe's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Stephen G. Beebe with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Stephen G. Beebe more than expected).

Fields of papers citing papers by Stephen G. Beebe

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Stephen G. Beebe. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Stephen G. Beebe. The network helps show where Stephen G. Beebe may publish in the future.

Co-authorship network of co-authors of Stephen G. Beebe

This figure shows the co-authorship network connecting the top 25 collaborators of Stephen G. Beebe. A scholar is included among the top collaborators of Stephen G. Beebe based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Stephen G. Beebe. Stephen G. Beebe is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Cao, Shuqing, Jung‐Hoon Chun, Akram Salman, Stephen G. Beebe, & R.W. Dutton. (2011). Gate-controlled field-effect diodes and silicon-controlled rectifier for charged-device model ESD protection in advanced SOI technology. Microelectronics Reliability. 51(4). 756–764. 6 indexed citations

Cao, Shuqing, et al.. (2010). Investigation on output driver with stacked devices for ESD design window engineering. Electrical Overstress/Electrostatic Discharge Symposium. 1–8. 6 indexed citations

Cao, Shuqing, Akram Salman, Jung‐Hoon Chun, et al.. (2010). Design and Characterization of ESD Protection Devices for High-Speed I/O in Advanced SOI Technology. IEEE Transactions on Electron Devices. 57(3). 644–653. 25 indexed citations

Anderson, Warren, et al.. (2009). Metal and silicon burnout failures from CDM ESD testing. 1–8. 3 indexed citations

Cao, Shuqing, et al.. (2009). ESD design challenges and strategies in deeply-scaled integrated circuits. 681–688. 13 indexed citations

Cao, Shuqing, et al.. (2008). ESD device design strategy for high speed I/O in 45nm SOI technology. 235–241. 6 indexed citations

Salman, Akram, Shuqing Cao, Stephen G. Beebe, M.M. Pelella, & R.W. Dutton. (2008). Double-well field effect diode vs. SCR behavior under CDM stress in 45nm SOI technology. 143–144. 6 indexed citations

Salman, Akram, et al.. (2008). Design and optimization of the SOI field effect diode (FED) for ESD protection. Solid-State Electronics. 52(10). 1482–1485. 26 indexed citations

Salman, Akram, Stephen G. Beebe, & M.M. Pelella. (2007). Double well field effect diode: Lateral SCR-like device for ESD protection of I/Os in deep sub micron SOI. 3A.4–1. 8 indexed citations

10.

Salman, Akram, et al.. (2006). ESD Protection for SOI Technology Using Under-the-BOX (Substrate) Diode Structure. IEEE Transactions on Device and Materials Reliability. 6(2). 292–299. 2 indexed citations

11.

Pelella, M.M., et al.. (2006). A Novel Self-Aligned Substrate-Diode Structure for SOI Technologies. 167–170. 3 indexed citations

12.

Salman, Akram, et al.. (2005). SOI lateral diode optimization for ESD protection in 130nm and 90nm technologies. Electrical Overstress/Electrostatic Discharge Symposium. 1–7. 6 indexed citations

13.

Beebe, Stephen G.. (2005). Methodology for layout design and optimization of ESD protection transistors. 265–275. 14 indexed citations

14.

Zhang, John H., et al.. (2004). Reliability challenges of high performance PD SOI CMOS with ultra-thin gate dielectrics. Solid-State Electronics. 48(10-11). 1703–1708. 10 indexed citations

15.

Salman, Akram, et al.. (2004). ESD protection for SOI technology using an under-the-box (substrate) diode structure. 1–7. 7 indexed citations

16.

Salman, Akram, et al.. (2004). Reliability challenges of high performance PD SOI CMOS with ultra-thin gate dielectrics. 357–358. 4 indexed citations

17.

Beebe, Stephen G.. (2002). Simulation of complete CMOS I/O circuit response to CDM stress. 259–270. 33 indexed citations

18.

Beebe, Stephen G., Yu Zhou, Kuo-Chen Wu, et al.. (2002). Next generation Stanford TCAD-PISCES 2ET and SUPREM 007. 213–216. 3 indexed citations

19.

Dutton, R.W., et al.. (2002). Virtual instruments for development of high performance circuit technologies. 225–228. 3 indexed citations

20.

Yu, Zhipeng, et al.. (2002). A computationally stable quasi-empirical compact model for the simulation of MOS breakdown in ESD-protection circuit design. 161–164. 17 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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