Ming-Hung Han

523 citations

18 papers · 421 indexed · h-index 9

Electrical and Electronic Engineering top 10%
- Advancements in Semiconductor Devices and Circuit Design 17
- Semiconductor materials and devices 17
- Low-power high-performance VLSI design 4
- Thin-Film Transistor Technologies 4
- Silicon Carbide Semiconductor Technologies 3
- Ferroelectric and Negative Capacitance Devices 2
- Photonic and Optical Devices 1
Biomedical Engineering
- Nanowire Synthesis and Applications 4
Hardware and Architecture
Bioengineering
Atomic and Molecular Physics, and Optics

Co-authors: Hung-Bin Chen Yung‐Chun Wu Yiming Li Chun‐Yen Chang Chih‐Hong Hwang Hui-Wen Cheng Chun-Yen Chang Fuhai Li
Cited by: Electrical and Electronic Engineering Biomedical Engineering Hardware and Architecture
Journals: IEEE Electron Device Letters (3 papers)IEEE Transactions on Semiconductor Manufacturing (2 papers)IEEE Transactions on Electron Devices (2 papers)
Partner nations: Taiwan

In The Last Decade

Ming-Hung Han

18 papers receiving 403 citations

Peers

Countries citing papers authored by Ming-Hung Han

Since Specialization

Citations

This map shows the geographic impact of Ming-Hung Han's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ming-Hung Han with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ming-Hung Han more than expected).

Fields of papers citing papers by Ming-Hung Han

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ming-Hung Han. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ming-Hung Han. The network helps show where Ming-Hung Han may publish in the future.

Co-authorship network

The 17 scholars most cited alongside Ming-Hung Han, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Ming-Hung Han Line = papers co-authored together Ming-Hung Han links everyone, so they are left out of the graph.

All Works

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18 of 18 papers shown

#	Work
1	Low-Voltage Programmable Gate-All-Around (GAA) Nanosheet TFT Nonvolatile Memory Using Band-to-Band Tunneling Induced Hot Electron (BBHE) Method IEEE Journal of the Electron Devices Society ·Froehlich Collins,Hung-Bin Chen,Dong Li-guo,Mehdi Tamjid,Ming-Hung Han,T. Stöhlker,Shella Maudina,悠大佐々木,Yung‐Chun Wu	2018	2
2	Experimental demonstration of performance enhancement on highly-scaled bulk nFinFETs with novel carrier transport engineering Ming-Hung Han,木暮ミカ,Yen-Ying Tu,Patrizia Miggiano,Antun Hardi	2015	2
3	Temperature dependence of electronic behaviors in quantum dimension junctionless thin-film transistor Nanoscale Research Letters ·Jo A. Banda,Hung-Bin Chen,Ming-Hung Han,Yanchun Wan,晃司和気,Murilo Alexandre Schulz,Yung‐Chun Wu	2014	5
4	Performance of GAA poly-Si nanosheet (2nm) channel of junctionless transistors with ideal subthreshold slope Symposium on VLSI Technology ·Hung-Bin Chen,Yung‐Chun Wu,Chun‐Yen Chang,Ming-Hung Han,Yanchun Wan,Jo A. Banda	2013	31
5	Characteristics of Gate-All-Around Junctionless Poly-Si TFTs With an Ultrathin Channel IEEE Electron Device Letters ·Hung-Bin Chen,Alfred G. Kauertz,Yanchun Wan,T. Stöhlker,Ming-Hung Han,Jo A. Banda,Yung‐Chun Wu	2013	29
6	Characteristic of p-Type Junctionless Gate-All-Around Nanowire Transistor and Sensitivity Analysis IEEE Electron Device Letters ·Ming-Hung Han,Chun‐Yen Chang,Yi‐Ruei Jhan,T. Stöhlker,Hung-Bin Chen,Jo A. Banda,Yung‐Chun Wu	2013	35
7	Performance Comparison Between Bulk and SOI Junctionless Transistors IEEE Electron Device Letters ·Ming-Hung Han,Chun-Yen Chang,Hung-Bin Chen,T. Stöhlker,Jo A. Banda,Yung‐Chun Wu	2013	65
8	Device and Circuit Performance Estimation of Junctionless Bulk FinFETs IEEE Transactions on Electron Devices ·Ming-Hung Han,Chun‐Yen Chang,Hung-Bin Chen,Jo A. Banda,Yung‐Chun Wu	2013	68
9	Improving Breakdown Voltage of LDMOS Using a Novel Cost Effective Design IEEE Transactions on Semiconductor Manufacturing ·Ming-Hung Han,Hung-Bin Chen,Chih‐Han Chang,Shehadeh Alghharibeh,Chun‐Yen Chang	2013	8
10	A Novel Cost Effective Double Reduced Surface Field Laterally Diffused Metal Oxide Semiconductor Design for Improving Off-State Breakdown Voltage Japanese Journal of Applied Physics ·Ming-Hung Han,Hung-Bin Chen,Chih‐Han Chang,T. Stöhlker,Dilşat Onay,Shehadeh Alghharibeh,Chun‐Yen Chang	2012	2
11	Statistical Simulation of Static Noise Margin Variability in Static Random Access Memory IEEE Transactions on Semiconductor Manufacturing ·Yiming Li,Hui-Wen Cheng,Ming-Hung Han	2010	18
12	3D device simulation of work function and interface trap fluctuations on high-κ / metal gate devices Hui-Wen Cheng,Fuhai Li,Ming-Hung Han,K.G. Polinoski,Chia-Hui Yu,R. J. Morris,Yiming Li	2010	34
13	Effect of intrinsic-parameter fluctuations on 16-nm-gate CMOS and current mirror circuit K.G. Polinoski,Yiming Li,Ming-Hung Han,R. J. Morris,Olivia Banner,Hui-Wen Cheng,K.S. Kim	2010	2
14	Process-Variation Effect, Metal-Gate Work-Function Fluctuation, and Random-Dopant Fluctuation in Emerging CMOS Technologies IEEE Transactions on Electron Devices ·Yiming Li,Chih‐Hong Hwang,Midori KASHIMA,Ming-Hung Han	2010	97
15	Statistical simulation of metal-gate work-function fluctuation in high-κ/metal-gate devices Chia-Hui Yu,Ming-Hung Han,Hui-Wen Cheng,K.S. Kim,Yiming Li,Hiroshi Watanabe	2010	9
16	Simulation of electrical characteristic fluctuation in 16-nm FinFETs' and circuits Yiming Li,Chih‐Hong Hwang,Midori KASHIMA,Ming-Hung Han	2009	2
17	3D 65nm CMOS with 320°C microwave dopant activation Yao‐Jen Lee,Duško Laković,Fu-Kuo Hsueh,Mrs Leslie,Jamile Santos Souza,Wahyu Anggara Desa,Ming-Hung Han,Melanie Aing,ADRIANE ABREU DA SILVA MONTEIRO,Dawei Heh,Xingyan Du,Yiming Li,Tien‐Sheng Chao,Ching‐Yi Wu,Fu-Liang Yang	2009	5
18	Statistical Analysis of Metal Gate Workfunction Variability, Process Variation, and Random Dopant Fluctuation in Nano-CMOS Circuits Chih‐Hong Hwang,Midori KASHIMA,Ming-Hung Han,R. J. Morris,Hui-Wen Cheng,Yiming Li	2009	7

About Ming-Hung Han

Ming-Hung Han is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Atomic and Molecular Physics, and Optics, Infectious Diseases and Organic Chemistry, having authored 18 papers that have together received 421 indexed citations. Recurring topics across this work include Advancements in Semiconductor Devices and Circuit Design (17 papers), Semiconductor materials and devices (17 papers), Low-power high-performance VLSI design (4 papers), Thin-Film Transistor Technologies (4 papers), Nanowire Synthesis and Applications (4 papers), Silicon Carbide Semiconductor Technologies (3 papers), Ferroelectric and Negative Capacitance Devices (2 papers) and Photonic and Optical Devices (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (415 citations), Biomedical Engineering (87 citations), Hardware and Architecture (10 citations), Bioengineering (3 citations) and Atomic and Molecular Physics, and Optics (13 citations). Ming-Hung Han has collaborated with scholars based in Taiwan. Frequent co-authors include Hung-Bin Chen, Yung‐Chun Wu, Yiming Li, Chun‐Yen Chang, Chih‐Hong Hwang, Hui-Wen Cheng, Chun-Yen Chang, Fuhai Li, Yi‐Ruei Jhan and Chih‐Han Chang. Their work appears in journals such as IEEE Electron Device Letters, IEEE Transactions on Semiconductor Manufacturing, IEEE Transactions on Electron Devices, Japanese Journal of Applied Physics and IEEE Journal of the Electron Devices Society.

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