A. Concannon
-
- Semiconductor materials and devices 30
- Electrostatic Discharge in Electronics 28
- Integrated Circuits and Semiconductor Failure Analysis 26
- Advancements in Semiconductor Devices and Circuit Design 17
- Electromagnetic Compatibility and Noise Suppression 8
- Low-power high-performance VLSI design 3
- Silicon Carbide Semiconductor Technologies 3
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- Advanced Data Storage Technologies 4
- Co-authors
- В.А. ВащенкоP. HopperA. MathewsonRussell DuaneC. LombardiP. O'SullivanS. ThijsG. Groeseneken
- Cited by
- Electrical and Electronic EngineeringHardware and ArchitectureStatistics, Probability and Uncertainty
- Journals
- Microelectronics Reliability (4 papers)IEEE Transactions on Device and Materials Reliability (3 papers)IEEE Transactions on Electron Devices (2 papers)
- Partner nations
- United StatesIrelandBelgium
In The Last Decade
A. Concannon
45 papers receiving 306 citations
Peers
Comparison fields: 5 of 25
- Electrical and Electronic Engineering 319
- Hardware and Architecture 14
- Statistics, Probability and Uncertainty 2
- Software 1
- Condensed Matter Physics 3
Countries citing papers authored by A. Concannon
This map shows the geographic impact of A. Concannon's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Concannon with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Concannon more than expected).
Fields of papers citing papers by A. Concannon
This network shows the impact of papers produced by A. Concannon. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Concannon. The network helps show where A. Concannon may publish in the future.
Co-authorship network
The 25 scholars most cited alongside A. Concannon, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2023 | 3 | |
| 2 | 2018 | 8 | |
| 3 | 2015 | 3 | |
| 4 | Identification of two-probe TLP contact resistance issues and proposed solutions | 2014 | 1 |
| 5 | Mutual ballasting: A novel technique for improved inductive system level IEC ESD stress performance for automotive applications | 2013 | 9 |
| 6 | Miscorrelation between IEC61000-4-2 type of HMM tester and 50 Ω HMM tester | 2012 | 2 |
| 7 | 2012 | 4 | |
| 8 | HBM parameter extraction and Transient Safe Operating Area | 2010 | 2 |
| 9 | SCCF — System to component level correlation factor | 2010 | 12 |
| 10 | 2006 | 8 | |
| 11 | 2004 | 19 | |
| 12 | 2003 | 14 | |
| 13 | 2003 | 10 | |
| 14 | 2002 | 3 | |
| 15 | 2001 | 10 | |
| 16 | Scaling low power embedded flash EEPROMs to 0.18um | 1999 | 2 |
| 17 | 1999 | 9 | |
| 18 | Advanced Numerical Modelling of Non-Volatile Memory Cells | 1998 | 7 |
| 19 | 1997 | 2 | |
| 20 | Applications of a Novel Hot Carrier Injection Model in Flash EEPROM Design | 1994 | 2 |
About A. Concannon
A. Concannon is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Computer Networks and Communications, Condensed Matter Physics and Psychiatry and Mental health, having authored 46 papers that have together received 332 indexed citations. Recurring topics across this work include Semiconductor materials and devices (30 papers), Electrostatic Discharge in Electronics (28 papers), Integrated Circuits and Semiconductor Failure Analysis (26 papers), Advancements in Semiconductor Devices and Circuit Design (17 papers), Electromagnetic Compatibility and Noise Suppression (8 papers), Advanced Data Storage Technologies (4 papers), Low-power high-performance VLSI design (3 papers) and Silicon Carbide Semiconductor Technologies (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (319 citations), Hardware and Architecture (14 citations), Statistics, Probability and Uncertainty (2 citations), Software (1 citation) and Condensed Matter Physics (3 citations). A. Concannon has collaborated with scholars based in United States, Ireland and Belgium. Frequent co-authors include В.А. Ващенко, P. Hopper, A. Mathewson, Russell Duane, C. Lombardi, P. O'Sullivan, S. Thijs, G. Groeseneken, D. Linten and Mirko Scholz. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Device and Materials Reliability, IEEE Transactions on Electron Devices, Microelectronic Engineering and IEEE Electron Device Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.