A. Concannon

432 total citations
46 papers, 332 citations indexed

About

A. Concannon is a scholar working on Electrical and Electronic Engineering, Computer Networks and Communications and Hardware and Architecture. According to data from OpenAlex, A. Concannon has authored 46 papers receiving a total of 332 indexed citations (citations by other indexed papers that have themselves been cited), including 44 papers in Electrical and Electronic Engineering, 4 papers in Computer Networks and Communications and 3 papers in Hardware and Architecture. Recurrent topics in A. Concannon's work include Semiconductor materials and devices (30 papers), Electrostatic Discharge in Electronics (28 papers) and Integrated Circuits and Semiconductor Failure Analysis (26 papers). A. Concannon is often cited by papers focused on Semiconductor materials and devices (30 papers), Electrostatic Discharge in Electronics (28 papers) and Integrated Circuits and Semiconductor Failure Analysis (26 papers). A. Concannon collaborates with scholars based in United States, Ireland and Belgium. A. Concannon's co-authors include В.А. Ващенко, P. Hopper, A. Mathewson, Russell Duane, C. Lombardi, P. O'Sullivan, S. Thijs, G. Groeseneken, D. Linten and Akram Salman and has published in prestigious journals such as IEEE Transactions on Electron Devices, IEEE Electron Device Letters and Solid-State Electronics.

In The Last Decade

A. Concannon

45 papers receiving 306 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
A. Concannon United States	11	319	14	9	9	8	46	332
M. Brox Germany	8	269 0.8×	7 0.5×	8 0.9×	18 2.0×		19	276
Uma Sharma India	11	317 1.0×	8 0.6×	7 0.8×	23 2.6×		26	325
D. Schepis United States	9	166 0.5×	22 1.6×	18 2.0×	7 0.8×		16	171
R. Tu United States	8	309 1.0×	32 2.3×	15 1.7×	10 1.1×		15	319
Andrei Shibkov United States	6	283 0.9×	21 1.5×	6 0.7×	10 1.1×		32	288
E. Worley United States	11	349 1.1×	25 1.8×	14 1.6×	5 0.6×		31	350
T.C. Ong United States	9	266 0.8×	7 0.5×	15 1.7×	28 3.1×		26	267
W. Noble United States	11	286 0.9×	23 1.6×	9 1.0×	9 1.0×		20	294
María Toledano Luque Belgium	4	407 1.3×	15 1.1×	6 0.7×	35 3.9×		8	413
G.O. Workman United States	11	311 1.0×	10 0.7×	19 2.1×	10 1.1×		24	323

Countries citing papers authored by A. Concannon

Since Specialization

Citations

This map shows the geographic impact of A. Concannon's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Concannon with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Concannon more than expected).

Fields of papers citing papers by A. Concannon

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. Concannon. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Concannon. The network helps show where A. Concannon may publish in the future.

Co-authorship network of co-authors of A. Concannon

This figure shows the co-authorship network connecting the top 25 collaborators of A. Concannon. A scholar is included among the top collaborators of A. Concannon based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A. Concannon. A. Concannon is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Concannon, A.. (2023). Evolution of ESD Robust IC Design: How ESD design and ESD control have changed our industry. IEEE Solid-State Circuits Magazine. 15(4). 58–63. 3 indexed citations

Wang, Liang, et al.. (2014). Identification of two-probe TLP contact resistance issues and proposed solutions. Electrical Overstress/Electrostatic Discharge Symposium. 1–9. 1 indexed citations

Salman, Akram, et al.. (2013). Mutual ballasting: A novel technique for improved inductive system level IEC ESD stress performance for automotive applications. Electrical Overstress/Electrostatic Discharge Symposium. 9 indexed citations

Scholz, Mirko, Geert Hellings, D. Linten, et al.. (2012). Miscorrelation between IEC61000-4-2 type of HMM tester and 50 Ω HMM tester. Electrical Overstress/Electrostatic Discharge Symposium. 1–9. 2 indexed citations

Griffoni, Alessio, D. Linten, S. Thijs, et al.. (2012). HBM ESD Robustness of GaN-on-Si Schottky Diodes. IEEE Transactions on Device and Materials Reliability. 12(4). 589–598. 4 indexed citations

Concannon, A., et al.. (2012). A design strategy for 8 kV/contact 15 kV/air gap IEC 61000-4-2 robustness without on board suppressors. 1–7. 4 indexed citations

Thijs, S., Mirko Scholz, D. Linten, et al.. (2010). SCCF — System to component level correlation factor. Electrical Overstress/Electrostatic Discharge Symposium. 1–10. 12 indexed citations

Linten, D., S. Thijs, Alessio Griffoni, et al.. (2010). HBM parameter extraction and Transient Safe Operating Area. Electrical Overstress/Electrostatic Discharge Symposium. 1–8. 2 indexed citations

Thijs, S., D. Linten, M. Natarajan, et al.. (2006). RF ESD protection strategies - the design and performance trade-off challenges. 484–491. 8 indexed citations

10.

Concannon, A., et al.. (2004). ESD protection of double-diffusion devices in submicron CMOS processes. 261–264. 19 indexed citations

11.

Vassilev, V., M. Lorenzini, В.А. Ващенко, et al.. (2004). Snapback circuit model for cascoded NMOS ESD over-voltage protection structures. 561–564. 6 indexed citations

12.

Ващенко, В.А., et al.. (2003). LVTSCR structures for latch-up free ESD protection of BiCMOS RF circuits. Microelectronics Reliability. 43(1). 61–69. 10 indexed citations

13.

Concannon, A., et al.. (2002). Development and application of a macro model for flash EEPROM design. 192–196. 3 indexed citations

14.

Concannon, A., F. Piccinini, A. Mathewson, & C. Lombardi. (2002). The numerical simulation of substrate and gate currents in MOS and EPROMs. 289–292. 4 indexed citations

15.

Duane, Russell, et al.. (2001). Extraction of coupling ratios for Fowler–Nordheim programming conditions. Solid-State Electronics. 45(2). 235–242. 10 indexed citations

16.

Duffy, Ray, et al.. (1999). Scaling low power embedded flash EEPROMs to 0.18um. European Solid-State Device Research Conference. 1. 620–623. 2 indexed citations

17.

Mathewson, A., P. O'Sullivan, A. Concannon, et al.. (1999). Modelling and simulation of reliability for design. Microelectronic Engineering. 49(1-2). 95–117. 9 indexed citations

18.

Duane, Russell, A. Concannon, P. O'Sullivan, & A. Mathewson. (1998). Advanced Numerical Modelling of Non-Volatile Memory Cells. European Solid-State Device Research Conference. 304–307. 7 indexed citations

19.

Concannon, A., et al.. (1997). Theoretical Analysis of a Pseudo-Floating Gate flash EEPROM Device. European Solid-State Device Research Conference. 320–323. 2 indexed citations

20.

Concannon, A., A. Mathewson, F. Piccinini, et al.. (1994). Applications of a Novel Hot Carrier Injection Model in Flash EEPROM Design. 503–506. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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