P. Hopper
-
- Electrostatic Discharge in Electronics 37
- Integrated Circuits and Semiconductor Failure Analysis 27
- Semiconductor materials and devices 23
- Electromagnetic Compatibility and Noise Suppression 12
- Advancements in Semiconductor Devices and Circuit Design 11
- Silicon Carbide Semiconductor Technologies 10
- 3D IC and TSV technologies 3
- Electronic Packaging and Soldering Technologies 2
- Co-authors
- В.А. ВащенкоA. ConcannonElyse RosenbaumS. ThijsVictor P. KuznetsovD. LintenMirko ScholzG. Groeseneken
- Cited by
- Electrical and Electronic EngineeringHardware and ArchitectureComputer Graphics and Computer-Aided Design
- Journals
- Microelectronics Reliability (3 papers)IEEE Transactions on Device and Materials Reliability (3 papers)IEEE Transactions on Electron Devices (2 papers)
- Partner nations
- United StatesBelgiumAustria
In The Last Decade
P. Hopper
44 papers receiving 352 citations
Peers
Comparison fields: 5 of 15
- Electrical and Electronic Engineering 377
- Hardware and Architecture 11
- Computer Graphics and Computer-Aided Design 1
- Condensed Matter Physics 3
- Mechanics of Materials 3
Countries citing papers authored by P. Hopper
This map shows the geographic impact of P. Hopper's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Hopper with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Hopper more than expected).
Fields of papers citing papers by P. Hopper
This network shows the impact of papers produced by P. Hopper. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Hopper. The network helps show where P. Hopper may publish in the future.
Co-authorship network
The 25 scholars most cited alongside P. Hopper, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2012 | 4 | |
| 2 | Numerical simulation of metal interconnects of power semiconductor devices | 2010 | 11 |
| 3 | HBM parameter extraction and Transient Safe Operating Area | 2010 | 2 |
| 4 | SCCF — System to component level correlation factor | 2010 | 12 |
| 5 | Study of power arrays in ESD operation regimes | 2010 | 3 |
| 6 | Improving the ESD self-protection capability of integrated power NLDMOS arrays | 2010 | 14 |
| 7 | 2009 | 7 | |
| 8 | On-wafer human metal model measurements for system-level ESD analysis | 2009 | 12 |
| 9 | A dual-base triggered SCR with very low leakage current and adjustable trigger voltage | 2008 | 17 |
| 10 | Dual-direction Isolated NMOS-SCR device for system level ESD protection | 2006 | 1 |
| 11 | 2006 | 8 | |
| 12 | Implementation of high V T turn-on in low-voltage SCR devices | 2005 | 3 |
| 13 | 2005 | 5 | |
| 14 | 2004 | 19 | |
| 15 | 2004 | 50 | |
| 16 | 2003 | 10 | |
| 17 | 2003 | 5 | |
| 18 | 2003 | 3 | |
| 19 | Technology CAD evaluation of BiCMOS protection structures operation including spatial thermal runaway | 2002 | 8 |
| 20 | 1995 | 2 |
About P. Hopper
P. Hopper is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Industrial and Manufacturing Engineering, having authored 46 papers that have together received 380 indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (37 papers), Integrated Circuits and Semiconductor Failure Analysis (27 papers), Semiconductor materials and devices (23 papers), Electromagnetic Compatibility and Noise Suppression (12 papers), Advancements in Semiconductor Devices and Circuit Design (11 papers), Silicon Carbide Semiconductor Technologies (10 papers), 3D IC and TSV technologies (3 papers) and Electronic Packaging and Soldering Technologies (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (377 citations), Hardware and Architecture (11 citations) and Computer Graphics and Computer-Aided Design (1 citation). P. Hopper has collaborated with scholars based in United States, Belgium and Austria. Frequent co-authors include В.А. Ващенко, A. Concannon, Elyse Rosenbaum, S. Thijs, Victor P. Kuznetsov, D. Linten, Mirko Scholz, G. Groeseneken, W.J. Kindt and Mark G. Allen. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Device and Materials Reliability, IEEE Transactions on Electron Devices, IEEE Transactions on Advanced Packaging and VUBIR (Vrije Universiteit Brussel).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.