Bei Yu
- Hardware and Architecture top 0.2%
- VLSI and Analog Circuit Testing 76
-
- Industrial Vision Systems and Defect Detection 45
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- Advancements in Photolithography Techniques 141
- VLSI and FPGA Design Techniques 115
- Integrated Circuits and Semiconductor Failure Analysis 46
- Low-power high-performance VLSI design 41
- 3D IC and TSV technologies 34
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- Advanced Neural Network Applications 27
- Co-authors
- David Z. PanYuzhe MaHaoyu YangEvangeline F. Y. YoungJhih-Rong GaoTinghuan ChenYibo LinXiaoqing Xu
- Cited by
- Hardware and ArchitectureIndustrial and Manufacturing EngineeringElectrical and Electronic Engineering
- Journals
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (83 papers)ACM Transactions on Design Automation of Electronic Systems (23 papers)Journal of Micro/Nanolithography MEMS and MOEMS (8 papers)
- Partner nations
- Hong KongChinaUnited States
In The Last Decade
Bei Yu
350 papers receiving 5.4k citations
Hit Papers
Peers
Comparison fields: 5 of 115
- Hardware and Architecture 1.7k
- Industrial and Manufacturing Engineering 953
- Electrical and Electronic Engineering 3.7k
- Computer Vision and Pattern Recognition 1.0k
- Computer Graphics and Computer-Aided Design 169
Countries citing papers authored by Bei Yu
This map shows the geographic impact of Bei Yu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bei Yu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bei Yu more than expected).
Fields of papers citing papers by Bei Yu
This network shows the impact of papers produced by Bei Yu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bei Yu. The network helps show where Bei Yu may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Bei Yu, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 0 | |
| 2 | 2025 | 0 | |
| 3 | 2025 | 0 | |
| 4 | 2025 | 0 | |
| 5 | 2024 | 0 | |
| 6 | 2024 | 1 | |
| 7 | 2024 | 1 | |
| 8 | 2024 | 0 | |
| 9 | 2024 | 1 | |
| 10 | 2024 | 2 | |
| 11 | 2023 | 2 | |
| 12 | 2023 | 33 | |
| 13 | 2023 | 5 | |
| 14 | 2023 | 7 | |
| 15 | 2022 | 24 | |
| 16 | 2022 | 0 | |
| 17 | 2021 | 36 | |
| 18 | 2021 | 67 | |
| 19 | 2021 | 3 | |
| 20 | 2020 | 8 |
About Bei Yu
Bei Yu is a scholar working on Hardware and Architecture, Industrial and Manufacturing Engineering and Electrical and Electronic Engineering, having authored 394 papers that have together received 5.5k indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (141 papers), VLSI and FPGA Design Techniques (115 papers), VLSI and Analog Circuit Testing (76 papers), Integrated Circuits and Semiconductor Failure Analysis (46 papers), Industrial Vision Systems and Defect Detection (45 papers), Low-power high-performance VLSI design (41 papers), 3D IC and TSV technologies (34 papers) and Advanced Neural Network Applications (27 papers). The work is most often cited by research in Hardware and Architecture (1.7k citations), Industrial and Manufacturing Engineering (953 citations) and Electrical and Electronic Engineering (3.7k citations). Bei Yu has collaborated with scholars based in Hong Kong, China and United States. Frequent co-authors include David Z. Pan, Yuzhe Ma, Haoyu Yang, Evangeline F. Y. Young, Jhih-Rong Gao, Tinghuan Chen, Yibo Lin, Xiaoqing Xu, Qi Sun and Tetsuaki Matsunawa. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ACM Transactions on Design Automation of Electronic Systems, Journal of Micro/Nanolithography MEMS and MOEMS, IEEE Transactions on Pattern Analysis and Machine Intelligence and IEEE Transactions on Neural Networks and Learning Systems.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.