A.P. Dorey
Impact in
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
-
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced MEMS and NEMS Technologies
- Semiconductor materials and devices
- Electrostatic Discharge in Electronics
- Advancements in Semiconductor Devices and Circuit Design
Papers in
-
- Integrated Circuits and Semiconductor Failure Analysis 13
- Advanced MEMS and NEMS Technologies 6
- Semiconductor materials and devices 5
- Electrostatic Discharge in Electronics 4
-
- VLSI and Analog Circuit Testing 11
- Co-authors
- A. Richardson (11 shared papers)J.E. Brignell (1 shared paper)B.K. Jones (1 shared paper)K. Baker (1 shared paper)John H. Moore (1 shared paper)D. A. Bradley (2 shared papers)Ian Grout (1 shared paper)D.A. Bradley (2 shared papers)
- Journals
- Electronics Letters (2 papers)Solid-State Electronics (1 paper)Thin Solid Films (1 paper)Quality and Reliability Engineering International (1 paper)Measurement Science and Technology (1 paper)
- Partner nations
- United KingdomNetherlandsIndia
In The Last Decade
A.P. Dorey
37 papers receiving 271 citations
Peers
Comparison fields: 5 of 53
- Hardware and Architecture 141
- Electrical and Electronic Engineering 248
- Control and Systems Engineering 39
- Atomic and Molecular Physics, and Optics 52
- Bioengineering 9
Countries citing papers authored by A.P. Dorey
This map shows the geographic impact of A.P. Dorey's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A.P. Dorey with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A.P. Dorey more than expected).
Fields of papers citing papers by A.P. Dorey
This network shows the impact of papers produced by A.P. Dorey. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A.P. Dorey. The network helps show where A.P. Dorey may publish in the future.
Co-authors
The 12 scholars most cited alongside A.P. Dorey, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 40 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1969 | 28 | |
| 2 | 1983 | 26 | |
| 3 | 1995 | 22 | |
| 4 | 1969 | 22 | |
| 5 | 1990 | 22 | |
| 6 | 1996 | 17 | |
| 7 | 1993 | 16 | |
| 8 | 2002 | 14 | |
| 9 | 1986 | 13 | |
| 10 | 2000 | 13 | |
| 11 | Aspects of current reference generation and distribution for IDDx pass/fail current threshold determination | 1993 | 11 |
| 12 | Advances in actuators | 1995 | 10 |
| 13 | 1983 | 10 | |
| 14 | 1993 | 9 | |
| 15 | 1992 | 9 | |
| 16 | 2000 | 9 | |
| 17 | 2002 | 6 | |
| 18 | 1994 | 6 | |
| 19 | 1995 | 6 | |
| 20 | 1994 | 5 |
About A.P. Dorey
A.P. Dorey is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Biomedical Engineering, Computer Networks and Communications and Media Technology, having authored 40 papers that have together received 312 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (13 papers), VLSI and Analog Circuit Testing (11 papers), Sensor Technology and Measurement Systems (7 papers), Experimental Learning in Engineering (7 papers), Advanced MEMS and NEMS Technologies (6 papers), Analog and Mixed-Signal Circuit Design (5 papers), Semiconductor materials and devices (5 papers) and Electrostatic Discharge in Electronics (4 papers). The work is most often cited by research in Hardware and Architecture (141 citations), Electrical and Electronic Engineering (248 citations), Control and Systems Engineering (39 citations), Atomic and Molecular Physics, and Optics (52 citations) and Bioengineering (9 citations). A.P. Dorey has collaborated with scholars based in United Kingdom, Netherlands and India. Frequent co-authors include A. Richardson, J.E. Brignell, B.K. Jones, K. Baker, John H. Moore, D. A. Bradley, Ian Grout, D.A. Bradley, Bernard Carré and P.C. Russell. Their work appears in journals such as Electronics Letters, Solid-State Electronics, Thin Solid Films, Quality and Reliability Engineering International and Measurement Science and Technology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.